An oscilloscope is described that has a compensation signal generator configured to generate a compensation signal, a probe connector configured to be connected to the passive probe and a detection unit configured to detect whether the passive probe is connected to the probe connector or not. Further, a test and measurement system and a method are described.

A system includes a surge protection circuit electrically connected via a signal transmission line between a source and an oscilloscope, and including a diode configured to be reverse biased, responsive to a voltage of the source being less than a threshold, to decouple an impedance of the circuit from the transmission line and forward biased, responsive to the voltage being greater than the threshold, to couple the impedance to absorb excess energy of the voltage.

A test and measurement instrument has a user interface configured to allow a user to provide one or more user inputs, a display to display results to the user, a memory, one or more processors configured to execute code to cause the one or more processors to receive a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recover a clock signal from the waveform array, generate a waveform image for each waveform, render the waveform images into video frames to produce an image array of the video frames, select at least some of the video frames to form a video sequence, and play the video sequence on a display. A method of animating waveform data includes receiving a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recovering a clock signal from the waveforms, generating a waveform image from each of the waveforms, rendering the waveform images into video frames to produce an image array of the video frames, selecting at least some of the video frames to play as a video sequence, and playing the video sequence on a display.

A logic signal analyzer for analyzing logic signals has a positive measurement input providing a positive measurement input voltage value, a negative measurement input providing a negative measurement input voltage value, a third input providing a third input voltage value, and a comparison unit. The comparison unit being configured to provide a first and a second comparison output voltage value each based on one of at least four comparison modes. The first and second comparison output values are based on different comparison modes.

A waveform display device includes: an operation accepting unit for accepting operation by a user; and a display controller for generating waveform display screen including a program pattern waveform for program control and an actual measurement waveform based on measurement data obtained as a result of the program control, the program pattern waveform and the actual measurement waveform being superimposed on each other, and a cursor indicating a section between a past time area showing a program pattern waveform and an actual measurement waveform in the past time and a future time area showing a future program pattern waveform. The operation accepting unit is configured to accept scroll operation for changing a position of the cursor in the waveform display screen. The display controller is configured to change the position of the cursor in the waveform display screen in accordance with the scroll operation.

A test and measurement instrument having an integrated analog front end that includes one or more amplifiers, the one or more amplifiers implemented on a high-speed amplifier integrated circuit die, a controlled-impedance signal path between an input and a reference voltage, the controlled-impedance signal path including one or more signal taps and one or more controlled-impedance attenuator stages, the one or more controlled-impedance attenuator stages implemented on the amplifier integrated circuit die, and a switching network structured to selectively couple a signal tap of the controlled-impedance signal path to a respective amplifier of the one or more amplifiers, the switching network implemented on the amplifier integrated circuit die

A voltage measurement system has a voltage measuring device connected to a device under test by a voltage divider to drop high voltages (e.g., peaking at or above 100 kilovolts) at a measurement point to lower levels for processing by a voltage measurement and wireless printed circuit board. The voltage measuring device communicates raw measurement data wirelessly (e.g., via Bluetooth) to a remote device such as a mobile phone, laptop or portable meter head having a display and processing device programmed to calculate voltage measurements such has absolute average (ABS AVG), AC root mean square (RMS), +/peak voltage, and AC or DC coupling. The remote device can wirelessly communicate with multiple voltage measuring devices to capture raw measurement data therefrom for voltage measurement applications with multiple measurement points (e.g., three-phase measurement, and transformer testing).

A measurement device for measuring the impedance of a device under test is described. Said measurement device comprises at least one signal generator for generating a signal with a certain frequency wherein said signal is used for testing said device under test. Said measurement device further has at least one shunt resistor that is used for determining the electric current of said signal. Said device also comprise at least two voltage channels for measuring the voltage across said device under test. Said measurement device is an oscilloscope having at least four voltage inputs and wherein said measurement device is configured to derive the impedance of said device from said electric current and said voltage. Further, a method for measuring the impedance of a device under test is described.

In a fixing system, a first terminal device transmits information about a trouble in a target device to a server, receives information for restoration of the target device, and operates a measuring instrument for measurement on the target device to measure the state of the target device based on the information for restoration of the target device. The server receives the information about the trouble, and refers to a fixing know-how database to analyze the trouble. The fixing know-how database contains know-how information about fixing of the target device. The server selects information required for fixing from information for restoration specified based on a result of the analysis by a trouble analyzing unit so as to comply with a selection condition set in advance, and transmits the selected information to the first terminal device.

A measuring device for an oscilloscope provides a decimation unit. The decimation unit provides at least one input, which receives a datastream with a plurality of sampled values from at least one data source. The decimation unit also has at least one output, at which a reduced datastream is output. The reduced datastream is formed from a root-mean-squared value of respectively at least two sampled values calculated by the decimation unit.