Patent classifications
G01R1/24
Orthogonal field probes
Provided herein are electric and magnetic field probes for measuring and mapping distributions of such fields on, for example, circuits, antennas and materials.
Orthogonal field probes
Provided herein are electric and magnetic field probes for measuring and mapping distributions of such fields on, for example, circuits, antennas and materials.
Wave interface assembly for automatic test equipment for semiconductor testing
Embodiments of the present disclosure utilize customizable waveguide fabrication technologies (e.g., 3D printer technology) and patch antenna arrays to create adaptable wave interfaces that can provide efficient signal routing for an ATE system. In this fashion, embodiments of the present disclosure allow for arbitrary waveguide routing from port to port and create high density port spacing at the PCB level and which specifically eliminates the large flange required of prior art waveguides. Furthermore, embodiments include the ability to integrate different waveguide components, including power splitters, couplers, terminations, etc., into a single structure. Thus, embodiments of the present disclosure can reduce signal path losses and simplify the mechanical construction of ATE systems while eliminating the need for coax cables and minimizing the length of PCB microstrips.
Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing
Embodiments of the present disclosure use customizable waveguides that can be positioned next to each other in a structure that contains one single flange to provide a physical connection for the waveguides. In this fashion, many waveguides can be positioned within a small area to accommodate a tightly packed patch antenna array so that the waveguides can be positioned very close to the socket. As such, embodiments of the present disclosure allow more waveguides to be packed into a small area by providing a single structure that houses many waveguides and share only a single flange connection element that can be sized appropriately.
Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing
Embodiments of the present disclosure use customizable waveguides that can be positioned next to each other in a structure that contains one single flange to provide a physical connection for the waveguides. In this fashion, many waveguides can be positioned within a small area to accommodate a tightly packed patch antenna array so that the waveguides can be positioned very close to the socket. As such, embodiments of the present disclosure allow more waveguides to be packed into a small area by providing a single structure that houses many waveguides and share only a single flange connection element that can be sized appropriately.
Method and apparatus for socket power calibration with flexible printed circuit board
A structure for performing socket power calibration comprises a plurality of socket ports on a load board electrically coupled to a plurality of traces on a first end of a flexible printed circuit board, wherein the plurality of traces are configured to allow traversal of an electrical signal from the plurality of socket ports to a waveguide. The structure further comprises the plurality of traces, wherein the traces are operable to terminate on a second end of the flexible printed circuit board into a plurality of patch antennas, wherein the plurality of patch antennas is adapted to radiate the electrical signal into the waveguide. Finally, the structure also comprises a power sensor electrically coupled to the waveguide, wherein the waveguide is configured to communicate the electrical signal from the waveguide to the power sensor.
Method and apparatus for socket power calibration with flexible printed circuit board
A structure for performing socket power calibration comprises a plurality of socket ports on a load board electrically coupled to a plurality of traces on a first end of a flexible printed circuit board, wherein the plurality of traces are configured to allow traversal of an electrical signal from the plurality of socket ports to a waveguide. The structure further comprises the plurality of traces, wherein the traces are operable to terminate on a second end of the flexible printed circuit board into a plurality of patch antennas, wherein the plurality of patch antennas is adapted to radiate the electrical signal into the waveguide. Finally, the structure also comprises a power sensor electrically coupled to the waveguide, wherein the waveguide is configured to communicate the electrical signal from the waveguide to the power sensor.
Apparatus and method for guided wave communications using an absorber
Aspects of the subject disclosure may include, a system having an absorber and a coupling device. The absorber includes absorbent material that absorbs radiation. The coupling device is positioned in and surrounded by the absorber. The coupling device facilitates transmitting or receiving of an electromagnetic wave along a transmission medium, where the electromagnetic wave propagates along the transmission medium without requiring an electrical return path. Other embodiments are disclosed.
QUANTUM POWER SENSOR
A quantum power sensor comprising a two-level quantum system strongly coupled to a transmission line that supports a propagating wave. A method of measuring power in a transmission line, the method comprising: coupling a two-level quantum system to the transmission line; and determining the coupling and the Rabi frequency of the two-level system.
QUANTUM POWER SENSOR
A quantum power sensor comprising a two-level quantum system strongly coupled to a transmission line that supports a propagating wave. A method of measuring power in a transmission line, the method comprising: coupling a two-level quantum system to the transmission line; and determining the coupling and the Rabi frequency of the two-level system.