Embodiments disclosed herein include a sensor. In an embodiment, the sensor comprises a board, wherein an aperture is formed through the board, a current loop winding through the board around the aperture, and a voltage ring around the aperture and within an inner perimeter of the current loop, wherein the voltage ring comprises an interior ring, an insulator ring around the interior ring, and an exterior ring around the insulator ring.

A method and apparatus for performing current control for an integrated circuit are described. In one embodiment the apparatus comprises core logic coupled to receive a first current; a clock generator to generate a first clock signal; and a closed loop current controller coupled to the clock generator and coupled to provide a second clock signal to the core logic based on the first clock signal, the current controller to control an amount of the first current received by the core logic by changing the first clock signal to generate the second clock signal.

The present disclosure provides a magnetic field sensor system, comprising an AMR magnetic field sensor and an overcurrent detection sensor. The overcurrent detection sensor comprises an AMR sensing element connected in a half bride arrangement with a field insensitive component. The output of the overcurrent detection sensor is able to monitor the strength of the magnetic field experiences by the sensor system, and detect if the magnet field goes beyond a sensing threshold of the AMR magnetic field sensor. Outside of this threshold, the AMR magnet field sensor is unable to provide a measurement of the magnetic field strength. The overcurrent detection sensor can therefore detect that the system is operating in very high magnetic fields, which in turn can indicate that there is overcurrent in the system.

A test system includes a plurality of test units, each of which is configured to perform an electrical test of an object to be tested. In the test method, at least one of the following determination processes (a) to (c) is performed based on a detected total current. (a) compare the total current with a start current threshold value at a timing when an unoperated unit starts testing, and wait for a start of the testing of the unoperated unit when the total current is greater than or equal to the start current threshold value, (b) compare the total current with an in-operation current threshold value during testing of an operating unit, cause the operating unit to wait when the total current is greater than or equal to the in-operation current threshold value, and (c) compare the total current with a processing speed current threshold value at a timing when the unoperated unit starts testing, set a low-power and low-speed processing content to start the testing of the unoperated unit when the total current is greater than or equal to the processing speed current threshold value.

Methods and devices for detecting USB devices attached to a USB charging port including a USB port having a first data line D+, a second data line D, and a power line are disclosed. A USB device is attached to the USB port; applying power to the USB device by the power line; applying a first voltage to the line D+ at the USB port by a first impedance; applying a second voltage to the line D at the USB port by a second impedance. The voltages on the line D+ and the line D are then monitored at the USB port. If the voltage on the line D+ is approximately equal to a first predetermined value for a predetermined period and the voltage on the line D is below a second predetermined value, then the USB device is determined to be of an alpha type device.

Embodiments relate to a grid short clearing system is provided for gridded ion beam sources used in industrial applications for materials processing systems that reduces grid damage during operation. In various embodiments, the ion source is coupled to a process chamber and a grid short clearing system includes methods for supplying a gas to the process chamber and setting the gas pressure to a predetermined gas pressure in the range between 50 to 750 Torr, applying an electrical potential difference between each adjacent pair of grids using a current-limited power supply, and detecting whether or not the grid shorts are cleared. The electrical potential difference between the grids is at least 10% lower than the DC electrical breakdown voltage between the grids with no contaminants.

A circuit including over-current protection includes a voltage input, first and second switching transistors that are complementarily switched and that receive current from the voltage input, a first resistor, a first diode including a first anode and a first cathode, and a second diode including a second anode and a second cathode. The first anode and the second anode are connected to each other and are connected to the voltage input via the first resistor. The first cathode is connected to the first switching transistor and the second cathode is connected to the second switching transistor such that the connection of the first and second anodes provides an over-current signal that is related to the current in the first and second switching transistors.

An electric fence monitoring unit and an integrated energizer/monitoring unit with remote control and communication capability using GSM based cellular technology, and a method for the use thereof, is provided. A simple set of commands can be used and sent, such as through text messaging (SMS) or a smartphone application, to control and/or receive information from the monitoring unit including alerts sent to the user in the case of faults or changes in fence loading. The monitoring unit includes a safety mode that uses time dependent voltage detection to detect when a sudden and significant drop in fence voltage has occurred, as may result when an animal becomes trapped or entangled in the fence. When such a large and rapid voltage drop is detected and the safety mode is enabled, the unit automatically de-energizes the electric fence and an alert is sent to the user advising that the fence should be looked at without delay.

Embodiments disclosed herein include a sensor. In an embodiment, the sensor comprises a board, wherein an aperture is formed through the board, a current loop winding through the board around the aperture, and a voltage ring around the aperture and within an inner perimeter of the current loop, wherein the voltage ring comprises an interior ring, an insulator ring around the interior ring, and an exterior ring around the insulator ring.

A detection circuit, provided in a gamma buffer circuit that includes at least one transistor that receives the application of a first voltage and generates gradation voltages on the basis of a plurality of gamma voltages, includes: a first comparison circuit that compares the largest gamma voltage with a substrate potential of the transistor and outputs a first comparison result signal, a second comparison circuit that includes an inverter which is operable under a second voltage as a source voltage, compares a threshold voltage of the inverter with the substrate potential, and outputs a second comparison result signal; and a detection result output circuit for outputting a detection result showing if the voltage decrease or power discontinuity of the first voltage is occurring on the basis of the first comparison result signal and the second comparison result signal.