A system for determining electrical characteristics of an electric load can comprise a signal modulation circuit that can include a first integral controller configured to control AC reference voltage based on a requested maximum AC current and an estimated maximum AC current, a second integral controller configured to control DC reference voltage based on a requested DC current and an estimated DC current, a signal demodulation circuit including an AC current estimation circuit configured to generate the estimated maximum AC current for the signal modulation circuit, a DC current estimation circuit configured to generate the estimated DC current for the signal modulation circuit, and a resistance and inductance (RL) estimation circuit configured to determine inductance of the electric load based on the estimated maximum AC current and phase shift, wherein the estimated maximum AC current is a value lower than a DC offset current value.

A system for determining electrical characteristics of an electric load can comprise a signal modulation circuit that can include a first integral controller configured to control AC reference voltage based on a requested maximum AC current and an estimated maximum AC current, a second integral controller configured to control DC reference voltage based on a requested DC current and an estimated DC current, a signal demodulation circuit including an AC current estimation circuit configured to generate the estimated maximum AC current for the signal modulation circuit, a DC current estimation circuit configured to generate the estimated DC current for the signal modulation circuit, and a resistance and inductance (RL) estimation circuit configured to determine inductance of the electric load based on the estimated maximum AC current and phase shift, wherein the estimated maximum AC current is a value lower than a DC offset current value.

A technique for measuring the resistance of a resistive element 4 in the presence of a series diode is provided. By supplying three different currents I.sub.1, I.sub.2, I.sub.3 and measuring corresponding voltages V.sub.1, V.sub.2, V.sub.3 across the resistive element and diode, the voltages can be combined to at least partially eliminate an error in the measured resistance of the resistive element caused by a voltage drop across the diode. A technique for current control in an array of resistive elements is also described in which a column of resistive elements is provided with two or more current sources switched so that while one current source is providing current to the column line corresponding to a selected resistive element, another current source has its amount of current adjusted.

A technique for measuring the resistance of a resistive element 4 in the presence of a series diode is provided. By supplying three different currents I.sub.1, I.sub.2, I.sub.3 and measuring corresponding voltages V.sub.1, V.sub.2, V.sub.3 across the resistive element and diode, the voltages can be combined to at least partially eliminate an error in the measured resistance of the resistive element caused by a voltage drop across the diode. A technique for current control in an array of resistive elements is also described in which a column of resistive elements is provided with two or more current sources switched so that while one current source is providing current to the column line corresponding to a selected resistive element, another current source has its amount of current adjusted.

The present disclosure refers to a method of measuring resistance of the resistive sensor (5), where the value of resistance of the resistive sensor (5) is determined from its series connection with actively controlled resistor network (3) with selectable value of resistance and with a periodic waveform voltage source (7), and further a device for measuring resistance of the resistive sensor (5) including a periodic waveform voltage source (7), actively controlled resistor network (3), and a resistive sensor (5), wherein the terminals of the periodic waveform voltage source (7) are connected to the first node (2) and the third node (6), terminals of actively controlled resistor network (3) are connected to the first node (2) and the second node (4), and terminals of the resistive sensor are connected to the second node (4) and the third node (6), thus forming a connection in a resistive voltage divider with an automatic selection of one resistor of the divider, and usage of this method for measuring time-varying resistance of the sensor.

The present disclosure refers to a method of measuring resistance of the resistive sensor (5), where the value of resistance of the resistive sensor (5) is determined from its series connection with actively controlled resistor network (3) with selectable value of resistance and with a periodic waveform voltage source (7), and further a device for measuring resistance of the resistive sensor (5) including a periodic waveform voltage source (7), actively controlled resistor network (3), and a resistive sensor (5), wherein the terminals of the periodic waveform voltage source (7) are connected to the first node (2) and the third node (6), terminals of actively controlled resistor network (3) are connected to the first node (2) and the second node (4), and terminals of the resistive sensor are connected to the second node (4) and the third node (6), thus forming a connection in a resistive voltage divider with an automatic selection of one resistor of the divider, and usage of this method for measuring time-varying resistance of the sensor.

A fault protection arrangement. The fault protection arrangement may include a neutral grounding resistor including a first non-ground end, connected to a neutralizing point, and a second non-ground end. The fault protection arrangement may include a neutral grounding resistance monitor assembly, directly coupled to the second non-ground end of the neutral grounding resistor. The neutral grounding resistance monitor assembly may include comprising a signal source coupled to the neutralizing-point; a first current sense circuit coupled between the signal source and the neutralizing-point; a first voltage sense circuit coupled between the signal source and the neutralizing-point; a second current sense circuit, comprising a current sensor, coupled between the second non-ground end of the neutral grounding resistor and a protective earth connection.

A chip module includes a chip having a front side and a rear side, a chip carrier having an upper side facing the chip, a contact layer formed of an electrically conductive material and arranged on the upper side of the chip carrier between the rear side of the chip and the upper side of the chip carrier, and an electrically conductive adhesive arranged on an upper side of the contact layer facing the chip. The electrically conductive adhesive connects the upper side of the contact layer and the rear side of the chip. The contact layer has a plurality of regions electrically insulated from each other and each electrically connected to the chip by the electrically conductive adhesive.

A chip module includes a chip having a front side and a rear side, a chip carrier having an upper side facing the chip, a contact layer formed of an electrically conductive material and arranged on the upper side of the chip carrier between the rear side of the chip and the upper side of the chip carrier, and an electrically conductive adhesive arranged on an upper side of the contact layer facing the chip. The electrically conductive adhesive connects the upper side of the contact layer and the rear side of the chip. The contact layer has a plurality of regions electrically insulated from each other and each electrically connected to the chip by the electrically conductive adhesive.

It is described a leakage compensation circuit for a measurement device which comprises a measurement circuit with a leaking device that is connected to a measurement path and causes a leakage current. The leakage compensation circuit comprises: i) a replica device of the leaking device, wherein the replica device is connected to a replica path, and wherein the replica device is configured to cause a replica leakage current that is essentially equal to the leakage current of the leaking device, ii) a voltage regulator which is connected to the measurement path and to the replica path, wherein the voltage regulator is configured to regulate the voltage in the replica path based on the voltage of the measurement path, and iii) a current mirror which is connected to the measurement path and to the replica path, wherein the current mirror is configured to mirror the replica leakage current of the replica device into the measurement path.