G01R27/14

Method for determining the system resistance of a handheld medical device

A method for determining system resistance of at least one power supply of a handheld medical device, the method including: a) generating at least one excitation voltage signal, wherein the excitation voltage signal comprises at least one direct current (DC) voltage signal, wherein the excitation voltage signal has a fast transition DC flank of 20 ns or less; b) applying the excitation voltage signal to at least one reference resistor having a predetermined or pre-defined resistance value, wherein the reference resistor is arranged in series with the power supply; c) measuring a response signal of the power supply; d) determining a signal flank from the response signal and determining an ohmic signal portion from one or both of shape and height of the signal flank; and e) determining the system resistance of the power supply from the ohmic signal portion.

THROUGH SILICON VIA DETECTION CIRCUIT AND METHOD

A circuit for through silicon via (TSV) detection includes a TSV to be tested, an equivalent adjustable resistor and a reverse output circuit. A first terminal of the TSV to be tested is connected to a second terminal of the equivalent adjustable resistor, and a second terminal of the TSV to be tested is grounded. An input terminal of the reverse output circuit is connected to the first terminal of the TSV to be tested. The method includes: adjusting a resistance value of the equivalent adjustable resistor to a preset first resistance value, and keeping a voltage of a first terminal of the equivalent adjustable resistor at a preset voltage value, the first resistance value is a maximum resistance value of an equivalent resistor corresponding to the TSV to be tested when the TSV to be tested is normal.

THROUGH SILICON VIA DETECTION CIRCUIT AND METHOD

A circuit for through silicon via (TSV) detection includes a TSV to be tested, an equivalent adjustable resistor and a reverse output circuit. A first terminal of the TSV to be tested is connected to a second terminal of the equivalent adjustable resistor, and a second terminal of the TSV to be tested is grounded. An input terminal of the reverse output circuit is connected to the first terminal of the TSV to be tested. The method includes: adjusting a resistance value of the equivalent adjustable resistor to a preset first resistance value, and keeping a voltage of a first terminal of the equivalent adjustable resistor at a preset voltage value, the first resistance value is a maximum resistance value of an equivalent resistor corresponding to the TSV to be tested when the TSV to be tested is normal.

Determining a temperature coefficient value of a resistor

The present disclosure relates to circuitry for determining a temperature coefficient value of a resistor. The circuitry comprises circuitry for supplying an AC current signal to the resistor, circuitry for measuring a first voltage across the resistor when the AC current signal is supplied; and processing circuitry configured to determine the temperature coefficient value based on the first voltage.

Method for determining sheet resistance
11639952 · 2023-05-02 · ·

A method for determining a sheet resistance of a sample (1) by using point probes. The method includes: (a) positioning (101) five point probes (2a, 2b, 2c, 2d, 2e) on the sample (1) at selected positions which are distanced from an edge of the sample (1): (b) connecting (102) the five point probes (2a, 2b, 2c, 2d, 2e) in five configurations wherein each configuration comprises a different set of four point probes (abcd, bcde, cdea, deab, eabc) and measuring (103) a resistance (r.sub.1=r.sub.abcd, r.sub.2=r.sub.bcde, r.sub.3=r.sub.cdea, r.sub.4=r.sub.deab, r.sub.5=r.sub.eabc) between the four point probes for each configuration; (c) determining (104) the sheet resistance (ρ.sub.0).

Method for determining sheet resistance
11639952 · 2023-05-02 · ·

A method for determining a sheet resistance of a sample (1) by using point probes. The method includes: (a) positioning (101) five point probes (2a, 2b, 2c, 2d, 2e) on the sample (1) at selected positions which are distanced from an edge of the sample (1): (b) connecting (102) the five point probes (2a, 2b, 2c, 2d, 2e) in five configurations wherein each configuration comprises a different set of four point probes (abcd, bcde, cdea, deab, eabc) and measuring (103) a resistance (r.sub.1=r.sub.abcd, r.sub.2=r.sub.bcde, r.sub.3=r.sub.cdea, r.sub.4=r.sub.deab, r.sub.5=r.sub.eabc) between the four point probes for each configuration; (c) determining (104) the sheet resistance (ρ.sub.0).

CIRCUITRY FOR COMPENSATING FOR GAIN AND/OR PHASE MISMATCH BETWEEN VOLTAGE AND CURRENT MONITORING PATHS

Circuitry comprising: a voltage monitoring path; a current monitoring path; a reference element of a predefined impedance; and processing circuitry, wherein in operation of the circuitry in a calibration mode of operation: the voltage monitoring path is operative to output a signal indicative of a voltage across the reference element in response to a reference signal applied to the reference element; the current monitoring path is operative to output a signal indicative of a current through the reference element in response to the reference signal; and the processing circuitry is operative to: receive the signal indicative of the voltage across the reference element and the signal indicative of the current through the reference element; generate an estimate of an impedance of the reference element; and determine a compensation parameter for an element of the circuitry for compensating for a difference between the estimate of the impedance and the predefined impedance of the reference element.

Circuits and techniques for assessing aging effects in semiconductor circuits

In some examples, a method of operating a circuit may comprise performing a circuit function under normal conditions, performing the circuit function under aggravated conditions, predicting a potential future problem with the circuit function under the normal conditions based on an output of the circuit function under the aggravated conditions, and outputting a predictive alert based on predicting the potential future problem.

Circuits and techniques for assessing aging effects in semiconductor circuits

In some examples, a method of operating a circuit may comprise performing a circuit function under normal conditions, performing the circuit function under aggravated conditions, predicting a potential future problem with the circuit function under the normal conditions based on an output of the circuit function under the aggravated conditions, and outputting a predictive alert based on predicting the potential future problem.

Methods and systems for open-loop ignition of a smoke generator fuel source

In an aspect, data characterizing an instruction for an activation of an igniter and an operating mode of a smoke generator that includes the igniter can be received. A first amount of energy required for an ignition of a fuel source by the igniter can be determined based on the operating mode characterized by the received data. The igniter can be caused to activate based on the received data. A second amount of energy, output by the igniter over a period of time during which the igniter is activated, can be determined. A determination of whether the second amount of energy exceeds the first amount of energy can be made. The igniter can be caused to deactivate in response to a determination that the second amount of energy exceeds the first amount of energy. Related systems, apparatus, techniques, and articles are also described.