G01R31/1218

Explosive spark estimation system and explosive spark estimation method

According to one implementation, an explosive spark estimation system includes an explosive spark estimation system includes a measuring system and a processing system. The measuring system is adapted to measure intensity of light, included in a spark occurred from an object to be tested. The light is within at least one specific wavelength band. The processing system is adapted to determine whether the spark is explosiveness based on the intensity of the light. Further, according to one implementation, an explosive spark estimation method includes: measuring intensity of light, included in a spark occurred from an object to be tested, within at least one specific wavelength band; and determining whether the spark is explosive, based on the intensity of the light.

Detecting failure locations in power cables

This application relates to methods and apparatus for determining the location of a fault in a power cable of a power distribution network. The method involves monitoring at least one electrical parameter of the power distribution network to detect the occurrence of a fault and determine at least one time window for the occurrence of the fault The method involves analysing a first set of measurement signals is obtained by a distributed fibre optic sensor having a sensing optical fibre deployed along the path of the power cable. The first set of measurement signals include signals indicative of the extent of any disturbances along the sensing fibre over a known time period. The measurement shallots are analysed based on the at least one time window for measurement signals and the location of the fault in the power cable is identified based on the location of one or more longitudinal sensing portions of the sensing fibre.

INSULATING SUBSTRATE INSPECTING METHOD AND INSPECTING APPARATUS

An insulating substrate inspecting method includes bringing a lower electrode into contact with lower metal of an insulating substrate including an insulating layer, the lower metal in contact with a lower surface of the insulating layer, and upper metal in contact with an upper surface of the insulating layer, and bringing an upper electrode into contact with the upper metal, and applying an AC voltage to the lower electrode and the upper electrode to detect electromagnetic waves generated at a defect in the insulating layer.

Optical Insulation-Monitoring Device and Method for Using and Producing Same
20190339322 · 2019-11-07 ·

The invention relates to an optical insulation monitoring device for power cables, having at least one optical waveguide for transmitting an optical signal integrated into a polymer film. The polymer film is arranged in such a way that the radially outer surface of the cable is surrounded by the polymer film in at least one longitudinal portion of the cable. At least some of the optical waveguides can be designed as multimode waveguides. The optical waveguides may be integrated in a plurality of layers in the polymer film, the optical waveguides of a first layer being arranged in staggered fashion with respect to the optical waveguides of a second layer arranged above or below the first layer. In this way, at least a section of the polymer film in the film plane is completely covered by the optical waveguides without any unwanted crosstalk between adjacent optical waveguides resulting.

Passive component for detecting an electrical overload in electrically rotating machines

Various embodiments include a passive component comprising: a substrate; and two conductor tracks disposed on the substrate. The substrate forms an electrically insulating bridge between at least two phases of an electrically rotating machine. Each of the two conductor tracks is coupled to a separate phase of the at least two phases so an electrical potential across the electrically insulating bridge is the same as in the insulation system of the machine and the potential load on the passive component corresponds to the potential load on the insulation system.

Test device for localizing a partial discharge in or at an electrical component as well as method for localizing the partial discharge

A test device to localize a partial discharge in or at an electrical component may include at least one antenna to capture an electromagnetic wave caused by a partial discharge in the electrical component. The test device includes multiple microphones arranged in an environment around the electrical component. The microphones capture sound waves caused by the partial discharge. It is examined if an intensity of the electromagnetic wave exceeds a first limit value and/or the intensity of the sound wave captured by one of the multiple microphones exceeds a second limit value. Depending on the captured sound wave and/or the electromagnetic wave and on the examination relating to the first and/or second limit value, a location of the partial discharge can be determined.

Live detection system, method, and thermal infrared imager for power grid equipment

A live detection system, a thermal infrared (IR) imager and a method for power grid equipment are provided. The system includes an environmental parameter module for acquiring environmental temperature, humidity and wind speed data; a ranging module for measuring a linear distance to the power grid equipment; an equipment type recognition module for acquiring an image of the power grid equipment, and recognizing a type of the power grid equipment; an equipment material determination module for determining a material type of the power grid equipment; an emissivity setting module for setting an emissivity; an temperature measurement module for obtaining a temperature of the power grid equipment by focusing on positions of the power grid equipment which need temperature measurement; and a report generation module for selecting a corresponding diagnostic model, displaying a temperature measurement position and a temperature value, drawing a conclusion, and generating a report.

Electrical Equipment Diagnostic Systems
20190310305 · 2019-10-10 ·

An electrical equipment diagnostic system can include an electrical equipment and a sensor device controlled by a user that takes a first measurement of a first parameter of the electrical equipment while the electrical equipment is operating. The system can also include a controller communicably coupled to the sensor device, where the controller includes a storage repository, where the storage repository includes at least one threshold value and at least one algorithm. The controller can receive the first measurement from the sensor device, and process the at least one first algorithm using the first measurement. The controller can also identify a problem with the electrical equipment based on results of the at least one first algorithm, and instruct the user to perform specific tasks to correct the problem with the electrical equipment.

METHOD FOR DISTINGUISHING AN ARC FROM A LUMINOUS GAS CONTAINING AT LEAST METAL VAPOR
20190260195 · 2019-08-22 ·

A method for distinguishing an arc from a luminous gas at least containing metal vapor includes sensing light in a monitoring region and determining a first intensity I.sub.1 of the sensed light at a first wavelength 1 and a second intensity I.sub.2 of the sensed light at a second, greater wavelength 2. The ratio I.sub.1/I.sub.2 between the first intensity I.sub.1 and the second intensity I.sub.2 is determined. The sensed light is associated with an arc if said ratio I.sub.1/I.sub.2 is greater than a specifiable first threshold value and/or with a luminous gas at least containing metal vapor if said ratio I.sub.1/I.sub.2 is less than a specifiable second threshold value.

Method and system for inspection of defective MTJ cell in STT-MRAM
11988702 · 2024-05-21 · ·

The present invention relates to a film quality inspection method and system for providing a stress evaluation scheme for inspection of film quality of a magnetic tunnel junction (MTJ) cell of spin-transfer torque magnetic random access memory (STT-MRAM), wherein a bipolar signal and a unipolar signal including a unipolar hole (positive polarity) and a unipolar electron (negative polarity) are simultaneously applied to the same MTJ cell, and then according to a result of a comparison of a cycling gap, the quality of a thin film having a thickness of about 1 nm may be inspected.