A new load-pull tuner system using two-probe waveguide slide screw tuners of which the probes share the same waveguide section; they are inserted diametrically at fixed depth facing each other into slots on opposite broad walls of the waveguide. An adjustable broadband attenuator made using a resistive septum is inserted between the test port and the tuning probes. The tuner does not have cumbersome adjustable vertical axes controlling the penetration of the probes and its low profile is optimized for on-wafer operations. The carriages holding the probes are moved along the waveguide using electric stepper motors or linear actuators.

An integrated manual pre-matching module for on-wafer load pull tuner operation uses a mobile rack and a rotating reflective probe, mounted and sliding on the tuner slabline extension. Both the tuning probe position and immersion into the slabline are controlled using sidewise mounted easily accessible knobs. The low profile of the module does not conflict with the microscope and allows integrating on the extended slabline of the tuner in immediate proximity of the wafer probe, thus minimizing any additional insertion loss and maximizing tuning range. Manual handling of the pre-matching tuning module is easy and efficient without disturbing the on-wafer load pull operations.

An integrated manual pre-matching module for on-wafer load pull tuner operation uses a mobile rack and a rotating reflective probe, mounted and sliding on the tuner slabline extension. Both the tuning probe position and immersion into the slabline are controlled using sidewise mounted easily accessible knobs. The low profile of the module does not conflict with the microscope and allows integrating on the extended slabline of the tuner in immediate proximity of the wafer probe, thus minimizing any additional insertion loss and maximizing tuning range. Manual handling of the pre-matching tuning module is easy and efficient without disturbing the on-wafer load pull operations.

An automated resonant waveguide cavity system for determining one or complex permittivity measurements of a sample is provided. The automated resonant waveguide cavity system includes a resonant cavity, a waveguide coupled to the resonant cavity, a programmable network analyzer (PNA) coupled to the waveguide, and a computing device. The computing device includes a memory storing processor executable code for a determination engine and a processor executing the processor executable code to cause the determination engine to obtain data from the PNA. The data is respective to the sample within the resonant cavity. The determination engine further integrates a plurality of analytical and modeling functions in determining the complex permittivity values of the sample from the data.

Embodiments described herein relate to a method for modifying transmission line characteristics. The method may include: making a first determination of a null frequency of an input signal to a transmission line; performing an analysis to make a second determination of a wavelength of the input signal using, at least in part, the null frequency; making a third determination, based on the analysis, of a half wavelength of the input signal; calculating, based on the half wavelength, a total stub length; and adding a trace to a stub associated with a via, wherein the stub and the trace are a length that is at least a portion of the half wavelength of the input signal.

Various examples of methods and systems are disclosed for correction of phase and amplitude errors that occur in transmission lines connecting transmitter/receiver devices to measurement fixtures. In one example, a method is described that includes using time domain processing to determine a phase shift from the measurement fixture that can occur between calibration measurements and measurements of the specimen under test. In another example, a method is described that includes frequency-domain processing of the signals to obtain both phase and amplitude corrections. Including these phase and amplitude corrections in the calibration procedure can reduce or minimize the errors induced in the measurements when the transmission line(s) experience either temperature changes or physical deflections, among other things.

Various examples of methods and systems are disclosed for correction of phase and amplitude errors that occur in transmission lines connecting transmitter/receiver devices to measurement fixtures. In one example, a method is described that includes using time domain processing to determine a phase shift from the measurement fixture that can occur between calibration measurements and measurements of the specimen under test. In another example, a method is described that includes frequency-domain processing of the signals to obtain both phase and amplitude corrections. Including these phase and amplitude corrections in the calibration procedure can reduce or minimize the errors induced in the measurements when the transmission line(s) experience either temperature changes or physical deflections, among other things.

A process includes reading a measurement result of a sum of a conductor loss and a dielectric loss for a signal at a predetermined frequency in each of first wiring-boards, respective wiring-widths and insulating-layer-thicknesses of the first wiring-boards being different, and an analysis result by three-dimensional electromagnetic field analysis of conductivity dependence of the conductor loss and the dielectric loss in each of second wiring-boards including same wiring-widths and insulating-layer-thicknesses as the wiring-widths and the insulating-layer-thicknesses of the first wiring-boards, obtaining a first ratio of conductor losses and a second ratio of dielectric losses between two second wiring-boards among the second wiring-boards, based on the analysis result, and obtaining a value of the conductor loss and a value of the dielectric loss for each of two first wiring-boards corresponding to the two second wiring-boards among the first wiring-boards, based on the first ratio, the second ratio, and the measurement result.

Methods for determining variability in a state of a medium, include monitoring the medium and determining the variability in the state of the medium based on the processing of the response over time based on the response detected at the at least one receive element over time. Monitoring the medium can include generating a transmit signal, transmitting it into the medium using a transmit element, and receiving a signal from the medium at a receive element. The transmit and receive elements can be decoupled from one another. The transmit and receive elements can have differing geometry. The determined variability in the state of the medium can be used to provide notifications and/or take automated actions.

A method of setting an analyzer, the method comprising: providing an analyzer with a first signal source and a second signal source; connecting the signal sources with a device under test; generating a first signal, transmitting the first signal to the device under test, measuring the first transmitted signal and a first signal reflected from the device under test, thereby obtaining first compensation parameters; generating a second signal, transmitting the second signal to the device under test, measuring the second transmitted signal and a second signal reflected from the device under test, thereby obtaining second compensation parameters; using the first and second compensation parameters to compensate the signal sources; and transmitting the first and second signals simultaneously.