In a meter for performing a measurement of an electrical parameter, an output from a sensor is sampled to produce at least one sample, and an iterative method is performed comprising: producing further samples; holding in memory a stored array of samples comprising the at least one sample and each of the further samples from each iteration; determining a measure of statistical variability of a mean for the respective iteration from a measure of statistical variability and from the number of samples used to generate the measure of statistical variability; comparing the measure of statistical variability of the mean with a pre-determined threshold; and generating an electrical signal indicating a state of the measurement if the measure of statistical variability of the mean of the samples taken during the measurement is less than or equal to the pre-determined threshold.

A method and apparatus for calibrating an impedance measurement device are provided. The impedance measurement device outputs a first AC signal to a phase-locked current generator. The phase-locked current generator generates a second AC signal having a phase that is locked to a phase of the first AC signal and having an amplitude that is representative of a presented impedance having a known impedance value. The phase-locked current generator outputs the second AC signal to the impedance measurement device. The impedance measurement device performs an impedance measurement based on the second AC signal to produce a measured impedance value associated with the presented impedance. The impedance measurement device is calibrated based on the measured impedance value and the known impedance value of the presented impedance.

A sheet electrical resistance measuring device includes: a housing having a gap for receiving a sheet therein; a sheet pulling member that is disposed in the housing and pulls the sheet inserted into the gap; a stopper that is disposed in the housing and causes the sheet pulling member to stop pulling the sheet; and a pair of electrodes that is disposed in the housing and measures electrical resistance of the sheet which is stopped and brought into contact with the pair of electrodes.

A sheet electrical resistance measuring device includes: a housing having a gap for receiving a sheet therein; a sheet pulling member that is disposed in the housing and pulls the sheet inserted into the gap; a stopper that is disposed in the housing and causes the sheet pulling member to stop pulling the sheet; and a pair of electrodes that is disposed in the housing and measures electrical resistance of the sheet which is stopped and brought into contact with the pair of electrodes.

A sheet electric resistance measuring instrument includes first and second housings that are paired with each other and that sandwich a sheet from both sides of the sheet, a pair of electrodes that are provided on the first housing and that measure an electric resistance of the sheet sandwiched between the pair of electrodes and the second housing, and a contact member that is disposed between the pair of electrodes on the first housing and that is brought into contact with the sheet.

A sheet electric resistance measuring instrument includes first and second housings that are paired with each other and that sandwich a sheet from both sides of the sheet, a pair of electrodes that are provided on the first housing and that measure an electric resistance of the sheet sandwiched between the pair of electrodes and the second housing, and a contact member that is disposed between the pair of electrodes on the first housing and that is brought into contact with the sheet.

A method for the correction of synchronization errors Δt in the measurement of the impedance of an electrical or electrochemical component, more particularly a lithium ion cell is provided. In general, synchronization errors in an impedance measurement can arise between the excitation and response signals, which can misrepresent the phase of the impedance value obtained. According to the method, the synchronization error can be determined by measuring the impedance at two different frequencies and solving an optimization problem in respect of the deviation of the phases from an equivalent circuit diagram, which comprises at least one resistance and an inductance. The phase of the impedance value obtained can be corrected in this way.

A resistance measuring device includes: a first jig; a plurality of first contacts; a second jig; a plurality of second contacts; a resistance measuring unit that supplies a current between a first contact and a second contact, which correspond to each other, detects a voltage between a first contact and a second contact, and calculates a resistance value of an object to be measured based on a relationship between a value of the supplied current and a value of the detected voltage; first wirings connecting the resistance measuring unit and each of the first contacts, for the first contacts, respectively; and second wirings connecting the resistance measuring unit and each of the second contacts while passing from the resistance measuring unit through the first jig, for the second contacts, respectively.

A resistance measuring device includes: a first jig; a plurality of first contacts; a second jig; a plurality of second contacts; a resistance measuring unit that supplies a current between a first contact and a second contact, which correspond to each other, detects a voltage between a first contact and a second contact, and calculates a resistance value of an object to be measured based on a relationship between a value of the supplied current and a value of the detected voltage; first wirings connecting the resistance measuring unit and each of the first contacts, for the first contacts, respectively; and second wirings connecting the resistance measuring unit and each of the second contacts while passing from the resistance measuring unit through the first jig, for the second contacts, respectively.

A processing system includes sensor circuitry and processing circuitry. The sensor circuitry is configured to, using the sensor electrodes, obtain capacitive measurements of a sensing region, and obtain a resistance measurement of the sensing region. The processing circuitry is coupled to the sensor circuitry. The processing circuitry is configured to determine a location of an input object using the capacitive measurements of the sensing region and determine a force value based on the resistance measurement and the location of the input object. Determining the force value mitigates a temperature variation of the sensing region affecting the resistance measurement. The processing circuitry is further configured to report the force value.