In one embodiment, there is a test switch signal analyzer comprising: an analyzer hub operably couplable to a test switch base that includes a plurality of test switch conductors; at least one signal probe operatively couplable to the analyzer hub and to at least one of the plurality of test switch conductors when the analyzer hub is coupled to the test switch base, each of the at least one signal probes being configured to receive electrical signals from one of the plurality of test switch conductors and to generate one or more probe signals that corresponds to the received electrical signals; a signal processing unit coupled to the analyzer hub and configured to receive the one or more probe signals from the at least one signal probe, the signal processing unit configured to determine a plurality of electrical signal values based on the probe signals received from the at least one signal probe; the signal processing unit, the analyzer hub, and at least a portion of the at least one signal probe being positionable within a test switch cover configured and dimensioned to mate with the test switch base when the at least one signal probe is coupled to the at least one of the plurality of test switch conductors and the test switch cover is secured to the test switch base.

The present disclosure relates to a measuring system including: an automation field device embodied for determining and/or monitoring a process variable of a medium; a connection unit, which includes a connection plug, which is electrically connected with the field device, and a cable, which is connected to the connection plug with a cable connection and which serves for supplying the field device with electrical energy and/or for transmitting information between the field device and a superordinated unit; and a protective cover, which surrounds the connection unit and the field device connected with the connection unit in a protection section, wherein by means of the protective cover the impact resistance of the measuring system in the protection section is increased.

A test and measurement instrument switch matrix including a first cable including a center conductor and a guard connected to a first output of the test and measurement instrument; a second cable including a center conductor and a guard connected to a second output of the test and measurement instrument; a third cable including a center conductor and a guard connected to the device under test; and a fourth cable including a center conductor connected to the device under test and a guard connected to the device under test.

A power monitoring system includes a current transformer and a power meter. The current transformer includes a winding for sensing a measure of current in a conductor that supplies power to a load and a machine-readable apparatus that is secured relative to the current transformer and that encodes calibration information that is specific to the current transformer. The power meter includes a first input for receiving the measure of current and a second input for receiving a measure of voltage. A controller configured to receive the calibration information encoded in the machine-readable apparatus, calibrate the controller with the current transformer based on the calibration information and determine a number of power monitor parameters based at least in part on the calibration information, the measure of current sensed in the conductor by the current transformer and the measure of voltage of the conductor.

A power meter includes a plurality of terminals for receiving a measure of power consumption of each of one or more phases of power that is delivered to a load and a controller that is operatively coupled to the plurality of terminals. The controller is configured to determine a number of power monitor parameters based on the measure of power consumption of each of one or more phases of power that is delivered to the load. The controller is further configured to operate an interactive menu. The power meter includes a user interface that is configured to display the number of power monitor parameters based on the measure of power consumption of each of one or more phases of power that is delivered to the load and to enable a user to navigate the interactive menu using via one or more screens displayed on the user interface.

A device includes a channel, a slit, and a cap. The channel is formed on a surface of the device. The slit separates the channel to a first portion and a second portion. The first portion comprises liquid metal, e.g., gallatin. The second portion comprises gas. The liquid metal moves within the channel between the first and the second portions in response to external stimuli, e.g., pressure. The liquid metal moving within the channel changes electrical characteristics, e.g., capacitive value, inductance value, resistance value, resonance frequency, etc., of the device.

A test switch for use in electrical power distribution networks is provided. The test switch facilitates the connection between the power distribution networks' equipment and test equipment used to effect tests on the power distribution networks' equipment. The test switch has a solidifying base which decouples the fastening of the body of the switch to the base of the test switch from the fastening of the test switch on an external surface/equipment. Various locking mechanisms for preventing use of or tampering with the test switch are also provided.

A load testing device includes a terminal unit, a main relay unit, a resistance unit, and a housing. The main relay unit and the switch group are used to switch a connection state between the first R-phase resistor group and the second R-phase resistor group between series and parallel, switch a connection state between the first S-phase resistor group and the second S-phase resistor group between series and parallel, and switch a connection state between the first T-phase resistor group and the second T-phase resistor group between series and parallel. A first accommodation region to a third accommodation region are located between a fourth accommodation region and a fifth accommodation region. The second accommodation region is located between the first accommodation region and the third accommodation region. The first accommodation region accommodates the first R-phase resistor group and the second R-phase resistor group.

To prevent deterioration of current detection accuracy due to a difference in deterioration between a main MOS and a sense MOS. The load drive device includes a main MOS (101) for supplying a load current to a load, a sense MOS (102) to be used for detection of the load current, and an equalizer circuit (110) and a switch (120) which are provided in parallel between the source terminal of the main MOS and the source terminal of the sense MOS. The drain terminal of the main MOS and the drain terminal of the sense MOS have a common connection, and when a current is detected, the terminal voltage of the main MOS and the terminal voltage of the sense MOS are equalized by the equalizer circuit, and the switch is opened. When a current is not detected, the equalizer circuit is stopped and the switch short-circuits the source terminal of the main MOS and the source terminal of the sense MOS.

In one embodiment, there is a test switch signal analyzer comprising: an analyzer hub operably couplable to a test switch base that includes a plurality of test switch conductors; at least one signal probe operatively couplable to the analyzer hub and to at least one of the plurality of test switch conductors when the analyzer hub is coupled to the test switch base, each of the at least one signal probes being configured to receive electrical signals from one of the plurality of test switch conductors and to generate one or more probe signals that corresponds to the received electrical signals; a signal processing unit coupled to the analyzer hub and configured to receive the one or more probe signals from the at least one signal probe, the signal processing unit configured to determine a plurality of electrical signal values based on the probe signals received from the at least one signal probe; the signal processing unit, the analyzer hub, and at least a portion of the at least one signal probe being positionable within a test switch cover configured and dimensioned to mate with the test switch base when the at least one signal probe is coupled to the at least one of the plurality of test switch conductors and the test switch cover is secured to the test switch base.