G01R23/20

GENERALIZED VIRTUAL PIM MEASUREMENT FOR ENHANCED ACCURACY

An apparatus, method and work product is disclosed. The method comprises measuring plural transmit signals and corresponding receive signals and determining, using a model describing a relation between each of the plural transmit signals and a respective passive intermodulation signal, a standardized passive intermodulation signal as one or more nth order intermodulation products for a standardized transmit signal consisting of two tones each of a power of substantially 20 Watts. The method may also comprise identifying in the model one or more n.sup.th order cross-intermodulation products resulting from three or more transmit signals having different respective carrier frequencies. Responsive to the identification, the method may comprise adapting the standardized two-tone passive intermodulation signal by determining an offset for producing an adapted two-tone standardized passive intermodulation signal, n is an odd integer greater than two.

Method and apparatus to evaluate audio equipment for dynamic distortions and or differential phase and or frequency modulation effects
11041893 · 2021-06-22 ·

A system is provided to analyze cross-modulation distortion in audio devices, which may include testing with audio frequencies. One or more distortion signals from the audio device may be measured for an amplitude, phase, and or frequency modulation effect. In another embodiment a musical signal may be used as a test signal. Providing additional test signals to the audio device can induce a time varying cross-modulation distortion signal from an output of the audio device. Also utilizing at least one additional filter, filter bank, demodulator and or frequency converter and or frequency multiplier provides extra examination of distortion. Also frequency and or phase response can be measured with the presence of a de-sensing signal and or another signal that induce near slew rate limiting or near overload condition of the device under test.

Method and apparatus to evaluate audio equipment for dynamic distortions and or differential phase and or frequency modulation effects
11041893 · 2021-06-22 ·

A system is provided to analyze cross-modulation distortion in audio devices, which may include testing with audio frequencies. One or more distortion signals from the audio device may be measured for an amplitude, phase, and or frequency modulation effect. In another embodiment a musical signal may be used as a test signal. Providing additional test signals to the audio device can induce a time varying cross-modulation distortion signal from an output of the audio device. Also utilizing at least one additional filter, filter bank, demodulator and or frequency converter and or frequency multiplier provides extra examination of distortion. Also frequency and or phase response can be measured with the presence of a de-sensing signal and or another signal that induce near slew rate limiting or near overload condition of the device under test.

Nonlinear oscillation detection method based on measurement data, and recording medium and apparatus for performing the same

Provided is a nonlinear oscillation detection method at an electric power system, and a recording medium and apparatus for performing the method. The nonlinear oscillation detection apparatus at the electric power system detects various kinds of nonlinear oscillation occurring at the electric power system by applying a nonlinear oscillation precognition algorithm based on a nonlinear dynamic theory to the time series information measured at the electric power system.

Nonlinear oscillation detection method based on measurement data, and recording medium and apparatus for performing the same

Provided is a nonlinear oscillation detection method at an electric power system, and a recording medium and apparatus for performing the method. The nonlinear oscillation detection apparatus at the electric power system detects various kinds of nonlinear oscillation occurring at the electric power system by applying a nonlinear oscillation precognition algorithm based on a nonlinear dynamic theory to the time series information measured at the electric power system.

CURRENT MEASUREMENT COMPENSATION FOR HARMONICS

A measurement module uses harmonic compensation factors to minimize the effects of harmonic distortion in measurements of a source current by a current sensor of the module. The module samples at a first sampling rate, measurements of the source current to generate a first current measurement. The module samples at a second sampling rate higher than the first sampling rate, for an interval of time, measurements of the source current to generate a second current measurement. The module determines a harmonic compensation factor based, at least, on a difference between the first current measurement and the second current measurement. The module determines a reported current computed as a function of at least the first current measurement, the difference between the first current measurement and the second current measurement, and the harmonic compensation factor. The reported current represents a magnitude of the source current adjusted by the harmonic compensation factor.

Electromagnetic imaging and inversion of simple parameters in storage bins

A method for electromagnetic imaging of containers receives uncalibrated first data corresponding to signals of a first plurality of different frequencies associated with an antenna array residing in a container having contents. The method estimates of a second data based on a computer model and simulation of signals of a second plurality of different frequencies associated with the antenna array, the second plurality of different frequencies including a subset of the first plurality of different frequencies. The method compares magnitudes, without corresponding phase comparisons, of the first and second data at each frequency of the second plurality of different frequencies. The method updates the second data based on the comparing. The method provides information about the contents within the container based on the updated second data.

SINUSOIDAL HARMONIC NULLING
20210190840 · 2021-06-24 ·

Systems, methods, and computer program products for sinusoidal nulling are provided. Aspects include transmitting, by a controller, an excitation signal to a first sensor, determining, by the controller, a target harmonic based at least on one or more characteristics of the excitation signal, receiving a return signal from the first sensor, sampling the return signal at a first sample rate based on the target harmonic, and adjusting a phase of the sampled return signal to null the target harmonic amplitude to form an adjusted return signal.

SINUSOIDAL HARMONIC NULLING
20210190840 · 2021-06-24 ·

Systems, methods, and computer program products for sinusoidal nulling are provided. Aspects include transmitting, by a controller, an excitation signal to a first sensor, determining, by the controller, a target harmonic based at least on one or more characteristics of the excitation signal, receiving a return signal from the first sensor, sampling the return signal at a first sample rate based on the target harmonic, and adjusting a phase of the sampled return signal to null the target harmonic amplitude to form an adjusted return signal.

Direct measurement test structures for measuring static random access memory static noise margin

A test structure for measuring static noise margin (SNM) for one or more static random access memory (SRAM) cells can include a first transistor gate (TG) and a second TG electrically coupled to each SRAM cell. In an implementation, an interconnect between an output of a first inverter and an input of a second inverter of the SRAM cell can be electrically disconnected using a cut off. During operation of the SRAM cell, internal storage nodes within the SRAM cell can be electrically coupled through the first TG and the second TG to, for example, external pins and to a test fixture. Electrical parameters such as voltage can be measured at the internal storage nodes through the external pins and used to calculate SNM of the SRAM cell.