A testing device that includes a resistance measuring device electrically communicating across connection points which electrically includes an electrical connector. The testing device also includes a threshold monitor analyzing the resistance being measurable using the resistance meter to determine when the resistance exceeds a threshold for contact resistance. Finally, the testing device also includes a warning indicator. The warning indicator triggered in response to the resistance exceeding the threshold indicates to replace the connector.

Wafers, chips, or dies that contain fill cells with structures configured to obtain in-line data via non-contact electrical measurements (NCEM). Such NCEM-enabled fill cells may target/expose a variety of open-circuit, short-circuit, leakage, or excessive resistance failure modes, including GATE-snake-open and/or GATE-snake-resistance failure modes. Such wafers, chips, or dies may include Designs of Experiments (DOEs), comprised of multiple NCEM-enabled fill cells, in at least two variants, all targeted to the same failure mode.

A portable diagnostic apparatus for performing diagnostic testing on a circuit breaker includes a number of sensor devices structured to generate a number of sensed parameter signals relating to operation of the circuit breaker during an operational sequence, a number of auxiliary input connectors structured to receive a number of auxiliary data signals from the circuit breaker, the number of auxiliary data signals relating to and being generated in response to the operation of the circuit breaker during the operational sequence, and control and diagnostic circuitry. The control and diagnostic circuitry is structured to control operation of the portable diagnostic apparatus, receive the number of sensed parameter signals and the number of auxiliary data signals, and generate a time signature based on the number of sensed parameter signals and the number of auxiliary data signals.

A grounding resistance surveillance system comprises a plurality of measurement devices configured for measuring a grounding resistance value and being arrangeable at different locations within a target area, and at least one gateway device. Each of the plurality of gateway devices is communicatively coupled to at least one further measurement device of the plurality of measurement devices, and at least one measurement device of the plurality of measurement devices is in direct communication to the at least one gateway device and at least one measurement device of the plurality of measurement devices is only in indirect communication to the at least one gateway device such that a mesh network of coupled measurement devices is formed. The grounding resistance surveillance system is configured to execute a method for determining a grounding resistance in the target area.

Further, a measurement device for a grounding resistance surveillance system is described.

A grounding resistance surveillance system comprises a plurality of measurement devices configured for measuring a grounding resistance value and being arrangeable at different locations within a target area, and at least one gateway device. Each of the plurality of gateway devices is communicatively coupled to at least one further measurement device of the plurality of measurement devices, and at least one measurement device of the plurality of measurement devices is in direct communication to the at least one gateway device and at least one measurement device of the plurality of measurement devices is only in indirect communication to the at least one gateway device such that a mesh network of coupled measurement devices is formed. The grounding resistance surveillance system is configured to execute a method for determining a grounding resistance in the target area.

Further, a measurement device for a grounding resistance surveillance system is described.

A switch is provided. The switch includes, but not limited to: normally open (NO) terminals; normally closed (NC) terminals; an actuator, configured to conduct at least one of the NO terminals and the NC terminals; an indicator for a remaining service life of the switch; and a controller component, configured to: determine the remaining service life of the switch based on a conduct resistance between at least one of the NO terminals and the NC terminals, and control the indicator to illuminate a corresponding color based on the determined remaining service life of the switch.

A semiconductor device includes a first die, a second die coupled to the first die through a Through-Silicon-Via (TSV), and a test circuit suitable for measuring a resistance of the TSV by controlling an amount of current flowing through the TSV.

A method measures a resistance of an element that is operably coupled to receive an AC line voltage. The method includes obtaining a first voltage measurement value V1A from a first side of the element at a first time, and obtaining a second voltage measurement value V2A from a second side of the element at the first time. The method also includes obtaining a first current measurement value IA through the element at the first time, and obtaining a second current measurement value IB through the element at the second time. The method further includes obtaining a third voltage measurement value V1B from the first side of the element at a second time, and obtaining a fourth voltage measurement value V2B from the second side of the element at the second time. The processing device determines the resistance at least in part based on the values V1A, V2A, V1B, V2B, IA and IB. The determination based on an adjusted difference of V2B and V2A.

This disclosure describes techniques for measuring the resistance of a component with measurement circuitry that is electrically coupled to the component via one or more electrical conductors (e.g., one or more bond wires). The resistance measurement techniques of this disclosure may measure a resistance of an electrical conductor, and generate a value indicative of a resistance of a component other than the electrical conductor based on the measured resistance of the electrical conductor. The electrical conductor for which the resistance is measured may be the same as or different than one or more of the electrical conductors that the couple the measurement circuitry to the component to be measured. Using an electrical conductor resistance measurement to determine the resistance of a component may improve the accuracy of the resistance measurement for the component.

This disclosure describes techniques for measuring the resistance of a component with measurement circuitry that is electrically coupled to the component via one or more electrical conductors (e.g., one or more bond wires). The resistance measurement techniques of this disclosure may measure a resistance of an electrical conductor, and generate a value indicative of a resistance of a component other than the electrical conductor based on the measured resistance of the electrical conductor. The electrical conductor for which the resistance is measured may be the same as or different than one or more of the electrical conductors that the couple the measurement circuitry to the component to be measured. Using an electrical conductor resistance measurement to determine the resistance of a component may improve the accuracy of the resistance measurement for the component.