A signal post-processing method is described, wherein a time-and-value-discrete signal is read from a memory by a signal post-processing circuit wherein a resolution bandwidth and a frequency range of the time-and-value-discrete signal are predetermined. A window filter is applied to the time-and-value-discrete signal. The window filtered time-and-value-discrete signal is transformed to a full-bandwidth frequency-domain signal. A sub-band is selected from the full-bandwidth frequency-domain signal by a selection unit wherein the rest is discarded by the selection unit. Further, a signal post-processing circuit as well as an oscilloscope are described.

A calibrator having an enhanced user interface (UI) is provided. The calibrator outputs, over an output terminal of the calibrator, an electrical signal. The calibrator presents, on a display of the calibrator, a graphical indication associated with an electrical quantity of the electrical signal. The calibrator or a controller thereof synchronizes a color of the graphical indication with a color emitted by a light indicator associated with the output terminal. The calibrator presents, together with the graphical indication, a signal property GUI element that is selectable and representative of a signal property associated with the electrical signal. In response to user selection of the signal property GUI element, the calibrator displays an editable GUI element permitting user modification of the signal property and the calibrator modifies the electrical signal according to user input.

A method of classifying waveform data includes receiving input waveform data at a test and measurement system, accessing a repository of reference waveform data and corresponding classes, analyzing the input waveform data and the reference waveform data to designate a class of the input waveform data, and using the class designation to provide information to a user. A test and measurement system has a user interface, at least one input port, a communications port, a processor, the processor configured to execute instructions causing the processor to: receive input waveform data through at least one of the input port or the user interface; access a repository of reference waveform data; analyze the input waveform data using the reference waveform data; designate a class of the input waveform data; and use the class to provide information to the user about the input waveform.

The present disclosure relates to an instrument for analyzing an input signal. The instrument comprises an input for receiving an input signal, a processing circuit or module for analyzing the input signal received, a display, such as a display module, for displaying information concerning the input signal analyzed, and a user input module for receiving instructions from a user. The instrument provides several functionalities, the several functionalities each being associated with at least one respective complexity. The instrument is set by the instructions of the user via the user input to analyze the input signal. The processing module evaluates a complexity of the instructions of the user.

A method of dynamically determining an oscilloscope noise characteristic includes retrieving a power spectral density (PSD) model of noise from a storage based upon a current configuration of the oscilloscope, generating a representation of any filtering being applied to a waveform generated by a device under test, using the PSD and the representation to produce a modified power spectral density, and using the modified power spectral density to determine a dynamic oscilloscope noise characteristic. A test and measurement instrument has one or more inputs to acquire waveforms from a device under test (DUT), one or more processors to retrieve a power spectral density (PSD) model of noise from a database, generate a representation of any filtering being applied to a waveform generated by the DUT, use the PSD and the representation to produce a modified PSD, and use the modified PSD to determine a dynamic instrument noise characteristic.

The present invention provides a measuring device (1, 11) for measuring signals (2, 12), the measuring device (1, 11) comprising a data memory (4, 14) configured to store device data (5, 15) for the measuring device (1, 11), and a data interface (6, 16) connected to the data memory (4, 14) and configured to read the device data (5, 15) from the data memory (4, 14) and output at least a part of the read device data (5, 15) to an external memory device (7, 17) in a storage mode and to read device data (5, 15) from the external memory device (7, 17) and store the read device data (5, 15) in the data memory (4, 14) in a recovery mode. The present invention further provides a corresponding method for such a measuring device (1, 11).

A configuration device in a test and measurement system including an event generator and a Device Under Test (DUT) to receive one or more events generated by the event generator includes an output display structured to graphically illustrate a first event timeline that includes source event markers for a first test channel for a second test channel, in which the first event timeline and the second event timeline appear on the output display as separate timelines vertically separated from one another. The position of the event delay indicator or a position of the event width indicator may be movable by a user, and moving the position of the event delay indicator or moving the position of the event width indicator causes the event generator to change one or more event generation parameters of the first event based on such movement. Methods are also disclosed.

An automated test equipment comprises a main test flow control configured to operate a test flow in multiple device communication units and/or to provide the trigger configuration information to a local compute unit. The automated test equipment further comprises a device communication unit comprising a trigger generation unit configured to generate a trigger signal. The trigger generation unit further configured to extract payload data from a protocol-based data stream received from the device under test, and to generate the trigger signal in response to the extracted payload data or in response to one or more protocol events. A method and a computer program for testing one or more devices under test in an automated test equipment are also disclosed.

An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.

The present disclosure provides an oscilloscope post processing system for an oscilloscope, the oscilloscope post processing system comprising an acquisition memory that stores samples that represent at least one signal acquired by the oscilloscope, and an interval selector that is coupled to the acquisition memory and reads at least some of the stored samples from the memory and outputs at least one first set of the stored samples and at least one second set of the stored samples. Further, the present disclosure provides a respective method, and a respective measurement device.