An optic probe is used to measure signals from a device under test. The optic probe is positioned at a target probe location within a cell of the device under test, the cell including a target net to be measured and a plurality of non-target nets. A test pattern is applied to the cell with the optic probe a laser probe (LP) waveform is obtained in response. A target net waveform is extracted from the LP waveform by: (i) simulating a combinational logic analysis (CLA) cross-talk waveform to model cross-talk from selected non-target nets by simulating an optical response of the cell to the test pattern with the target net masked; (ii) estimating a cross-talk weight; and (iii) determining a target net waveform by weighting the CLA cross-talk waveform according to the cross-talk weight and subtracting the weighted CLA cross-talk waveform from the LP waveform.

The invention relates to a device for the spectral analysis of an electromagnetic measurement signal using an optoelectronic mixer, wherein the optoelectronic mixer is designed to generate the electrical superimposition signal by superimposing the electromagnetic measurement signal and a reference signal with at least one known frequency (fo). The device comprises the following features: a signal input for receiving an electrical superimposition signal from the optoelectronic mixer, a low-pass filter, a rectifier, and a read-out unit. The low-pass filter is designed to generate a filtered superimposition signal from the electrical superimposition signal by filtering out frequency portions above an upper cutoff frequency (fG). The rectifier is designed to generate a rectified superimposition signal from the filtered superimposition signal. The read-out unit is designed to determine a match of the known frequency (fo) of the reference signal with the electromagnetic measurement signal based on the rectified overlay signal.

A method evaluates a frequency spectrum representative of at least one time-dependent signal, the at least one time dependent signal being derived from an output from a measuring device under predetermined measuring device operating conditions. The time-dependent signal, includes a portion being representative of a wanted signal, and a portion being representative of noise. The method includes the steps of determining, based on the frequency spectrum of the signal, a value representative of the noise floor, identifying, based on the frequency spectrum of the signal derived under the predetermined operating condition, a peak component, and if the peak component satisfies a relative peak criterion determined on the basis of the determined value representative of the noise floor, determining the wanted signal by applying a predetermined algorithm. The invention further relates to a method for determining flow of a measuring device, and a sensor.

A method evaluates a frequency spectrum representative of at least one time-dependent signal, the at least one time dependent signal being derived from an output from a measuring device under predetermined measuring device operating conditions. The time-dependent signal, includes a portion being representative of a wanted signal, and a portion being representative of noise. The method includes the steps of determining, based on the frequency spectrum of the signal, a value representative of the noise floor, identifying, based on the frequency spectrum of the signal derived under the predetermined operating condition, a peak component, and if the peak component satisfies a relative peak criterion determined on the basis of the determined value representative of the noise floor, determining the wanted signal by applying a predetermined algorithm. The invention further relates to a method for determining flow of a measuring device, and a sensor.

A spectrum processing apparatus includes: a spectrum obtainer configured to obtain an optical spectrum from a light that is scattered or reflected from a subject; and a processor configured to split the optical spectrum into a plurality of bands, determine, based on a predetermined measurement accuracy for measuring a biosignal from the light, one or more key bands from the plurality of bands, and obtain the biosignal from the determined key bands.

A spectrum processing apparatus includes: a spectrum obtainer configured to obtain an optical spectrum from a light that is scattered or reflected from a subject; and a processor configured to split the optical spectrum into a plurality of bands, determine, based on a predetermined measurement accuracy for measuring a biosignal from the light, one or more key bands from the plurality of bands, and obtain the biosignal from the determined key bands.

A method evaluates a frequency spectrum representative of at least one time-dependent signal, the at least one time dependent signal being derived from an output from a measuring device under predetermined measuring device operating conditions. The time-dependent signal, includes a portion being representative of a wanted signal, and a portion being representative of noise. The method includes the steps of determining, based on the frequency spectrum of the signal, a value representative of the noise floor, identifying, based on the frequency spectrum of the signal derived under the predetermined operating condition, a peak component, and if the peak component satisfies a relative peak criterion determined on the basis of the determined value representative of the noise floor, determining the wanted signal by applying a predetermined algorithm. The invention further relates to a method for determining flow of a measuring device, and a sensor.

This invention disclosed a system and method for characteristics measurement of electromagnetic signals. The measurement system comprises a multi-repetition-rate pulsed light source, a frequency mixer for electrical signal and optical signal, and a data acquisition and processing device. The measurement system accurately determines the characteristic information of the signal to be measured, such as frequency, phase, intensity, and their variations, by measuring the low frequency mixed signal generated by the multi-repetition-rate pulsed light source and the signal to be measured in the frequency mixer. This system has the advantages of simple structure, high measurement accuracy, low cost and large measurable frequency range. The system can be applied to the measurement of various electromagnetic signals, covering the spectral range from microwave, millimeter wave, to terahertz and even light wave.

This invention disclosed a system and method for characteristics measurement of electromagnetic signals. The measurement system comprises a multi-repetition-rate pulsed light source, a frequency mixer for electrical signal and optical signal, and a data acquisition and processing device. The measurement system accurately determines the characteristic information of the signal to be measured, such as frequency, phase, intensity, and their variations, by measuring the low frequency mixed signal generated by the multi-repetition-rate pulsed light source and the signal to be measured in the frequency mixer. This system has the advantages of simple structure, high measurement accuracy, low cost and large measurable frequency range. The system can be applied to the measurement of various electromagnetic signals, covering the spectral range from microwave, millimeter wave, to terahertz and even light wave.

A system for analyzing a microwave-frequency signal by imaging is provided, comprising: a solid material at least one optical property of which is modifiable in at least one zone of the material, when the zone is simultaneously in the presence of an optical excitation or electrical excitation and a microwave-frequency signal having at least one frequency coinciding with a resonant frequency of the material,
the material furthermore being such that a value of the resonant frequency varies as a function of the amplitude of a magnetic field, a magnetic field generator configured to generate a magnetic field having, in the interior of a portion of the zone, a spatial amplitude variation in a direction X, the material then having a resonant frequency that is dependent on a position in the direction X, and a detector configured to receive an image of the zone in said direction X.