In accordance with an embodiment, a system includes an oscillator equipped circuit having an oscillator control circuit configured to be coupled to an external oscillator and a processing unit comprising a clock controller. The clock controller includes an interface circuit configured to exchange handshake signals with the oscillator control circuit, a security circuit configured to receive the external oscillator clock signal and configured to select the external oscillator clock signal as the system clock, and a detection block configured to detect a failure in the external oscillator clock signal. Upon detection of the failure, a different clock signal is selected as the system clock and the interface circuit to interrupts a propagation of the external oscillator.

Various embodiments disclosed herein provide for a glitch detection and level detection method that use information contained in the signal itself to determine at which resolution or granularity the glitch detection and level detection operates. In particular, the glitch detection method comprises defining a glitch in terms of a change in the area under the waveform which can serve to disambiguate glitches from noises and other transient side effects of level transmissions. Likewise, the level detection method uses an entropy-based metric to identify levels that are significant in context of the entire signal and not in absolute terms.

An audio plug detection structure is disclosed, which is adapted for an audio jack corresponding to an audio plug and includes a first and second connection points, a time-varying signal generation circuit, and a comparison circuit. The time-varying signal generation and comparison circuits are connected to the first connection point. When the audio plug is inserted into the audio jack, the first connection point is connected to a first pole of the audio plug and the second connection point is connected to a second pole different from the first pole of the audio plug. Therefore, the time-varying signal generation circuit, the first connection point, an inner impedance circuit of the audio plug and the second connection plug form a loop. The comparison circuit outputs a determination signal indicating the audio plug is inserted by detecting a change of a time-varying signal generated by the time-varying signal generation circuit.

The invention relates to a detection apparatus (12) for detecting photons. The detection apparatus comprises a pile-up determining unit (15) for determining whether detection signal pulses being indicative of detected photons are caused by a pile-up event or by a non-pile-up event, wherein a detection values generating unit (16) generates detection values depending on the detection signal pulses and depending on the determination whether the respective detection signal pulse is caused by a pile-up event or by a non-pile-up event. In particular, the detection values generating unit can be adapted to reject the detection signal pulses caused by pile-up events while generating the detection values. This allows for an improved quality of the generated detection values.

A device for the detection of an ultra wide band signal, including a signal reception circuit, a signal divider circuit to divide the received signal into several frequency sub-bands, a circuit to determine the amplitude and duration of the received signal in each frequency sub-band, a circuit to compare the amplitude of the signal received in each frequency sub-band with an amplitude threshold, a circuit to compare the duration of the signal received in each frequency sub-band with a time threshold, and a decision circuit that determines that the received signal is of the ultra wide band type if the amplitude of the signal received in each frequency sub-band is higher than the amplitude threshold and if the duration of the signal received in each frequency sub-band is less than the time threshold.

The invention provides a semiconductor device capable of diagnosing communication network quality. Disclosed is a semiconductor device that is coupled to a light source, the semiconductor device including a signal processing unit that is coupled to an interface module and transmits and receives a command signal to increase or decrease illumination intensity of the light source and a deterioration detector that detects deterioration of the interface module, based on whether or not change timing of a signal representing data of a command signal received by the interface module falls within a predetermined interval.

A circuit diagnosing apparatus according to an embodiment of the present disclosure diagnoses a circuit state of a battery pack including a battery cell and a main relay connected in series, and includes: a control unit configured to output a first signal having a preset duty cycle through a first line connected to the main relay according to a predetermined output frequency; and a DC-DC converter further connected to the first line to receive the first signal through the first line and configured to receive a second signal output from the battery cell whenever an operation state of the main relay is shifted to a turn-on state by the first signal, convert the first signal and the second signal, and transmit a first conversion signal and a second conversion signal obtained by the conversion to the control unit.

An apparatus for analyzing currents in an electric load is provided with a current measuring circuit, which can be connected in series with the parallel circuit of the load branches, and a detector for detecting a change in the current when the switching element in a load branch is switched on or off. The apparatus also has an analysis unit which is connected to the control unit and to the detector and analyzes the temporal correlation of a control signal for switching a switching element in a load branch on or off with the detection of the change in the current and/or analyzes the change in the current at a plurality of times of switching a relevant switching element in a load branch or the switching elements in a plurality of load branches.

An apparatus for analyzing currents in an electric load is provided with a current measuring circuit, which can be connected in series with the parallel circuit of the load branches, and a detector for detecting a change in the current when the switching element in a load branch is switched on or off. The apparatus also has an analysis unit which is connected to the control unit and to the detector and analyzes the temporal correlation of a control signal for switching a switching element in a load branch on or off with the detection of the change in the current and/or analyzes the change in the current at a plurality of times of switching a relevant switching element in a load branch or the switching elements in a plurality of load branches.

A compensation circuit includes a resistor-capacitor circuit and a control circuit. The resistor-capacitor circuit is used to generate a first voltage when a reference signal is in a first state, and generate a second voltage and a third voltage when the reference signal is in a second state. The resistor-capacitor circuit includes a first resistor-capacitor sub-circuit and a second resistor-capacitor sub-circuit. The first resistor-capacitor sub-circuit and the second resistor-capacitor sub-circuit are coupled to the control circuit, and operate simultaneously to compute an ON time of a front end module. The control circuit is coupled to the resistor-capacitor circuit, and is used to acquire the ON time according to the first voltage, the second voltage, and the third voltage, and includes an adjustment circuit used to generate a bias signal according to the ON time, and output the bias signal to the front end module.