In a method of manufacturing an integrated circuit involving performing an electrostatic discharge (ESD) test, a weak frequency band is detected by sequentially radiating a plurality of first electromagnetic waves on a first test board including the integrated circuit. First peak-to-peak voltage signals are detected by sequentially radiating the plurality of first electromagnetic waves on a second test board including an electromagnetic wave receiving module. A frequency spectrum is detected by radiating a second electromagnetic wave on a housing including a third test board including the electromagnetic wave receiving module. A second peak-to-peak voltage signal is generated based on the weak frequency band, the first peak-to-peak voltage signals and the frequency spectrum. An ESD characteristic associated with an electronic system including the integrated circuit is predicted based on the second peak-to-peak voltage signal.

The present invention relates to a method and a measuring apparatus for testing a device under test. A measuring apparatus applies a first test signal to the device under test and measures at least one frequency response parameter of the device under test for a first plurality of frequency values lying in a first frequency range. The measuring apparatus applies a second test signal to the device under test and measures the at least one frequency response parameter of the device under test for a second plurality of frequency values lying in a second frequency range. The first frequency range at least partially overlaps with the second frequency range and the first plurality of frequency values at least partially differs from the second plurality of frequency values.

The present invention relates to a method and a measuring apparatus for testing a device under test. A measuring apparatus applies a first test signal to the device under test and measures at least one frequency response parameter of the device under test for a first plurality of frequency values lying in a first frequency range. The measuring apparatus applies a second test signal to the device under test and measures the at least one frequency response parameter of the device under test for a second plurality of frequency values lying in a second frequency range. The first frequency range at least partially overlaps with the second frequency range and the first plurality of frequency values at least partially differs from the second plurality of frequency values.

A system and method are provided for making time domain measurements of a wideband periodic radio frequency (RF) signal using a narrowband measurement instrument operating in a frequency domain. The method includes receiving the periodic RF signal at a single port corresponding to a receiver of the measurement instrument; determining a complex absolute signal having amplitudes and phases of spectral components of the periodic RF signal over an entire bandwidth of the periodic RF signal in the frequency domain; and reconstructing a time domain signal corresponding to the periodic RF signal by transforming the complex absolute signal from the frequency domain to the time domain.

Various technologies described herein pertain to a testing apparatus that enables an analog frequency response of a device under test to be analyzed. The testing apparatus includes a laser source and an optical resonator. The laser source is optically injection locked to the optical resonator. The testing apparatus also includes a modulator configured to apply a time-varying voltage to the optical resonator. The time-varying voltage causes the laser source optically injection locked to the optical resonator to generate a frequency modulated optical signal that can include time-varying chirps. The testing apparatus further includes an interferometer (e.g., variable delay, fixed length) configured to receive the frequency modulated optical signal from the laser source optically injection locked to the optical resonator. The interferometer outputs an optical test signal having a range of frequencies. The frequencies in the optical test signal are based at least in part on the time-varying chirps.

A method for at least one of detecting and classifying a wanted signal in an electromagnetic signal is described. The method includes the following steps: the electromagnetic signal is received; a spectrogram of the electromagnetic signal is determined; at least one correlation parameter, for example a correlation multi-dimensional algebraic object including several correlation parameters, is determined based on the determined spectrogram; the at least one correlation parameter is used as an input for a machine learning module; the wanted signal in the electromagnetic signal is detected and/or classified via the machine learning module based at least partially on the at least one correlation parameter. Further, a signal detection and/or classification system and a computer program are described.

An adjusting system and an adjusting method for equalization processing are provided. Frequency band energies of sound receiving signals are obtained. The frequency band energies correspond to different frequency bands, respectively. Target gains corresponding to frequency bands are determined according to the frequency band energies. Frequency responses of filtering processing with respect to a plurality of center frequencies are obtained. Equalization gains corresponding to the frequency bands and having the least gain error are determined. The gain error is related to a difference between the amplitude obtained after the equalization gains are reflected on the frequency responses corresponding to the filtering processing and the target gains. The equalization gains are inputted into the filtering processing according to the corresponding frequency bands. Accordingly, the impact of the filtering processing can be reduced.

An adjusting system and an adjusting method for equalization processing are provided. Frequency band energies of sound receiving signals are obtained. The frequency band energies correspond to different frequency bands, respectively. Target gains corresponding to frequency bands are determined according to the frequency band energies. Frequency responses of filtering processing with respect to a plurality of center frequencies are obtained. Equalization gains corresponding to the frequency bands and having the least gain error are determined. The gain error is related to a difference between the amplitude obtained after the equalization gains are reflected on the frequency responses corresponding to the filtering processing and the target gains. The equalization gains are inputted into the filtering processing according to the corresponding frequency bands. Accordingly, the impact of the filtering processing can be reduced.

The invention relates to a device for the frequency analysis of a signal, comprising a diamond crystal having NV centers defining sub-regions, an excitation unit for optically or electrically exciting each sub-region, an injection unit for injecting a signal so that the sub-region is in the presence of the signal, a magnetic field generator designed so as to generate a magnetic field on each sub-region, the magnetic field having a spatial variation of amplitude in a first direction, and a detector for detecting the resonance frequency of each sub-region of the region, the detector comprising an electrical contact for detecting the charges created in a sub-region, and a reading circuit.

The invention relates to a device for the frequency analysis of a signal, comprising a diamond crystal having NV centers defining sub-regions, an excitation unit for optically or electrically exciting each sub-region, an injection unit for injecting a signal so that the sub-region is in the presence of the signal, a magnetic field generator designed so as to generate a magnetic field on each sub-region, the magnetic field having a spatial variation of amplitude in a first direction, and a detector for detecting the resonance frequency of each sub-region of the region, the detector comprising an electrical contact for detecting the charges created in a sub-region, and a reading circuit.