G01R17/16

Current shunt monitor
10601259 · 2020-03-24 · ·

A current shunt monitor (CSM) circuit for monitoring the current through a sense resistor. An analog circuit provides an analog output signal proportional to the voltage across the sense resistor. A power supply includes a fixed voltage power supply at a first voltage supply level and a floating power supply. The floating power supply operates at a second voltage supply level referenced from the voltage level on a voltage input and a floating ground. The voltage input varies from a voltage level above the first voltage supply level to a voltage level below the first voltage supply level, and the floating power supply provides power to the analog circuit at least when the voltage level of the voltage input is above the first voltage supply level. A crossover circuit switches power from the floating power to the fixed voltage power supply at the first voltage supply level upon detecting the voltage level on the voltage input proximate in value to the first voltage supply level.

CAPACITIVE SENSOR ARRAY FOR STRUCTURE DAMAGE DETECTION OR HEALTH ASSESSMENT
20200025705 · 2020-01-23 ·

An example system includes an array of capacitive elements, a measurement lead, and a ground plane lead. One or more respective capacitive elements of the array of capacitive elements include a dielectric substrate and a corresponding top conductive layer, with each dielectric substrate configured to be positioned between the top conductive layer and a common ground plane. The measurement lead is coupled to the top conductive layer of each of the one or more respective capacitive elements. The ground plane lead is configured to be coupled to the common ground plane. The capacitive elements are structured such that the capacitive elements have varying respective capacitances, and the capacitive elements are arranged positionally within the array of capacitive elements such that a change in total capacitance is indicative of damage to a particular capacitive element at a particular position within the array of capacitive elements.

Sensor for vehicle, sensing method thereof and vehicle system
10507800 · 2019-12-17 · ·

According to one embodiment, there is provided a sensor for a vehicle, which includes: a vehicle glass; a substrate disposed on the vehicle glass; a transparent sensing electrode disposed on the substrate; and a wire electrode connected to the sensing electrode, wherein the sensing electrode comprises a first sensing electrode and a second sensing electrode spaced apart from the first sensing electrode.

Sensor for vehicle, sensing method thereof and vehicle system
10507800 · 2019-12-17 · ·

According to one embodiment, there is provided a sensor for a vehicle, which includes: a vehicle glass; a substrate disposed on the vehicle glass; a transparent sensing electrode disposed on the substrate; and a wire electrode connected to the sensing electrode, wherein the sensing electrode comprises a first sensing electrode and a second sensing electrode spaced apart from the first sensing electrode.

METHOD FOR SENSING A CURRENT FLOWING IN A TRANSISTOR DRIVING A LOAD, AND CORRESPONDING CIRCUIT ARRANGEMENT FOR SENSING

A pre-driving stage drives one or more Field Effect Transistors in a power stage driving a load. A method for measuring current flowing in the Field Effect Transistors includes: measuring drain to source voltages of the one or more Field Effect Transistor; and measuring an operating temperature of the one or more Field Effect Transistor. The current flowing in the Field Effect Transistors is measured by: calculating the respective on drain to source resistance at the operating temperature as a function of the measured operating temperature and obtaining the current value as a ratio of the respective measured drain to source voltage over the calculated drain to source resistance at the operating temperature.

METHOD FOR SENSING A CURRENT FLOWING IN A TRANSISTOR DRIVING A LOAD, AND CORRESPONDING CIRCUIT ARRANGEMENT FOR SENSING

A pre-driving stage drives one or more Field Effect Transistors in a power stage driving a load. A method for measuring current flowing in the Field Effect Transistors includes: measuring drain to source voltages of the one or more Field Effect Transistor; and measuring an operating temperature of the one or more Field Effect Transistor. The current flowing in the Field Effect Transistors is measured by: calculating the respective on drain to source resistance at the operating temperature as a function of the measured operating temperature and obtaining the current value as a ratio of the respective measured drain to source voltage over the calculated drain to source resistance at the operating temperature.

Test device for localizing a partial discharge in or at an electrical component as well as method for localizing the partial discharge

A test device to localize a partial discharge in or at an electrical component may include at least one antenna to capture an electromagnetic wave caused by a partial discharge in the electrical component. The test device includes multiple microphones arranged in an environment around the electrical component. The microphones capture sound waves caused by the partial discharge. It is examined if an intensity of the electromagnetic wave exceeds a first limit value and/or the intensity of the sound wave captured by one of the multiple microphones exceeds a second limit value. Depending on the captured sound wave and/or the electromagnetic wave and on the examination relating to the first and/or second limit value, a location of the partial discharge can be determined.

Capacitive sensor array for structure damage detection or health assessment
10436734 · 2019-10-08 · ·

An example system includes an array of capacitive elements, a measurement lead, and a ground plane lead. One or more respective capacitive elements of the array of capacitive elements include a dielectric substrate and a corresponding top conductive layer, with each dielectric substrate configured to be positioned between the top conductive layer and a common ground plane. The measurement lead is coupled to the top conductive layer of each of the one or more respective capacitive elements. The ground plane lead is configured to be coupled to the common ground plane. The capacitive elements are structured such that the capacitive elements have varying respective capacitances, and the capacitive elements are arranged positionally within the array of capacitive elements such that a change in total capacitance is indicative of damage to a particular capacitive element at a particular position within the array of capacitive elements.

RESONANT PHASE SENSING OF RESISTIVE-INDUCTIVE-CAPACITIVE SENSORS

A system may include a resistive-inductive-capacitive sensor, a driver configured to drive the resistive-inductive-capacitive sensor at a driving frequency, and a measurement circuit communicatively coupled to the resistive-inductive-capacitive sensor and configured to measure phase information associated with the resistive-inductive-capacitive sensor and based on the phase information, determine a displacement of a mechanical member relative to the resistive-inductive-capacitive sensor, wherein the displacement of the mechanical member causes a change in an impedance of the resistive-inductive-capacitive sensor.

Fast settling peak detector
10425071 · 2019-09-24 · ·

The present disclosure describes aspects of a fast settling peak detector. In some aspects, a peak detector circuit includes a first transistor having a gate coupled to an input of the circuit at which a signal is received and a drain coupled to a source of a second transistor. Current may flow in the first and second transistors responsive to the signal. The circuit also includes a third transistor having a gate coupled, via a signal-inverting component, to the input of the circuit and a drain coupled to a source of a fourth transistor. Through an inversion of the signal, other current flowing in the third and fourth transistor can reduce or cancel a frequency component of the current in the first and second transistors. In some cases, this precludes a need to filter the frequency component from an output of the circuit.