Patent classifications
G01R23/163
Measurement apparatus
A measurement apparatus (1) comprising a high frequency measurement unit (2) adapted to measure high frequency parameters (HFP) of a device under test (DUT) connected to ports of said measurement apparatus (1) and a multimeter unit (3) adapted to measure DC characteristics parameters (DCP) of said device under test (DUT) connected via control signal lines (CL) to a control bus interface (6) of said measurement apparatus (1).
System for analysis of a microwave frequency signal by imaging
A system for analyzing a microwave-frequency signal by imaging is provided, comprising: a solid material at least one optical property of which is modifiable in at least one zone of the material, when the zone is simultaneously in the presence of an optical excitation or electrical excitation and a microwave-frequency signal having at least one frequency coinciding with a resonant frequency of the material,
the material furthermore being such that a value of the resonant frequency varies as a function of the amplitude of a magnetic field, a magnetic field generator configured to generate a magnetic field having, in the interior of a portion of the zone, a spatial amplitude variation in a direction X, the material then having a resonant frequency that is dependent on a position in the direction X, and a detector configured to receive an image of the zone in said direction X.
System for analysis of a microwave frequency signal by imaging
A system for analyzing a microwave-frequency signal by imaging is provided, comprising: a solid material at least one optical property of which is modifiable in at least one zone of the material, when the zone is simultaneously in the presence of an optical excitation or electrical excitation and a microwave-frequency signal having at least one frequency coinciding with a resonant frequency of the material,
the material furthermore being such that a value of the resonant frequency varies as a function of the amplitude of a magnetic field, a magnetic field generator configured to generate a magnetic field having, in the interior of a portion of the zone, a spatial amplitude variation in a direction X, the material then having a resonant frequency that is dependent on a position in the direction X, and a detector configured to receive an image of the zone in said direction X.
Apparatus for measuring radio frequency power as well as method of analyzing a radio frequency signal
An apparatus for measuring radio frequency power is described that comprises at least one measurement path for small bandwidth and at least one measurement path for wide bandwidth. Further, the apparatus has an analysis and measurement unit connected with the at least two measurement paths. The analysis and measurement unit is configured to process the at least one small bandwidth signal and the at least one wide bandwidth signal. Further, a method of analyzing a radio frequency signal is described.
Method of evaluating device including noise source
A method of evaluating a device includes a first electric circuit acting as a noise source and a second electric circuit which is likely to malfunction due to a noise signal. The method includes: obtaining malfunction frequency characteristics indicating magnitudes of a threshold noise signal causing malfunction of the second electric circuit; obtaining internal noise arrival frequency characteristics indicating magnitudes of an internal noise signal arriving at the second electric circuit from the first electric circuit; and comparing the malfunction frequency characteristics with the internal noise arrival frequency characteristics.
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
The present invention relates to a processing of digitally measured signals. When sampling a measurement signal with a predetermined sampling rate, aliasing effects may occur, if a Nyquist condition is violated. For this purpose, the present invention suggests to analyze a frequency spectrum of a signal and to compare the frequency components of the spectrum with the setting of a measurement apparatus, in particular a sampling rate of the measurement apparatus. If a measurement signal comprises frequency components which may violate the Nyquist condition, an alert may be generated to adapt the set of the measurement arrangement.
HIGH-PRECISION FREQUENCY MEASURING SYSTEM AND METHOD
A high-precision frequency measuring system and method. The system includes: an analog-to-digital conversion module for receiving an analog intermediate frequency signal to convert the analog intermediate frequency signal into a digital intermediate frequency signal; a frequency mixing module for generating two orthogonal local carriers to convert the digital intermediate frequency signal to a digital baseband signal; an extraction filter module for performing low-pass filtering and extraction of the digital baseband signal, so as to reduce a data rate; a Fourier transform module for obtaining a frequency domain signal; a frequency measurement module for obtaining a first frequency measurement value; a scanning module for obtaining a scanned second frequency measurement value; and a selector for selecting either the first frequency measurement value or the second frequency measurement value as a result of frequency measurement. The system and method can improve the accuracy of frequency measurement.
Analog spectrum analyzer
A spectrum analyzer for a signal I.sub.RF comprising a plurality of frequencies f.sub.i comprises N entities each made up of a structure formed by a stack of magnetic and non-magnetic layers having in at least one of the magnetic layers a magnetic configuration in the shape of a vortex, the excitation modes of the magnetic configuration being suitable for detecting the frequencies contained in an incident signal in real time, each entity having a first lower electrode and a second upper electrode, a voltage-measuring device suitable for measuring an electric voltage showing the presence of a frequency f.sub.k in the analyzed signal I.sub.RF, the device being connected to the lower electrode and to the upper electrode, a measurement-processing device suitable for determining the value of the frequencies f.sub.k in the signal I.sub.RF, and a line carrying the signal to be analyzed to each of the entities.
Analog spectrum analyzer
A spectrum analyzer for a signal I.sub.RF comprising a plurality of frequencies f.sub.i comprises N entities each made up of a structure formed by a stack of magnetic and non-magnetic layers having in at least one of the magnetic layers a magnetic configuration in the shape of a vortex, the excitation modes of the magnetic configuration being suitable for detecting the frequencies contained in an incident signal in real time, each entity having a first lower electrode and a second upper electrode, a voltage-measuring device suitable for measuring an electric voltage showing the presence of a frequency f.sub.k in the analyzed signal I.sub.RF, the device being connected to the lower electrode and to the upper electrode, a measurement-processing device suitable for determining the value of the frequencies f.sub.k in the signal I.sub.RF, and a line carrying the signal to be analyzed to each of the entities.
Method for detecting signals in a frequency-ambiguous digital receiver, and digital receiver implementing such a method
A digital receiver comprising at least two reception pathways, the method carries out a digital inter-correlation of the signals obtained as output from at least two filters of different central frequencies and different ranks, the rank and the central frequency of the filters being chosen as a function of a determined frequency-wise search domain. For a determined search domain, the various sampling frequencies of the reception pathways are chosen so that the ambiguous frequencies resulting from the spectral aliasings vary as a monotonic function of the true frequency of the signals.