G01R1/24

Interconnect system with high current and low leakage capability
11927605 · 2024-03-12 · ·

A test and measurement instrument switch matrix including a first cable including a center conductor and a guard connected to a first output of the test and measurement instrument; a second cable including a center conductor and a guard connected to a second output of the test and measurement instrument; a third cable including a center conductor and a guard connected to the device under test; and a fourth cable including a center conductor connected to the device under test and a guard connected to the device under test.

Interconnect system with high current and low leakage capability
11927605 · 2024-03-12 · ·

A test and measurement instrument switch matrix including a first cable including a center conductor and a guard connected to a first output of the test and measurement instrument; a second cable including a center conductor and a guard connected to a second output of the test and measurement instrument; a third cable including a center conductor and a guard connected to the device under test; and a fourth cable including a center conductor connected to the device under test and a guard connected to the device under test.

DIAMOND SENSOR UNIT

A diamond sensor unit includes: a diamond having a color center with electron spin; an excitation light irradiation part that irradiates the diamond with excitation light; a first patch antenna that receives electromagnetic waves; an electromagnetic wave irradiation part that irradiates the diamond with the electromagnetic waves received by the first patch antenna; a detection part that detects radiated light radiated from the color center of the diamond after the diamond is irradiated with the excitation light and the electromagnetic waves; and an optical waveguide that transmits the excitation light and the radiated light.

DIAMOND SENSOR UNIT

A diamond sensor unit includes: a diamond having a color center with electron spin; an excitation light irradiation part that irradiates the diamond with excitation light; a first patch antenna that receives electromagnetic waves; an electromagnetic wave irradiation part that irradiates the diamond with the electromagnetic waves received by the first patch antenna; a detection part that detects radiated light radiated from the color center of the diamond after the diamond is irradiated with the excitation light and the electromagnetic waves; and an optical waveguide that transmits the excitation light and the radiated light.

Frequency-scalable NLTL-based mm-wave vector signal de-modulator
10469296 · 2019-11-05 · ·

An in-phase (I) and quadrature (Q) demodulator includes an input for receiving a signal, a reference frequency source, and a sampler connected with the input. The sampler includes a sampler strobe connected with the reference frequency source, and a non-linear transmission line (NLTL) connected with the sampler strobe. The NLTL receives a strobe signal generated by the sampler strobe and multiplies a frequency of the strobe signal to generate a sampler signal. When the sampler receives a signal from the input, the sampler is configured to generate and output an intermediate frequency (IF) signal using the sampler signal. A splitter of the demodulator separates the IF signal into an in-phase (I) component and a quadrature (Q) component. Mixers receive the I and Q components and generate I and Q output signals shifted 90 in phase.

DUAL STRIPLINE TEST FIXTURE APPARATUSES AND METHODS

A dual stripline assembly includes a first stripline, a second stripline, and an intermediate member. The first stripline includes a first center conductor, first outer ground plane, and first inner ground plane. The first center conductor is spaced apart from and interposed between the first outer ground plane and the first inner ground plane. The first stripline extends along a length of the assembly. The second stripline includes a second center conductor, second outer ground plane, and second inner ground plane. The second center conductor is spaced apart from and interposed between the second outer ground plane and the second inner ground plane. The second stripline extends along the length of the assembly. The intermediate member extends along the length of the assembly, and includes the first inner ground plane and the second inner ground plane.

DUAL STRIPLINE TEST FIXTURE APPARATUSES AND METHODS

A dual stripline assembly includes a first stripline, a second stripline, and an intermediate member. The first stripline includes a first center conductor, first outer ground plane, and first inner ground plane. The first center conductor is spaced apart from and interposed between the first outer ground plane and the first inner ground plane. The first stripline extends along a length of the assembly. The second stripline includes a second center conductor, second outer ground plane, and second inner ground plane. The second center conductor is spaced apart from and interposed between the second outer ground plane and the second inner ground plane. The second stripline extends along the length of the assembly. The intermediate member extends along the length of the assembly, and includes the first inner ground plane and the second inner ground plane.

APPARATUS AND METHOD FOR GUIDED WAVE COMMUNICATIONS USING AN ABSORBER

Aspects of the subject disclosure may include, a system having an absorber and a coupling device. The absorber includes absorbent material that absorbs radiation. The coupling device is positioned in and surrounded by the absorber. The coupling device facilitates transmitting or receiving of an electromagnetic wave along a transmission medium, where the electromagnetic wave propagates along the transmission medium without requiring an electrical return path. Other embodiments are disclosed.

Re-filters for PIM measurements and a test bench utilizing the same
10403949 · 2019-09-03 · ·

A PIM test bench including a first duplexer, having a first port connected via a first filter to a third port and a second port connected via a second filter to the third port. The first port is fed by signal sources providing RF signals at first and second frequencies. A spectrum analyzer is connected to the second port. A device under test is connected between said third port and a third port of a second duplexer. Each of the first and second ports of the second duplexer is connected to a PIM optimized load and/or a standard load. The second duplexer is preferably identical to the first duplexer. For minimizing self-intermodulation, at least the first duplexer comprises at least one filter component and a metal housing. The housing further includes a monolithic metal body and a metal cover capacitively coupled to the body without any galvanic contact.

Re-filters for PIM measurements and a test bench utilizing the same
10403949 · 2019-09-03 · ·

A PIM test bench including a first duplexer, having a first port connected via a first filter to a third port and a second port connected via a second filter to the third port. The first port is fed by signal sources providing RF signals at first and second frequencies. A spectrum analyzer is connected to the second port. A device under test is connected between said third port and a third port of a second duplexer. Each of the first and second ports of the second duplexer is connected to a PIM optimized load and/or a standard load. The second duplexer is preferably identical to the first duplexer. For minimizing self-intermodulation, at least the first duplexer comprises at least one filter component and a metal housing. The housing further includes a monolithic metal body and a metal cover capacitively coupled to the body without any galvanic contact.