A measurement arrangement and method for providing at least one combined measurement dataset, said measurement arrangement comprising at least one measurement device configured to generate measurement data in a measurement session, and a mobile device configured to generate measurement session context data of said measurement session, said measurement device and said mobile device being connected via at least one wireless link for data transfer, wherein the measurement data generated by said measurement device and associated measurement session context data generated by said mobile device are linked to provide a combined measurement dataset.

A composite analog-to-digital converter (ADC) has a low resolution ADC configured to receive and digitize analog data, the low resolution ADC having a low resolution and a high operating speed, one or more high resolution ADCs configured to receive and digitize the analog data, the one or more high resolution ADCs having a resolution higher than the low resolution ADC, and an operating speed lower than the high operating speed of the low resolution ADC, a sample clock generator to provide a sample clock signal to the low resolution ADC and to a clock divider, a mixer to receive the analog data and connected to the one or more high resolution ADCs, a local oscillator connected to the mixer to allow one or more high resolution ADCs to be tuned to sample a portion of a spectrum of the low resolution ADC. A test and measurement instrument contains a composite ADC. A method of operating a composite analog-to-digital converter (ADC), includes receiving an analog signal at a low resolution ADC that operates at a high speed, receiving the analog signal at one or more high resolution ADCs that operate at a resolution higher than the low resolution ADC and at a lower speed than the operating speed of the low resolution ADC, tuning the high resolution ADC to phase align and time align a signal path for the one or more high resolution ADCs to the signal path for the low resolution ADC, producing a spectrum from the low resolution ADC, and producing a portion of the spectrum from the one or more high resolution ADCs.

In a fixing system, a first terminal device transmits information about a trouble in a target device to a server, receives information for restoration of the target device, and operates a measuring instrument for measurement on the target device to measure the state of the target device based on the information for restoration of the target device. The server receives the information about the trouble, and refers to a fixing know-how database to analyze the trouble. The fixing know-how database contains know-how information about fixing of the target device. The server selects information required for fixing from information for restoration specified based on a result of the analysis by a trouble analyzing unit so as to comply with a selection condition set in advance, and transmits the selected information to the first terminal device.

A test and measurement instrument, including a splitter configured to split an input signal into two split input signals and output each split input signal onto a separate path and a combiner configured to receive and combine an output of each path to reconstruct the input signal. Each path includes an amplifier configured to receive the split input signal and to compress the split input signal with a sigmoid function, a digitizer configured to digitize an output of the amplifier; and at least one processor configured to apply an inverse sigmoid function on the output of the digitizer.

A device is disclosed that includes a control circuit and a scope circuit. The control circuit is configured to delay a voltage signal to generate a first control signal. The scope circuit is configured to be operated in one of a first mode and a second mode according to the first control signal. In the first mode, the scope circuit is configured to generate a first current signal indicating amplitudes of the voltage signal, and in the second mode, the scope circuit is configured to stop generating the first current signal.

A Multi-Domain Measurement System has an oscilloscope unit and a power probe unit. The oscilloscope unit comprises an analog input channel for receiving a measured analog signal and a first digital interface for receiving digitized measurement values from said power probe unit. The power probe unit is connected to the first digital interface for providing digitized measurements of a power supply signal. The power probe unit and the analog input channel are assigned to a device under test for simultaneously measuring signals in different domains. The power probe unit has a power probe measurement channel providing a vertical digitizing resolution that is at least two times higher than a vertical digitizing resolution of the analog input channel.

Further, uses of a Multi-Domain Measurement System are provided.

A test and measurement instrument including a signal generator configured to generate a waveform to be sent over a cable to a device under test (DUT) and a real-time waveform monitor (RTWM) circuit. The RTWM is configured to determine a propagation delay of the cable, capture a first waveform, including an incident waveform and a reflection waveform at a first test point between the signal generator and the DUT, capture a second waveform including at least the incident waveform at a second test point between the signal generator and the DUT, determine a reflection waveform and the incident waveform based on the first waveform and the second waveform, and determine a DUT waveform based on the incident waveform, the reflection waveform, and the propagation delay. The DUT waveform represents the waveform generated by the signal generator as received by the DUT.

A test and measurement instrument having a signal generator circuit and a waveform monitor circuit for monitoring a waveform received at a device under test (DUT). The signal generator circuit generates a waveform based on an input from a user, while the waveform monitor circuit sends captured signals to a processor to determine a waveform received at the DUT. The waveform monitor captures a signal at a first test point and a second test point, via a switch, and the processor receives the captured signals and using linear equations determines both an incident waveform and a reflected waveform from the DUT.

A measuring device serves for the measurement and display of at least one measurement signal. It contains a measuring unit for the measurement of the at least one measurement signal and a display unit. In this context, the display unit comprises a processing unit and a touch-sensitive screen. The processing unit is embodied in order to display the at least one measured measurement signal by means of the touch-sensitive screen and to register and process touches on the touch-sensitive screen. The processing unit is further embodied in order, in the case of a touch of the touch-sensitive screen in a first position, to display the displayed at least one measured measurement signal in at least one first region around the first position magnified with a first magnification.

A device is disclosed that includes a control circuit, a scope circuit and a time-to-current converter. The control circuit configured to delay a voltage signal for a delay time to generate a first control signal, and to generate a second control signal according to the first control signal and the voltage signal. The scope circuit configured to generate a first current signal in response to the second control signal and the voltage signal. The time-to-current converter configured to generate a second current signal according to the first control signal and the voltage signal.