A vector network analyzer is provided which includes a first measuring port, a digital interface connected to the first measuring port, a second measuring port adapted to be connected to a radio frequency (RF) input or output of a device under test (DUT), and a processor. The digital interface is adapted to be connected to a digital input or output of the DUT. The processor is adapted to determine scattering parameters (S-parameters) of the DUT based on measuring signals transmitted to the DUT and received from the DUT by the first measuring port and the second measuring port.

A vector network analyzer is provided which includes a first measuring port, a digital interface connected to the first measuring port, a second measuring port adapted to be connected to a radio frequency (RF) input or output of a device under test (DUT), and a processor. The digital interface is adapted to be connected to a digital input or output of the DUT. The processor is adapted to determine scattering parameters (S-parameters) of the DUT based on measuring signals transmitted to the DUT and received from the DUT by the first measuring port and the second measuring port.

Various aspects of the disclosure relate to evaluating the electromagnetic impedance characteristics of a material under test (MUT) over a range of frequencies. In particular aspects, a system includes: an electrically non-conducting container sized to hold the MUT, the electrically non-conducting container having a first opening at a first end thereof and a second opening at a second, opposite end thereof; a transmitting electrode assembly at the first end of the electrically non-conducting container, the transmitting electrode assembly having a transmitting electrode with a transmitting surface; and a receiving electrode assembly at the second end of the electrically non-conducting container, the receiving electrode assembly having a receiving electrode with a receiving surface, wherein the receiving electrode is approximately parallel with the transmitting electrode, and wherein the transmitting surface of the transmitting electrode is larger than the receiving surface of the receiving electrode.

An active split-signal Fo and 2Fo harmonic impedance load pull tuner uses a single signal source, a wideband harmonic amplitude and phase modulator-frequency doubler. The Fo source signal path is divided between input and output of the DUT; the output portion is processed to generate independently controlled synchronous amplitude and phase controlled Fo and 2Fo signals, which are then amplified and re-injected into the output of the DUT after being pre-matched using a passive harmonic tuner. A harmonic receiver is used to synthesize in situ the required Fo and 2Fo load impedances. Passive 3Fo tuning is also possible independently.

The present disclosure relates to a system for detecting and analyzing droplets of feedstock material being ejected from an additive manufacturing device. The system makes use of a split ring resonator (SRR) probe including a ring element having a gap, with the gap being positioned adjacent a path of travel of the droplets of feedstock material. An excitation signal source is used for supplying an excitation signal to the SRR probe. An analyzer analyzes signals generated by the SRR probe in response to perturbations in an electric field generated by the SRR probe as the droplets of feedstock material pass the ring element. The signals are indicative of dimensions of the droplets of feedstock material.

The present invention relates to a method and a measuring apparatus for testing a device under test. A measuring apparatus applies a first test signal to the device under test and measures at least one frequency response parameter of the device under test for a first plurality of frequency values lying in a first frequency range. The measuring apparatus applies a second test signal to the device under test and measures the at least one frequency response parameter of the device under test for a second plurality of frequency values lying in a second frequency range. The first frequency range at least partially overlaps with the second frequency range and the first plurality of frequency values at least partially differs from the second plurality of frequency values.

The present invention relates to a method and a measuring apparatus for testing a device under test. A measuring apparatus applies a first test signal to the device under test and measures at least one frequency response parameter of the device under test for a first plurality of frequency values lying in a first frequency range. The measuring apparatus applies a second test signal to the device under test and measures the at least one frequency response parameter of the device under test for a second plurality of frequency values lying in a second frequency range. The first frequency range at least partially overlaps with the second frequency range and the first plurality of frequency values at least partially differs from the second plurality of frequency values.

A method of calibrating a setup comprises: performing at least one calibration of the setup, thereby obtaining calibration data; setting a quantity representing forward tracking to be equal with a quantity representing reverse tracking; solving a system of equations having at least an unknown quantity representing the forward tracking or the reverse tracking, thereby obtaining at least one equation having the unknown quantity squared; creating based on the calibration data obtained two phase over frequency relationships for the respective quantity; determining two lines having a linear change in phase over frequency for the phase over frequency relationships created; extrapolating the lines determined to a frequency of 0 Hz; and determining the respective quantity by selecting one line of the lines extrapolated that is closer to a phase of zero, 2π or a multiple thereof at the frequency of 0 Hz.

A vector network analyzer comprises a first measuring port, a first digital interface, connected to the first measuring port, adapted to be connected to a digital input or output of a device under test, and a second measuring port, adapted to be connected to a radio frequency input or output of the device under test. It also comprises a processor, adapted to determine S-parameters of the device under test based upon measuring signals transmitted to the device under test and receive from the device under test by the first measuring port and the second measuring port.

A vector network analyzer comprises a first measuring port, a first digital interface, connected to the first measuring port, adapted to be connected to a digital input or output of a device under test, and a second measuring port, adapted to be connected to a radio frequency input or output of the device under test. It also comprises a processor, adapted to determine S-parameters of the device under test based upon measuring signals transmitted to the device under test and receive from the device under test by the first measuring port and the second measuring port.