A probe for an electrical testing device has an independently powered integrated light source. The probe has a plurality of lights oriented in a cross-like configuration and housed in a recessed surface of the probe. The plurality of lights projects light beams that extend toward the tip of the probe and illuminate the area directly in front of the tip from 360 degrees. The integrated light source is connected to a power source that is housed in the probe but is independent from the power source used for the electrical testing device.

A terminal block for current measurement in a power grid. The terminal block includes a shunt and a temperature sensor, and is configured to be connected to an Intelligent Electronic Device IED and a primary device. Furthermore, a respective IED and a system for current measurement including the IED and the terminal block are disclosed as well as a method for calibration of the system and a method for current measurement in power grids. A voltage measurement unit in the IED is adapted to measure a voltage drop at the shunt; a current flowing through the shunt can be calculated from the temperature and from calibration data. The terminal block enables a particularly efficient calibration method.

A power consumption measurement assembly includes: at least two sampling modules respectively connected to a circuit to be measured in series; a gating module configured to gate one of the at least two sampling modules; an amplifying module configured to acquire and amplify a voltage signal across the gated sampling module; and a processing module connected to the gating module and the amplifying module and configured to: control and adjust the gated sampling module and an amplification of the amplifying module, calculate a power consumption value based on the amplified voltage signal and transmit the power consumption value.

Techniques for phase identification using feature-based clustering approaches are disclosed. Embodiments employ linear and nonlinear dimensionality reduction techniques to extract feature vectors from raw time series. In an embodiment, a constrained clustering algorithm separates smart meters into phase connectivity groups. Another embodiment clusters smart meter data, where voltage measurements are collected from smart meters and a SCADA system. Then, customer voltage time series are normalized and linear or nonlinear dimensionality reduction is applied to the normalized time series to extract key features. Next, constraints in the clustering process are defined by inspecting network connectivity data. Then, a constrained clustering method is applied to partition customers into clusters. Lastly, each clusters phase is identified by solving a minimization problem. In another embodiment, a machine learning algorithm generalizes a subset of phase connectivity measurements to a distribution network, the algorithm being an extension of a Mapper algorithm in topological data analysis.

A method for measuring a residual DC voltage in a liquid crystal device including an active region having a plurality of liquid crystal capacitors and a plurality of TFTs, and a non-active region positioned outside the active region and having at least one monitoring capacitor, in which the plurality of liquid crystal capacitors and the at least one monitoring capacitor include a liquid crystal layer. The method includes: generating a V-I curve by applying a positive and negative symmetrical triangular wave voltage measuring, in the V-I curve, a voltage Vmax having a maximum absolute value where a current value reaches a positive maximum value or minimum value, and a voltage Vmin having a maximum absolute value where a current value reaches a negative minimum value or maximum value, and measuring one-half of the sum of the voltage Vmax and the voltage Vmin as the residual DC voltage.

The invention relates to a IM bias voltage determining method adapted to determine an IM bias voltage corresponding to a desired Quantum Bit Error Rate based on the following formula

[00001]$Q\left(V_{\mathrm{IM}}\right)=Q_0+\frac{R_{\mathrm{err}}}{R_{\mathrm{err}}+R_{\mathrm{cor}}}$

where Q(V.sub.IM) is the QBER dependent of the IM bias voltage V.sub.IM, Q.sub.0 is the optimal minimal QBER, R.sub.err is the number of erroneous detections, R.sub.cor is the number of correct detections and V.sub.IM is the IM bias voltage.

The present invention provides a voltage difference measurement circuit comprising a level shifting circuit, an ADC and a calculation circuit. In the operations of the voltage difference measurement circuit, the level shifting circuit adjusts levels of a supply voltage and a ground voltage to generate an adjusted supply voltage and an adjusted ground voltage, respectively. The ADC performs an analog-to-digital converting operation upon the adjusted supply voltage and the adjusted ground voltage to generate a first digital value and a second digital value, respectively. The calculation circuit calculates a voltage difference between the supply voltage and the ground voltage according to the first digital value and the second digital value.

A probe for use with a measuring instrument. The probe is a wired probe assembly comprising a housing with an integrated user interface. The wired probe assembly further comprises a measuring component for contacting a device to be measured and a cord component connecting the measuring component to the measuring instrument. The user interface can indicate a status of an electrical parameter and allow an operator to provide inputs remotely to the measuring device.

An apparatus measures a junction temperature in an IC through a pin of the IC and concurrently provides a digital input signal to digital logic of the IC through the pin. The IC has an ESD diode structure connected to the pin. High and low side voltage sensors sense a voltage drop across the diode structure. An input multiplexer controlled by the digital input signal selectively connects high and low side current sources to the pin to concurrently provide the digital input signal to the digital logic and to drive a constant current through the diode structure. An output multiplexer controlled by the digital input signal selectively connects the high and low side voltage sensors to an output that provides a sense signal indicative of the IC junction temperature.

A probe for an electrical testing device has an independently powered integrated light source. The probe has a plurality of lights oriented in a cross-like configuration and housed in a recessed surface of the probe. The plurality of lights projects light beams that extend toward the tip of the probe and illuminate the area directly in front of the tip from 360 degrees. The integrated light source is connected to a power source that is housed in the probe but is independent from the power source used for the electrical testing device.