A signal analysis method is described. The signal analysis method comprises the following steps. An output signal is received from a device under test. A sampling point density is received and/or the sampling point density is determined based on the output signal. A response function of the device under test is determined based on the output signal and based on the sampling point density. The sampling point density represents a number of sampling points per frequency interval for determining the response function. The response function characterizes at least one property of the device under test as a function of frequency. Moreover a measurement system for determining a response function of a device under test is described.

A device includes a control circuit, a scope circuit, and a time-to-current converter. The control circuit is configured to receive a voltage signal from a voltage-controlled oscillator, delay the voltage signal for a delay time to generate a first control signal, and to generate a second control signal according to the first control signal and the voltage signal. The scope circuit is configured to generate a first current signal in response to the second control signal and the voltage signal. The time-to-current converter is configured generate a second current signal according to the first control signal, the voltage signal, a first switch signal, and a test control signal.

A device is disclosed that includes a control circuit and a scope circuit. The control circuit is configured to delay a voltage signal to generate a first control signal. The scope circuit is configured to be operated in one of a first mode and a second mode according to the first control signal. In the first mode, the scope circuit is configured to generate a first current signal indicating amplitudes of the voltage signal, and in the second mode, the scope circuit is configured to stop generating the first current signal.

A test and measurement instrument, such as an oscilloscope, having a Nyquist frequency lower than an analog bandwidth, the test and measurement instrument having an input configured to receive a signal under test having a repeating pattern, a single analog-to-digital converter configured to receive the signal under test and sample the signal under test over a plurality of repeating patterns at a sample rate, and one or more processors configured to determine a frequency of the signal under test and reconstruct the signal under test based on the determined frequency of the signal, the pattern length of the signal under test, and/or the sample rate without a trigger.

A direct current (DC) power rail probe includes a single-ended probe tip, and a two-path circuit having an input coupled to the single-ended probe tip and an output configured for connection to measurement equipment such as an oscilloscope. The two-path circuit includes an alternating current (AC) path in parallel with a feed-forward (FF) path, the AC path including a capacitive element, and the FF path including a series connection of at least one resistive element and an amplifier. The probe tip and two-path circuit are selectively operable in a non-attenuating mode and an attenuating mode.

A digital sampling oscilloscope (DSO) includes a housing, an analog measurement input interface arranged in a housing wall of the housing and a measurement acquisition system having a digitizer and an acquisition memory coupled to the digitizer. The measurement acquisition system is integrated into the housing and coupled to the analog measurement input interface. The DSO further includes a signal generator integrated into the housing. An operation mode control signal output interface is arranged in a housing wall of the housing. The signal generator is coupled to the operation mode control signal output interface and is configured to output an operation mode control signal to a device under test (DUT) connected to both the operation mode control signal output interface and the analog measurement input interface for controlling a test operation mode of the DUT.

A Multi-Domain Measurement System has an oscilloscope unit and a power probe unit. The oscilloscope unit comprises an analog input channel for receiving a measured analog signal and a first digital interface for receiving digitized measurement values from said power probe unit. The power probe unit is connected to the first digital interface for providing digitized measurements of a power supply signal. The power probe unit and the analog input channel are assigned to a device under test for simultaneously measuring signals in different domains. The power probe unit has a power probe measurement channel providing a vertical digitizing resolution that is at least two times higher than a vertical digitizing resolution of the analog input channel. Further, uses of a Multi-Domain Measurement System are provided.

The present invention relates to a test system for testing a device under test, comprising a signal generating unit being connectable to an input node of the device under test and being adapted to generate a test signal to be applied to the input node of the device under test, wherein the test signal comprises a plurality of frequency peaks at different frequencies. A receiving unit is connectable to an output node of the device under test and is adapted to receive a response signal from the device under test in response to the test signal. An analyzing unit for analyzing the device under test is adapted to determine at least one of a gain value and a phase value based on the test signal generated by the signal generating unit and the response signal received by the receiving unit.

A system maps and stores data in digital three-dimensional oscilloscope, wherein an ADC module has four ADC submodules. Four acquired waveform data are sent to an extraction module, and buffered in a FIFO module. When a trigger signal arrives, FIFO module outputs four extracted waveform data to a mapping address calculation module for calculating a mapping address and a RAM serial number for each point data, and the waveform data comparison and control module performs the reading and writing control of the 4N dual port RAMs. When mapping number reaches a frame number, the RAM array module outputs its waveform probability values to the upper computer module to convert each value into RBG values, and the display module displays the waveforms of input signals of four channels on a screen according the RBG values.

A test and measurement instrument having a signal generator circuit and a waveform monitor circuit for monitoring a waveform received at a device under test (DUT). The signal generator circuit generates a waveform based on an input from a user, while the waveform monitor circuit sends captured signals to a processor to determine a waveform received at the DUT. The waveform monitor captures a signal at a first test point and a second test point, via a switch, and the processor receives the captured signals and using linear equations determines both an incident waveform and a reflected waveform from the DUT.