Provided herein are improved current monitoring systems for monitoring currents having large ranges. A current monitor can include two or more current sensors. At least two of the current sensors can have different current measurement ranges and different current measurement sensitivities. Each current sensor can be associated with one or more current monitoring thresholds. A time delay or time threshold can correspond to each current monitoring threshold. Each current sensor can monitor a same current having a large range of possible current values. When a predetermined current threshold is exceeded for an amount of time exceeding a corresponding time threshold, a signal can be generated by the current sensor. The generated signal can indicate that the measured current exceeds the predetermined current threshold for the corresponding predetermined period of time.

There is provided a short circuit determination apparatus including: a sensor configured to detect, in a switching device that has a control terminal, a first main terminal, and a second main terminal, a temporal change of a main current flowing between the first main terminal and the second main terminal; and a short circuit determination unit configured to determine that the switching device is short-circuited, in a case where the temporal change of the main current is larger than or equal to a first threshold value, after a first timing after a control signal for driving the control terminal is turned on.

A method for detecting an electrical fault in a current supply of a consumer, where a transition resistance of the current supply allocated to the consumer is determined from a local voltage value allocated to the consumer, a local current value allocated to the consumer, and a global voltage value, and compared to a resistance threshold value allocated to the consumer, and an electrical fault in the current supply of the consumer is detected as a function of the comparison result.

A detection apparatus has an alternating-current voltage input unit and a generation circuit. The generation circuit generates a superimposition signal in which information indicating a timing of a zero cross in an alternating-current voltage inputted into the input unit and information indicating a voltage level of the alternating-current voltage are superimposed.

Temporal history of voltage supply level enveloping high-speed transient events is provided by circuitry on the same chip or in the same multi-chip module as the processor cores. In some embodiments supply voltage to the processor cores is compared to predetermined or programmable thresholds, and the result of the comparisons are stored for use by a host processor.

In an embodiment a measuring arrangement includes a first supply connection, a second supply connection, at least one signal output, a reference potential connection, a voltage source arranged between the first supply connection and the reference potential connection, a source measuring unit arranged between the second supply connection and the reference potential connection and a controller coupled on an output side to the at least one signal output, wherein the first supply connection, the second supply connection, the at least one signal output and the reference potential connection are configured for connecting to a light-emitting diode assembly.

A circuit structure for realizing circuit pin multiplexing, comprising an MCU module, a temperature sensing circuit and a functional module circuit. The output end of the temperature sensing circuit is connected with an enable signal interface of the MCU module, the output voltage of the temperature sensing circuit is always higher than the threshold voltage of the enable signal, and the MCU module is connected with the functional module circuit. The circuit structure of the present invention realizes the mutual influence of analog signal output and digital signal transmission by designing a temperature sensing output curve, and achieves multi-function multiplexing of a single pin, so that the output of the analog signal and the input of the digital signal can share the pins, it solves the problem of the limitation of the number of pins, and promotes the transmission of the signal and improves the cost performance of the circuit.

Disclosed is a power plug capable of indicating the current size, which can indicate the current size through an LED lamp. It is easy to understand the power plug connected to the real-time current size of the electrical equipment will improve the safety of electricity. A current display unit is set on the power socket itself. The current display unit is connected with a live wire plug and a zero wire plug respectively. The current display unit includes electrically connected: sampling module, the sampling module is connected with a live wire plug and a zero wire plug respectively, use to sample the current of electrical equipment connected to a power plug; the control module, the control unit and the sampling unit are connected, the control unit is also electrically connected with the display module; display module, display module includes several LED lights, the control module collects the current data according to the sampling module, control different LED lights to glow; power supply module, which is connected with control module and display module respectively, is used to supply power for control module and display module.

A voltage monitoring circuit and a semiconductor device that can reduce time required for self-diagnosis are provided. A selection circuit selects one of a determination threshold voltage for normal use, a determination threshold voltage for self-diagnosis, and a determination threshold voltage for boost having a potential difference larger than that of the determination threshold voltage for normal use. A comparison circuit detects a presence or absence of a specification violation of the voltage to be monitored by comparing a selected voltage selected by the selection circuit and the voltage to be monitored. Here, the selection circuit forcibly outputs a detection result indicating that there is a specification violation by defining the determination threshold voltage for normal use as an initial state and sequentially selecting the determination threshold voltage for self-diagnosis, the determination threshold voltage for boost, and the determination threshold voltage for normal use when the self-diagnosis is performed.

In order to provide a voltage abnormality detection circuit and a semiconductor device which are capable of detecting a voltage abnormality in an internal power supply voltage of the semiconductor device with a simple circuit configuration, the voltage abnormality detection circuit includes: a reference voltage circuit configured to output a first reference voltage, which is higher than the internal power supply voltage, and a second reference voltage, which is lower than the internal power supply voltage; a first voltage detection circuit configured to detect that the internal power supply voltage has exceeded a desired voltage value, with the use of the first reference voltage; and a second voltage detection circuit configured to detect that the internal power supply voltage has dropped lower than the desired voltage value, with the use of the second reference voltage.