A testing device includes a testing socket and a reflector. The testing socket defines an accommodating space. The reflector is disposed in the accommodating space and has a plurality of reflection surfaces non-parallel with each other. The reflection surfaces define a transmission space.

An embodiment integrated circuit includes a first electromagnetic pulse detection device that comprises a first loop antenna formed in an interconnection structure of the integrated circuit, a first end of the first antenna being connected to a first node of application of a power supply potential and a second end of the antenna being coupled to a second node of application of the power supply potential, and a first circuit connected to the second end of the first antenna and configured to output a first signal representative of a comparison of a first current in the first antenna with a first threshold.

Two approaches for on-chip ESD detection include variable dielectric width capacitor, and vertical metal-oxide-semiconductor (MOS) capacitor MOSCAP array. The variable dielectric width capacitor approach employs metal plates terminated with sharp corners to enhance local electric field and facilitate ready breakdown of a thin dielectric between the metal plates. The vertical MOSCAP array is composed of a capacitor array connected in series. Both approaches are incorporated in an example 22 nm fully depleted silicon-on-insulator. Vertical MOSCAP arrays detect ESD events starting from about 6 V with about 6 V granularity, while the variable dielectric width capacitor is suitable for detection of high ESD voltage from about 40 V and above.

An EMC test system (1) and an EMC test method performed in the EMC test system (1) for testing a DUT (6), wherein the EMC test system (1) comprises an EMC test chamber (2), wherein the DUT (6) is positioned in the EMC test chamber (2), at least one measurement equipment (4) positioned in the EMC test chamber (2) and communication means (3) using LiFi for transmitting and receiving measurement data and/or control data by the measurement equipment (4).

A near-field testing method proposed in the present invention includes steps of: in a selected coordinate system, controlling a motion device to cause random relative movement of the DUT and the probe to generate multiple random test points, determining one or more postures of the probe, and obtaining the electromagnetic field coefficients corresponding the postures of the probe respectively; obtaining the measured values of the electromagnetic field signals collected by the probes, and obtaining a set of measured values; according to the set of measured values and the electromagnetic field coefficients according to the Lorenz reciprocity theorem in electromagnetism, and determining the electromagnetic field coefficients through convex optimization; obtaining, according to the electromagnetic field coefficients, the far field pattern of the DUT or the electric field and/or magnetic field at any point outside the DUT.

An over-the-air (OTA) measurement system is described. The OTA measurement system includes a plurality of measurement antennas, a DUT positioner, and a controller (e.g., control circuit). The DUT positioner is configured to position a device under test at a test location. At least two measurement antennas of the plurality of measurement antennas are arranged at different distances from the test location. The at least two measurement antennas are arranged at different elevation angles and/or at different azimuth angles with respect to the test location. The controller is configured to control the DUT positioner to rotate the device under test at the test location in azimuth and/or elevation. The controller is configured to control the DUT positioner to rotate the device under test into a first orientation for a first OTA power measurement by a first one of the at least two measurement antennas. The controller is configured to control the DUT positioner to rotate the device under test into a second orientation for a second OTA power measurement by a second one of the at least two measurement antennas. A relative orientation between the device under test in the first orientation and the first one of the at least two measurement antennas is the same as a relative orientation between the device under test in the second orientation and the second one of the at least two measurement antennas. Further, an OTA measurement method for performing OTA measurements on a device under test by an OTA measurement system is described.

A non-transitory computer-readable storage medium storing a n EMI calculation program that causes at least one computer to execute a process, the process includes inputting circuit information of a first circuit to a machine learning model; acquiring an EMI value at a certain frequency of the first circuit; selecting, based on an impedance characteristic of the first circuit and the EMI value at the certain frequency, first EMI information from a plurality of pieces of EMI information in each of which an impedance characteristic of each of a plurality of circuits is associated with EMI values at a plurality of frequencies of each of the plurality of circuits; and acquiring an EMI value at another frequency different from the certain frequency of the first circuit based on the EMI value at the certain frequency and the first EMI information.

Disclosed are exemplary embodiments of electrostatic discharge (ESD) pulse generators that may provide improved system level ESD robustness characterization and qualification analysis.

Provided is an immunity evaluation system that enables design feedback in consideration of a subject wiring and an improvement amount for improving an electromagnetic noise resistance of a circuit board. An immunity evaluation device includes: a storage unit configured to store characteristic data including probe-circuit board wiring coupling characteristics which are determined by a combination of a near-field probe and circuit board characteristics, and a test result; and an IC reaching signal level estimation unit configured to estimate a signal level reaching a terminal of an evaluation target IC. The immunity evaluation device receives board design information, information of the near-field probe, and test waveform instruction information of a signal applied to the near-field probe. The IC reaching signal level estimation unit reads the coupling characteristics from the storage unit based on the board design information of a test subject circuit board and the information of the near-field probe, and outputs a value of the IC reaching signal level reaching a terminal of the evaluation target IC from the board design information of the test subject circuit board, the information of the near-field probe, and the coupling characteristics.

A testing apparatus for electromagnetically sensitive equipment includes a housing defining a testing chamber. The housing blocks transmission of electromagnetic waves from an external environment into the testing chamber and reduces reflection of electromagnetic waves within the testing chamber. The testing apparatus also includes a tube defining an air flow path between the testing chamber and the external environment. The tube blocks transmission of electromagnetic waves from the external environment into the air flow path. The tube includes a proximal end coupled to an opening in the housing such that the air flow path is fluidly coupled to the testing chamber via the opening, a distal end opposing the proximal end, and a bent segment extending between the proximal end and the distal end.