A test and measurement instrument includes one or more ports to connect to a device under test (DUT), a user interface having one or more controls, a display, a storage, one or more processors to receive test signals from the DUT through the one or more ports as test of the DUT, use the test signals to generate test data, display test data on the display, display a control button on the user interface indicating that an artificial intelligence (AI) assistant is available, receive an input through the control button to start the AI assistant, provide regions on the user interface to allow the user to interact with the AI assistant, and apply a machine learning model represented by the AI assistant to provide the user with additional information related to one or more of the test and the DUT.

A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.

The present disclosure provides a circuitry distortion corrector for correcting distortions of electrical signals. The circuitry distortion corrector comprises a first correction filter that filters the received signals, and a second correction filter that is coupled to the first correction filter and filters the signals that are filtered by the first correction filter. The first correction filter operates based on first filter coefficients that are based on first value tuples, each first value tuple comprising a first frequency and a respective first circuitry characterizing value, and wherein the first frequencies are equally spaced apart, and the second correction filter operates with second filter coefficients that are based on second value tuples, each second value tuple comprising a second frequency and a respective second circuitry characterizing value, wherein the second frequencies are logarithmically spaced apart.

A test and measurement device has a communications port configured to connect the test and measurement device to a network, a memory, and one or more processors configured to execute code to cause the processors to receive an original waveform through the communications port, the original waveform having an identified file type, store the original waveform in the memory, the original waveform having an original file size, compress the original waveform to a compressed waveform having a compressed file size that is smaller than the original file size, notify one or more users that the compressed waveform is available, and upon receiving a request, transmitting the compressed waveform to a user device. A method of providing waveform data across a network includes receiving an original waveform through a communications port, the original waveform having an identified file type, storing the original waveform in a memory, the original waveform having an original file size, compressing the original waveform to a compressed waveform having a compressed file size that is smaller than the original file size, notifying one or more users that the compressed waveform is available, and upon receiving a request, transmit the compressed waveform to a user device.

A self-diagnosing measurement system is described. The measurement system includes a first measurement instrument, a device under test, and a diagnosis module. The first measurement instrument is connected with the device under test in a signal transmitting manner. The first measurement instrument includes a testing module. The testing module is configured to automatically conduct a predefined test routine on the device under test. The diagnosis module is configured to automatically conduct a diagnosis routine on the measurement system in order to detect faults in the measurement system. Further, a self-diagnosis method for detecting faults in a measurement system is described.

The invention relates to a measurement instrument, such as an oscilloscope, comprising a measurement unit adapted to receive an input signal, and a processing unit adapted to classify the input signal, preferably based on signal parameters or characteristics of the input signal. wherein the processing unit is adapted to determine a signal analysis category for the input signal based on said classification of the input signal, and to match the determined signal analysis category to a control configuration, which defines settings and/or configurations of the measurement instrument, based on an adjustment function. The measurement instrument further comprises a user interface configured to display at least one graphical representation, in particular a waveform, of the input signal based on the control configuration, wherein the user interface is adapted to receive a user input to modify the settings and/or configurations of the measurement instrument, and wherein the processing unit is configured to dynamically adapt the adjustment function based on said user input.

A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.

The present disclosure relates to an instrument for analyzing an input signal. The instrument comprises an input for receiving an input signal, a processing circuit or module for analyzing the input signal received, a display, such as a display module, for displaying information concerning the input signal analyzed, and a user input module for receiving instructions from a user. The instrument provides several functionalities, the several functionalities each being associated with at least one respective complexity. The instrument is set by the instructions of the user via the user input to analyze the input signal. The processing module evaluates a complexity of the instructions of the user.

A test and measurement instrument, such as an oscilloscope, having a Nyquist frequency lower than an analog bandwidth, the test and measurement instrument having an input configured to receive a signal under test having a repeating pattern, a single analog-to-digital converter configured to receive the signal under test and sample the signal under test over a plurality of repeating patterns at a sample rate, and one or more processors configured to determine a frequency of the signal under test and reconstruct the signal under test based on the determined frequency of the signal, the pattern length of the signal under test, and/or the sample rate without a trigger.

A signal processing method for selectively removing noise from a digital input signal is provided. The method includes the steps of, for example, receiving, by a signal input, a digital input signal of a device under test, determining, by an analysis circuit, a DUT noise contribution to noise of the digital input signal, wherein the DUT noise contribution is associated with noise originating from the device under test, reducing, by the analysis circuit, a noise level of the digital input signal to a noise level of the DUT noise contribution determined, thereby obtaining a noise-reduced output signal, and providing the noise-reduced output signal to a measurement application for further processing. A signal processing system for carrying out the method or others is also provided.