Systems and methods for calibrating a voltage measurement device are provided herein. The voltage measurement device generates a reference current signal and senses the reference current signal in a conductor under test. A calibration system may control a calibration voltage source to selectively output calibration voltages in a calibration conductor. The calibration system may obtain data from the voltage measurement device captured by the voltage measurement device when measuring the calibration conductor. Such data may include one or more reference current measurements, one or more voltage measurements, etc. The calibration system utilizes the obtained measurements to generate calibration data which may be stored on the voltage measurement device for use thereby during subsequent operation. The calibration data may include one or more lookup tables, coefficients for one or more mathematical formulas, etc.

This disclosure is directed to apparatuses, methods, and systems for detecting a capability of a power source connected to a device. For example, a device may include a standardized connector that may allow an unknown power source to provide power to the device. When a power source is connected with a device, a controller powers up and initiates power capability detection procedures. A ramping current sink begins drawing current from the power source at an initial value and increases that amount to a maximum current value. If a voltage on the device voltage bus falls below a voltage threshold during the ramping current sink operation, the current sink is disconnected and an indication is provided to the controller that the power source is underpowered. Further, a safety timer turns off the ramping current sink to prevent excessive heat generation.

In a system and method for correcting a stress-impaired signal in a circuit, a calibration circuit produces a first calibrated voltage based on a base-emitter voltage of one or more pnp transistors, a second calibrated voltage based on a base-emitter voltage of one or more npn transistors, and a voltage proportional to absolute temperature. A set of reference values are generated based on these voltages. A gain correction factor is calculated based on a function of the set of reference values and a set of temperature-dependent values, and the stress-impaired signal is corrected based on the gain correction factor.

A device for measuring voltage across a remote load includes a power supply configured to output a first output voltage to the remote load. A switch is selectively movable from a closed position to an open position. A measuring circuit measures a load voltage across the load when the switch is in the open position and determines a voltage difference between the first output voltage and the load voltage. The measuring circuit adjusts the first output voltage to a second output voltage to compensate for the voltage difference. A second A/D converter can also be coupled to the power supply. The second A/D converter measures a voltage across a resistor such that a change in the voltage indicates a change in the load voltage. The power supply is then adjusted to output a second output voltage to compensate for any change in load voltage.

A voltage monitoring system having a microcontroller with first and second monitoring applications and a hardware abstraction layer is provided. The hardware abstraction layer obtains a first measured voltage value associated with a first channel number. The hardware abstraction layer determines a second encoded channel number based on the first channel number. The hardware abstraction layer sends a first response message having the second encoded channel number and a first measured voltage value therein to the first monitoring application. The first monitoring application commands the microcontroller to generate first and second control signals to transition a contactor to an open operational state, if the second encoded channel number is not equal to a first expected encoded channel number

A voltage monitoring system having a microcontroller with an analog-to-digital converter with a first channel, and a memory device is provided. The microcontroller includes a monitoring application and a hardware abstraction layer. The monitoring application sends a first encoded channel number to the hardware abstraction layer. The hardware abstraction layer determines a first channel number based on the first encoded channel number, and obtains a measured voltage value associated with the first channel number. The hardware abstraction layer sends a second encoded channel number and the measured voltage value therein to the monitoring application. If the first encoded channel number is equal to the second encoded channel number, then the monitoring application stores the measured voltage value in the memory device.

A device for testing a voltage level in an electrical terminal cavity including a testing body and a probe for contacting the electrical terminal cavity. The probe includes a tip portion having a first cross-sectional area, a base portion having a second cross-sectional area, and an intermediate portion extending from the tip portion to the base portion having a third cross-sectional area. The first cross-sectional area is smaller than the third cross-sectional area, the third cross-sectional area is smaller than the second cross-sectional area, and the intermediate portion is concentric with the tip portion and the base portion. An axis extends between a center of the tip portion, a center of the intermediate portion, a center of the base portion, and a center of the testing body. The device also includes a circuit operatively coupled with the probe to sense the voltage level in the electrical terminal cavity.

A temperature sensor system for an integrated circuit includes at least one sensor configured to generate a sensor signal indicative of a temperature in a respective location of the integrated circuit and a sensing module configured to receive the sensor signal, determine a temperature of the at least one sensor based on the sensor signal, an electrical characteristic of the at least one sensor, and a relationship between the electrical characteristic and the temperature of the at least one sensor, the relationship corresponding to variations in the electrical characteristic at a known calibration temperature, and generate a temperature signal based on the determined temperature.

A power supply glitch detector includes a sense node AC coupled to a power supply node on which voltage glitches having a magnitude of V.sub.glitch are to be detected. A sensing inverter has an input and an output, the input coupled to the sensing node, the sensing inverter having a trip voltage V.sub.trip below which the output of the sensing inverter is at a voltage representing a logic high state and above which the output of the sensing inverter is at a voltage representing a logic low state. An adjustable voltage biasing circuit is coupled to the sensing node to maintain the input of the sensing inverter at a bias voltage V.sub.bias, wherein V.sub.bias is chosen such that either both conditions (V.sub.bias<V.sub.trip) and (V.sub.bias+V.sub.glitch>V.sub.trip) or both conditions (V.sub.bias>V.sub.trip) and (V.sub.biasV.sub.glitch<V.sub.trip) are always true.

In accordance with an embodiment, a method of operating a switched-mode power converter includes measuring an input voltage of the switched-mode power converter; determining an on-time of a switch of the switched-mode power converter; determining an off-time of the switch of the switched-mode power converter; and determining an output voltage of the switched-mode power converter based on the measured input voltage, the determined on-time and the determined off-time. The output voltage includes a voltage at a first node having a DC path to a load path of the switch.