A method for determining a physical property related to a charge of a constituent of a sample, from field flow fractionation measurements with an additional electrical field, comprising the steps of obtaining a first fractogram of a first sample and a second fractogram of a second sample, wherein the first sample and the second sample are samples of a same substance, the first fractogram has been generated using a first electrical field, the second fractogram has been generated using a second electrical field, and a strength of the first electrical field and a strength of the second electrical field are different from each other; determining, by using a first mapping, from a first intensity value of the first fractogram, a first value and determining, by using a second mapping, from a second intensity value of the second fractogram, a second value; and determining, based on the first value and the second value, a physical property related to a charge of a constituent of at least one of the first sample and the second sample; wherein the first mapping maps the first intensity value to the first value of a first bijective function over time and the second mapping maps the second intensity value to the second value of a second bijective function over time.

A ground conductor monitoring device, having: at least one ground conductor connection which is designed to connect a ground conductor potential, at least one first potential connection which is designed to connect a first electrical potential which differs from the ground conductor potential, at least one second potential connection which is designed to connect a second electrical potential which differs from the first potential and the ground conductor potential, at least one electrical switching device which is designed to establish an electrical connection, optionally in accordance with an electrical control signal, between the first potential connection and the ground conductor connection (connection state) or to interrupt same (interruption state), at least one control unit which is designed to automatically output control signals to the electrical switching device.

A ground conductor monitoring device, having: at least one ground conductor connection which is designed to connect a ground conductor potential, at least one first potential connection which is designed to connect a first electrical potential which differs from the ground conductor potential, at least one second potential connection which is designed to connect a second electrical potential which differs from the first potential and the ground conductor potential, at least one electrical switching device which is designed to establish an electrical connection, optionally in accordance with an electrical control signal, between the first potential connection and the ground conductor connection (connection state) or to interrupt same (interruption state), at least one control unit which is designed to automatically output control signals to the electrical switching device.

A system may include two input terminals, e.g., HI and LO, and a floating circuit that is physically separate from the input terminals and includes a gain amplifier. The floating circuit can be surrounded by a conductive enclosure that is electrically connected to the second input terminal. The floating circuit can further switch between input signals received from the first and second input terminals to the gain amplifier and the floating circuit ground.

A system and method for compensating for thermal drift of a probe device includes monitoring a first temperature of a laser source in a sensor head that receives output electrical signals from a DUT and outputs corresponding optical signals; monitoring a second temperature of a photoreceiver in a probe interface that converts the optical signals to electrical test signals to input to the test instrument; calculating a first value of a first bias voltage; applying the first value of the first bias voltage to the laser source to compensate for thermal drift when the first temperature is within a first predefined temperature range; calculating a second value of a second bias voltage for the photoreceiver; and applying the second value of the second bias voltage to the photoreceiver to compensate for thermal drift when the second temperature is within a second predefined temperature range.

A system and method for compensating for thermal drift of a probe device includes monitoring a first temperature of a laser source in a sensor head that receives output electrical signals from a DUT and outputs corresponding optical signals; monitoring a second temperature of a photoreceiver in a probe interface that converts the optical signals to electrical test signals to input to the test instrument; calculating a first value of a first bias voltage; applying the first value of the first bias voltage to the laser source to compensate for thermal drift when the first temperature is within a first predefined temperature range; calculating a second value of a second bias voltage for the photoreceiver; and applying the second value of the second bias voltage to the photoreceiver to compensate for thermal drift when the second temperature is within a second predefined temperature range.

An optical voltage sensor system for measuring a high-voltage (HV) signal includes a voltage divider configured to generate a low-voltage (LV) signal representative of the HV signal, an electro-optic crystal, and electrodes arranged on the electro-optic crystal and connected to receive the LV signal from the voltage divider. The electrodes are configured, upon an unpolarized light beam being launched through the electro-optic crystal, to apply a voltage of the LV signal to the electro-optic crystal to alter a spatial distribution of a portion of the light beam exiting the electro-optic crystal in response to the LV signal. The optical voltage sensor system further includes a light collector configured to collect light having an intensity which varies based on the applied voltage, and a light converter configured to convert the collected light into an electronic signal representative of the HV signal.

An optical voltage sensor system for measuring a high-voltage (HV) signal includes a voltage divider configured to generate a low-voltage (LV) signal representative of the HV signal, an electro-optic crystal, and electrodes arranged on the electro-optic crystal and connected to receive the LV signal from the voltage divider. The electrodes are configured, upon an unpolarized light beam being launched through the electro-optic crystal, to apply a voltage of the LV signal to the electro-optic crystal to alter a spatial distribution of a portion of the light beam exiting the electro-optic crystal in response to the LV signal. The optical voltage sensor system further includes a light collector configured to collect light having an intensity which varies based on the applied voltage, and a light converter configured to convert the collected light into an electronic signal representative of the HV signal.

The invention relates to a micro-optics module (1) for evaluating optical current sensors and its manufacture as well as a method for populating printed circuit boards, wherein the micro-optics module (1) has at least one housing (2), which comprises at least one predefined holder (3) for at least one optical and/or electro-optical component (4). The at least one housing (2) with the at least one predefined holder (3) is produced by means of 3D printing.

The invention relates to a micro-optics module (1) for evaluating optical current sensors and its manufacture as well as a method for populating printed circuit boards, wherein the micro-optics module (1) has at least one housing (2), which comprises at least one predefined holder (3) for at least one optical and/or electro-optical component (4). The at least one housing (2) with the at least one predefined holder (3) is produced by means of 3D printing.