Various examples are provided related to anisotropic constitutive parameters (ACPs) that can be used to launch Zenneck surface waves. In one example, among others, an ACP system includes an array of ACP elements distributed above a medium such as, e.g., a terrestrial medium. The array of ACP elements can include one or more horizontal layers of radial resistive artificial anisotropic dielectric (RRAAD) elements positioned in one or more orientations above the terrestrial medium. The ACP system can include vertical lossless artificial anisotropic dielectric (VLAAD) elements distributed above the terrestrial medium in a third orientation perpendicular to the horizontal layer or layers. The ACP system can also include horizontal artificial anisotropic magnetic permeability (HAAMP) elements distributed above the terrestrial medium. The array of ACP elements can be distributed about a launching structure, which can be excited with an electromagnetic field to facilitate the launch of a Zenneck surface wave.

Disclosed is a method and a system for stimulating and communicating with floral objects. The system includes a base unit for communicating with the floral objects to read and stimulating physical and biological properties, and an electronic circuitry configured to be placed in reach of the floral objects. The electronic circuitry is capacitively coupled to the base unit and the floral objects. The base unit is able to create and communicate stimulated patterns to stimulate growth, biological properties of the floral object. The base unit generates stimulated pattern on receiving information and data from the electronic circuitry.

A system and method for measuring resistance over an array. The array includes at least three electrodes. Nodes at each intersection between input electrodes and output electrodes have variable resistance. A driving voltage is applied to a selected input electrode and an output current is received at a selected output electrode. A selected node is at the intersection of the two selected electrodes and includes an electrical component with a resistive property. Remaining electrodes are connected with a ground for isolating the selected node from the effects of changes in impedance of the remaining nodes. The driving voltage is converted to an output current by resistance at the selected node. The output current is converted to an output voltage with a current-to-voltage converter circuit for measuring the resistance of the electrical component. The nodes may be measured as the selected node in sequential or non-sequential patterns.

A system and method for measuring resistance over an array. The array includes at least three electrodes. Nodes at each intersection between input electrodes and output electrodes have variable resistance. A driving voltage is applied to a selected input electrode and an output current is received at a selected output electrode. A selected node is at the intersection of the two selected electrodes and includes an electrical component with a resistive property. Remaining electrodes are connected with a ground for isolating the selected node from the effects of changes in impedance of the remaining nodes. The driving voltage is converted to an output current by resistance at the selected node. The output current is converted to an output voltage with a current-to-voltage converter circuit for measuring the resistance of the electrical component. The nodes may be measured as the selected node in sequential or non-sequential patterns.

A measuring device may include: a signal generator for generating a test signal; and a measurement control unit that inputs the generated test signal to a radio frequency (RF) chain including at least one circuit element, detects output signals of a first diode, a second diode, and a third diode which receive, as input signals, signals generated on the basis of a coupled signal for an input test signal of a circuit element of the at least one circuit element and a coupled signal for an output test signal of the circuit element, and measures an S-parameter for the circuit element on the basis of a component signal of the third frequency in the output signal of the first diode, a component signal of the third frequency in the output signal of the third diode, and the output signal of the second diode.

A system is provided for performing measurements in a modular application environment. The system comprises a digital measurement data recorder adapted to create raw digital data with respect to a measurement. The system further comprises at least two modular applications, adapted to perform at least two different data processing schemes, where one comprises a measurement unit module and the other comprises an application unit module. In this context, the measurement unit module is adapted to capture or process the raw digital data from the digital measurement data recorder. Moreover, the application unit module is adapted to process raw digital data and/or measurement results from the digital measurement data recorder into a user interface.

Various examples are provided related to anisotropic constitutive parameters (ACPs) that can be used to launch Zenneck surface waves. In one example, among others, an ACP system includes an array of ACP elements distributed above a medium such as, e.g., a terrestrial medium. The array of ACP elements can include one or more horizontal layers of radial resistive artificial anisotropic dielectric (RRAAD) elements positioned in one or more orientations above the terrestrial medium. The ACP system can include vertical lossless artificial anisotropic dielectric (VLAAD) elements distributed above the terrestrial medium in a third orientation perpendicular to the horizontal layer or layers. The ACP system can also include horizontal artificial anisotropic magnetic permeability (HAAMP) elements distributed above the terrestrial medium. The array of ACP elements can be distributed about a launching structure, which can be excited with an electromagnetic field to facilitate the launch of a Zenneck surface wave.

A method to evaluate a semiconductor-superconductor heterojunction for use in a qubit register of a topological quantum computer includes (a) measuring one or both of a radio-frequency (RF) junction admittance of the semiconductor-superconductor heterojunction and a sub-RF conductance including a non-local conductance of the semiconductor-superconductor heterojunction, to obtain mapping data and refinement data; (b) finding by analysis of the mapping data one or more regions of a parameter space consistent with an unbroken topological phase of the semiconductor-superconductor heterojunction; and (c) finding by analysis of the refinement data a boundary of the unbroken topological phase in the parameter space and a topological gap of the semiconductor-superconductor heterojunction for at least one of the one or more regions of the parameter space.

To shorten a waiting time for a belongings inspection, the present invention provides an inspection system 10 including: an electromagnetic wave transmission/reception unit 11 that irradiates an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter, and receives a reflection wave; a detection unit 12 that performs detection processing, based on a signal of the reflection wave; a decision unit 13 that decides a path in which an inspection target person advances, based on a result of the detection processing; and a guide unit 14 that performs processing of guiding the inspection target person to a decided path.

Disclosed herein is a detecting device including a coil electromagnetically coupled to the external, a resonant circuit that includes at least the coil, and a detecting section that superimposes a measurement signal for measuring the Q-factor of the resonant circuit on a power transmission signal transmitted to the coil in a contactless manner and removes the power transmission signal from an alternating-current signal obtained by superimposing the measurement signal on the power transmission signal. The detecting section measures the Q-factor by using the alternating-current signal from which the power transmission signal is removed.