G01R29/023

PULSE-WIDTH MODULATION SIGNAL OBSERVATION CIRCUIT AND HARDWARE-IN-THE-LOOP SIMULATION DEVICE HAVING THE SAME

A hardware-in-the-loop (HIL) simulation device is provided, which includes a processing circuit and a pulse-width modulation (PWM) signal observation circuit. The PWM signal observation circuit includes an energy storage unit and the energy storage unit is coupled to the processing circuit. A signal source transmits a PWM signal to the processing circuit and the PWM signal observation circuit, and the energy storage unit is charged when the PWM signal is at high level. The processing circuit detects the voltage of the energy storage unit when detecting the falling edge of the PWM signal so as to calculate the duty cycle of the PWM signal.

Radiation measurement device

First and second pulse height detection circuits output pulse height detection signals which rise when a detection pulse obtained from a radiation detector becomes greater than a lower threshold Lsh or an upper threshold Hsh, and fall when the detection pulse is smaller than the lower threshold Lsh or the upper threshold Hsh. Next, first and second rising and falling detection circuits detect rising and falling edges of the pulse height detection signals from the first and second pulse height detection circuits in synchronization with a clock pulse from a crystal oscillator, and a combining circuit outputs a signal corresponding to the detection pulse that is within a range between the lower threshold Lsh and the upper threshold Hsh by combining both outputs from the first and second rising and falling detection circuits, in synchronization with the clock pulse.

TESTING CIRCUIT, TESTING DEVICE AND TESTING METHOD THEREOF
20220068416 · 2022-03-03 · ·

A testing circuit includes: a first sampling module configured to receive a to-be-tested pulse signal, and generate a first sampled signal according to the pulse signal; and a second sampling module configured to receive the pulse signal, and generate a second sampled signal according to the pulse signal. The second sampled signal and the first sampled signal have a phase difference, the phase difference being equal to a pulse width of the pulse signal.

RADIATION MEASUREMENT DEVICE

First and second pulse height detection circuits output pulse height detection signals which rise when a detection pulse obtained from a radiation detector becomes greater than a lower threshold Lsh or an upper threshold Hsh, and fall when the detection pulse is smaller than the lower threshold Lsh or the upper threshold Hsh. Next, first and second rising and falling detection circuits detect rising and falling edges of the pulse height detection signals from the first and second pulse height detection circuits in synchronization with a clock pulse from a crystal oscillator, and a combining circuit outputs a signal corresponding to the detection pulse that is within a range between the lower threshold Lsh and the upper threshold Hsh by combining both outputs from the first and second rising and falling detection circuits, in synchronization with the clock pulse.

Systems and Methods for Duty Cycle Measurement

Systems, methods, and circuits for determining a duty cycle of a periodic input signal are provided. A delay element is configured to delay the periodic input signal based on a digital control word. A digital circuit is configured to generate a first digital control word used to delay the periodic input signal a first amount of time corresponding to a period of the periodic input signal, generate a second digital control word used to delay the periodic input signal a second amount of time corresponding to a portion of the periodic input signal having a logic-level high value, and generate a third digital control word used to delay the periodic input signal a third amount of time corresponding to a portion of the periodic input signal having a logic-level low value. A controller is configured to determine the duty cycle based on the first, second, and third digital control words.

Detection of pulse width tampering of signals

A sensor system includes a sensor having a charge storage device controllably connected to a voltage source under control of a signal under test; and a readout circuit coupled to the charge storage device to determine whether the pulse width of the signal under test has changed greater than a threshold amount according to a voltage at the charge storage device. In some cases, the determination of whether the pulse width of the signal under test has changed includes determining whether the voltage satisfies a condition with respect to a comparison voltage. In some cases, the determination of whether the pulse width of the signal under test has changed is based on a propagation delay through a delay chain, where the propagation delay is dependent on the voltage.

APPARATUS AND METHOD OF MONITORING CHIP PROCESS VARIATION AND PERFORMING DYNAMIC ADJUSTMENT FOR MULTI-CHIP SYSTEM BY PULSE WIDTH
20210141016 · 2021-05-13 ·

A multi-chip system includes a plurality of chips and a monitoring and calibration system. The plurality of chips include at least a first chip and a second chip, wherein an output port of the first chip is connected to an input port of the second chip via a chip-to-chip connection, the first chip transmits an output signal to the second chip via the chip-to-chip connection, and the second chip processes an input signal that is derived from the output signal transmitted via the chip-to-chip connection. The monitoring and calibration system calibrates a chip setting of at least one of the first chip and the second chip for pulse width calibration of the input signal.

Circuit and method for width measurement of digital pulse signals

Disclosed are circuit and method for width measurement of digital pulse signals. The circuit comprises: a sample clock, used to drive all registers in the circuit; an edge detection and interrupt control unit, used to detect a rising edge and a falling edge of a pulse signal on an input pin Input to control signal collection; an integer encoding unit comprising a counter and registers and used to measure an integer part of the width of a high or low level on the input pin Input with one period 1/f of the sample clock as a reference unit; a signal capture chain, used to sample an output level of each delay cell DLL; a decimal encoding unit, used to find out and record the propagation position of the pulse edge on the signal capture chain; and a calibration control unit, used to perform calibration.

Tamper Monitoring Circuitry
20210216096 · 2021-07-15 ·

Various implementations described herein are directed to a device having alarm circuitry that receives a clock signal and provides alarm chain signals based on the clock signal. The device may include delay chain circuitry that receives the alarm chain signals from the alarm circuitry and provides delay chain signals. The device may include output circuitry that receives the delay chain signals from the delay chain circuitry and provides an alarm control signal based on the delay chain signals.

Input voltage ripple compensation of interleaved boost converter using cycle times

A method and apparatus are described for compensating input voltage ripples of an interleaved boost converter using cycle times. In an embodiment, a phase compensator receives a first duty cycle measurement of a first converter and a second duty cycle measurement of a second converter, compares the first duty cycle to the second duty cycle and generates a phase compensation in response thereto. A phase combiner combines a phase adjustment output and the phase compensation and produces a phase control output, and a cycle controller is coupled to the first and the second converters to generate a first drive signal to control switching of the first converter and to generate a second drive signal to control switching of the second converter, wherein a time of the second drive signal is adjusted using the phase control output.