A voltage detector detects a voltage of a positive electrode of a battery, and outputs a detection value indicating a detected voltage value. A target voltage to be detected is applied to one end of a resistor, via a first switch. A current is input to an output circuit from the other end of the resistor. The output circuit outputs a current whose current value substantively coincides with the current value of the current input from the resistor to one end of a resistor, while maintaining a voltage value of the other end of the resistor substantively at a predetermined voltage value. A voltage value of the one end of the resistor is output to a microcomputer as the detection value.

A load detection circuit includes a variable current source circuit having a first input connected to a power supply, a second input, and a first output connected to an output load; a switched capacitor circuit having a third input connected to an external voltage reference signal, a fourth input connected to the first output of the variable current source, a fifth input connected to ground, a sixth input, and a second output; a comparator having a seventh input connected to the second output of the switched capacitor circuit, an eighth input connected to the first output of the variable current source, and a third output; an edge detector having a ninth input connected to the third output of the comparator, and a fourth output; and a digital controller having a fifth output connected to the variable current source and a sixth output connected to the switched capacitor circuit.

In a meter for performing a measurement of an electrical parameter, an output from a sensor is sampled to produce at least one sample, and an iterative method is performed comprising: producing further samples; holding in memory a stored array of samples comprising the at least one sample and each of the further samples from each iteration; determining a measure of statistical variability of a mean for the respective iteration from a measure of statistical variability and from the number of samples used to generate the measure of statistical variability; comparing the measure of statistical variability of the mean with a pre-determined threshold; and generating an electrical signal indicating a state of the measurement if the measure of statistical variability of the mean of the samples taken during the measurement is less than or equal to the pre-determined threshold.

A system for controlling the impact of process and temperature in passive signal detector includes a voltage level detector, a first transistor with a drain electrically connected to a first input of the voltage level detector, and a second transistor with a drain electrically connected to a second input of the voltage level detector. The first transistor has a threshold voltage of a first voltage value. The threshold voltage corresponds to a minimum gate-to-source voltage to create a conducting path between source and drain terminals of a transistor. The second transistor has a threshold voltage of the first voltage value. An offset voltage is applied across a gate of the first transistor and a source of the second transistor, and applied across a gate of the second transistor and a source of the first transistor. A difference between a threshold voltage and the offset voltage is constant.

A system and method for monitoring outlier behavior in an array of n electrodes includes an electrical line, a switching circuit via which the electrodes are individually coupleable to the electrical line, a sensor; and processing circuitry, where, in each of m iterations: (i) a respective subset of electrodes is coupled by the switching circuit to the electrical line, (ii) the sensor senses an electrical parameter produced over the electrical line by the coupled subset of electrodes, and (iii) the processing circuitry obtains from the sensor a respective value of the electrical parameter, m being less than n, and the processing circuitry identifying those of the electrodes that exhibit outlier electrical behavior by finding electrical values to individually ascribe to individual ones of the electrodes of the array, which ascribed values can result in all of the respective values of all of the m iterations.

An operational amplifier-based hysteresis comparator and a chip are provided. The hysteresis comparator includes: an input stage and an amplification stage. The input stage includes: a first input branch and a second input branch, where the first input branch generates a first current based on the first voltage, and the second input branch generates a second current based on the second voltage. The first current is connected with a first input terminal of the amplification stage, and the second current is connected with a second input terminal of the amplification stage. An output terminal of the amplification stage outputs a first level when the first current is greater than the second current, and outputs a second level when the first current is less than the second current. The present disclosure changes the hysteresis voltage generation mode, thereby reducing the instability caused by positive feedback.

In a meter for performing a measurement of an electrical parameter, an output from a sensor is sampled to produce at least one sample, and an iterative method is performed comprising: producing further samples; holding in memory a stored array of samples comprising the at least one sample and each of the further samples from each iteration; determining a measure of statistical variability of a mean for the respective iteration from a measure of statistical variability and from the number of samples used to generate the measure of statistical variability; comparing the measure of statistical variability of the mean with a pre-determined threshold; and generating an electrical signal indicating a state of the measurement if the measure of statistical variability of the mean of the samples taken during the measurement is less than or equal to the pre-determined threshold.

A pair of clamping parts clamp a conductor to be measured and biased in closing directions. A pair of gripping parts are provided to be able to change a distance between the respective clamping parts according to a distance therebetween. Magnetoelectric conversion element(s) for current measurement is/are provided on either one or both of the respective clamping parts. A distance measurement unit is provided to be able to measure a physical quantity corresponding to the distance between the respective gripping parts as a physical quantity corresponding to the distance between the respective clamping parts. A current calculation device is provided to obtain a current flowing in the conductor to be measured on the basis of a magnetic field detected by the magnetoelectric conversion element(s) for current measurement and the physical quantity measured by the distance measurement unit when the conductor to be measured is clamped by the respective clamping parts.

Various embodiments provide a magnetic sensing scheme for a voltage regulator circuit. The voltage regulator circuit may include a first inductor (also referred to as an output inductor) coupled between a drive circuit and an output node. The voltage regulator circuit may further include a second inductor (also referred to as a sense inductor) having a first terminal coupled to the first inductor at a tap point between terminals of the first inductor. The second inductor may provide a sense voltage at a second terminal of the second inductor. A control circuit may control a state of the voltage regulator circuit based on the sense voltage to provide a regulated output voltage at the output node. Other embodiments may be described and claimed.

The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes;