G01R27/04

SYSTEMS AND METHODS FOR NON-INVASIVE MICROWAVE TESTING OF BOTTLES OF WINE
20210311012 · 2021-10-07 ·

A system for non-invasive microwave testing a bottle of wine may include an emission probe for emitting a microwave signal through a wall of the bottle into the wine and a detection probe for receiving at least a portion of the microwave signal from the wine via the wall.

Testing system
11137358 · 2021-10-05 · ·

A testing system for testing a workpiece for a characteristic by irradiating microwaves to the workpiece and also irradiating a laser beam at an irradiation position of the microwaves, receiving microwaves reflected at the irradiation position where the workpiece has a reflectivity increased by carriers generated through photoexcitation, and measuring a lifetime of the carriers. The testing system includes a chuck table that holds the workpiece, a microwave irradiation unit that irradiates the microwaves to the workpiece held on the chuck table, a microwave reception unit that receives microwaves reflected by the workpiece, and a laser beam irradiation unit that irradiates the laser beam onto the irradiation position to which the microwaves have been irradiated.

MEASUREMENT DEVICE

A measurement device with improved electrical strength comprises an input for receiving an input signal as well as a measurement circuit connected with the input. The measurement circuit has at least one component. The measurement device also comprises an electrical interface provided in addition to the input. The measurement device further comprises at least one internal enclosure that encloses the component within the measurement device, thereby improving the electrical strength of the measurement device.

MEASUREMENT DEVICE

A measurement device with improved electrical strength comprises an input for receiving an input signal as well as a measurement circuit connected with the input. The measurement circuit has at least one component. The measurement device also comprises an electrical interface provided in addition to the input. The measurement device further comprises at least one internal enclosure that encloses the component within the measurement device, thereby improving the electrical strength of the measurement device.

System and method for sub-wavelength detection for jetting-based additive manufacturing using a split ring resonator probe

The present disclosure relates to a system for detecting and analyzing droplets of feedstock material being ejected from an additive manufacturing device. The system makes use of a split ring resonator (SRR) probe including a ring element having a gap, with the gap being positioned adjacent a path of travel of the droplets of feedstock material. An excitation signal source is used for supplying an excitation signal to the SRR probe. An analyzer analyzes signals generated by the SRR probe in response to perturbations in an electric field generated by the SRR probe as the droplets of feedstock material pass the ring element. The signals are indicative of dimensions of the droplets of feedstock material.

Thermal abnormality detection system and method

A thermal abnormality detection system includes: a first heat dissipation system having a first temperature sensor for measuring an actual temperature of the first heat dissipation system; a second heat dissipation system having a second temperature sensor for measuring an actual temperature of the second heat dissipation system. Assuming that a difference between the actual temperature of the first heat dissipation system and an upper limit temperature of the first heat dissipation system is d1, and a difference between the actual temperature of the second heat dissipation system and an upper limit temperature of the second heat dissipation system is d2, when a value of d1−d2 is greater than an error threshold value Error1_level, the first heat dissipation system is determined to be abnormal, and when the value of d1−d2 is less than an error threshold value Error2_level, the second heat dissipation system is determined to be abnormal.

ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE WAVE
20210172988 · 2021-06-10 ·

Various examples are provided related to anisotropic constitutive parameters (ACPs) that can be used to launch Zenneck surface waves. In one example, among others, an ACP system includes an array of ACP elements distributed over a medium such as, e.g., a terrestrial medium. The array of ACP elements can include one or more horizontal layers of radial resistive artificial anisotropic dielectric (RRAAD) elements positioned in one or more orientations over the terrestrial medium. The ACP system can include vertical lossless artificial anisotropic dielectric (VLAAD) elements distributed over the terrestrial medium in a third orientation perpendicular to the horizontal layer or layers. The ACP system can also include horizontal artificial anisotropic magnetic permeability (HAAMP) elements distributed over the terrestrial medium. The array of ACP elements can be distributed about a launching structure, which can excite the ACP system with an electromagnetic field to launch a Zenneck surface wave.

Time-domain segmented calibration method for a characteristic impedance of a time-domain reflectometer

A time-domain segmented calibration method for a characteristic impedance of a time-domain reflectometer is provided. The method first segments the measured characteristic impedance value according to the reflection coefficients ρ, determines several boundary points with the reflection coefficients, and divides the range of the measured impedance according to the impedance values corresponding to the reflection coefficients of the boundary points, and then select a typical impedance value in the range as a reference impedance for calibration. The TDR instrument performs characteristic impedance calibration for each typical reference impedance value one by one, and stores them as calibration parameters of different groups. With respect to different impedance value ranges, the selection ranges of the calibration and measurement areas of TDR are different. When the measurement is performed, the 50Ω calibration parameter is used as the default reference for calculation.

Electromagnetic imaging and inversion of simple parameters in storage bins

A method for electromagnetic imaging of containers receives uncalibrated first data corresponding to signals of a first plurality of different frequencies associated with an antenna array residing in a container having contents. The method estimates of a second data based on a computer model and simulation of signals of a second plurality of different frequencies associated with the antenna array, the second plurality of different frequencies including a subset of the first plurality of different frequencies. The method compares magnitudes, without corresponding phase comparisons, of the first and second data at each frequency of the second plurality of different frequencies. The method updates the second data based on the comparing. The method provides information about the contents within the container based on the updated second data.

Electromagnetic imaging and inversion of simple parameters in storage bins

A method for electromagnetic imaging of containers receives uncalibrated first data corresponding to signals of a first plurality of different frequencies associated with an antenna array residing in a container having contents. The method estimates of a second data based on a computer model and simulation of signals of a second plurality of different frequencies associated with the antenna array, the second plurality of different frequencies including a subset of the first plurality of different frequencies. The method compares magnitudes, without corresponding phase comparisons, of the first and second data at each frequency of the second plurality of different frequencies. The method updates the second data based on the comparing. The method provides information about the contents within the container based on the updated second data.