A current measurement component including a bridging portion bridging a pair of side surface portions, a pair of coaxial components attached to the pair of side surface portions, respectively, each coaxial pair including an inner conductor that extends through a hole formed in a corresponding side surface portion of the pair of side surface portions, a connection portion electrically connecting the inner conductors of the pair of coaxial components, and a tube-like portion enclosing the connection portion with a gap formed between the tube-like portion and an outer peripheral portion of the connection portion. The pair of side surface portions and the bridging portion are electrically conductive and electrically connected, and the tube-like portion includes a base end portion electrically connected to a first side surface portion of the pair of side surface portions and a distal end portion electrically separated from the outer conductor of coaxial component pairs.

The present invention relates to a test socket having a thin structure that can reduce durability degradation of a contact itself, have excellent electrical characteristics in processing high-speed signals, and can extend a service life thereof, and relates to spring contacts suitable thereto. The test socket according to the present invention includes: a plurality of spring contacts (100) each of which includes an upper contact pin (110) and a lower contact pin (120) that are assembled cross each other, and a spring (130) supporting the upper and lower contact pins (110 and 120); a main plate (1110) having a plurality of accommodating holes (1111) in which the respective spring contacts (100) are accommodated, with first openings (1113); and a film plate (1120) provided on a lower portion of the main plate (1110), and having second openings (1121).

An intermediate connecting member according to one aspect of the present disclosure is provided between a first member including multiple first terminals and a second member including multiple second terminals. The intermediate connecting member includes multiple connection parts configured to electrically connect the first terminals to the second terminals, and a retainer holding the multiple connection parts. Each of the multiple connection parts is formed of an elastic member to which an electrically conductive property is given at least on a surface of the elastic member.

A testing device for testing an integrated circuit package is provided, including a printed circuit board, a testing socket, a conductive fastener, a cover, and a conductive element assembly. The printed circuit board includes a first metal layer formed on the bottom surface thereof. The testing socket is disposed above the printed circuit board. The conductive fastener is configured to secure the testing socket to the printed circuit board, wherein the conductive fastener is electrically connected to the first metal layer and the testing socket. The cover is disposed above the testing socket to form a space for accommodating the integrated circuit package between the cover and the testing socket, wherein the cover makes electrical contact with the integrated circuit package. The conductive element assembly is disposed between and electrically connected to the cover and the testing socket.

A socket includes a pin block on which a plurality of contact probes are installed, a pin plate configured to hold the plurality of contact probes together with the pin block, and an engagement portion configured to engage the pin block and the pin plate with each other. The engagement portion is configured to detachably engage the pin block and the pin plate with each other.

This socket comprises: an accommodation part that has a recess portion; an opening/closing part that opens/closes the recess portion; and a rotation support part that supports the opening/closing part to be rotationally movable between an opened state and a closed state. The opening/closing part has: a cover that is supported by the rotation support part; a pressing part that is provided on the first direction side of the first end and presses a electronic component in the recess portion in the closed state; a locking part that is provided on the first direction side of the pressing part and locks the cover to the accommodation part in the closed state; and a pressed part that has a pressed surface and is provided, at a position farther away from the rotation support part than the locking part, to be rotationally movable.

Evaluation board (EVB) assemblies or stacks utilized in tuning electronic modules are disclosed, as are methods for tuning such modules. In embodiments, the module testing assembly includes an EVB and an EVB baseplate. The EVB includes, in turn, an EVB through-port extending from a first EVB side to a second, opposing EVB side; and a module mount region on the first EVB side and extending about a periphery of the EVB through-port. The module mount region is shaped and sized to accommodate installation of a sample electronic module provided in a partially-completed, pre-encapsulated state fabricated in accordance with a separate thermal path electronic module design. A baseplate through-port combines with the EVB through-port to form a tuning access tunnel providing physical access to circuit components of the sample electronic module through the EVB baseplate from the second EVB side when the sample electronic module is installed on the module mount region.

A stand for receiving a portable test and measurement instrument includes a base plate, a first portion extending orthogonally from the generally flat base, the first portion including one or more holes spaced in a pattern through which one or more fasteners may attach the test and measurement instrument to the stand, and a second portion adjacent to and extending at an angle from the first portion, the second portion including one or more holes spaced in a pattern through which one or more fasteners may attach the test and measurement instrument to the stand.

An assembly for interfacing an existing harness connector of an installed wiring harness to a test module. The assembly comprises: a harness-specific connector which is connectable to the existing harness connector, a test box connector module connected to the harness-specific connector, for connecting to a test module, and a unique identifier which is readable on the assembly and which is unique to the test box connector module; wherein the unique identifier is used to identify the test box connector module and to determine a configuration that corresponds to the identifier of the assembly, and to determine the correspondence between contacts of the test module to contacts of the existing harness connector.

An inspection device comprising: a first elastomer defining a hole; and a plunger overlapping with the first elastomer, wherein a conductive film is formed over an inner wall of the hole, and the plunger is electrically connected to the conductive film.