A connection interface for connecting one or more devices under test (DUTs) to one or more remote test and measurement instruments includes a device-under-test connector for connecting a DUT to the interface, a host-instrument connector for connecting the interface to a host test and measurement instrument, and an electrical path between the device-under-test connector and the host-instrument connector. The connection interface also includes a display that has a first portion visually associated with the device-under-test connector and configured to display an identifier for a particular connection point on the DUT. In some embodiments, the first portion of the display is configured to display measurement data from the particular connection point on the DUT. In some embodiments, the display has a second portion that is configured to display information related to the host test and measurement instrument, or to display a name for a particular measurement of the DUT.

Disclosed is a test and measurement switch matrix. The test and measurement switch matrix includes a solid state switch to couple a test signal from a Device Under Test (DUT) to a test system. The solid state switch has a dual tee guard arrangement providing low leakage when off. The solid state switch also includes an optically coupled drive, which further improves isolation and reduces undesirable charge injection when changing switch states.

A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.

A probe structure for inspecting characteristics of a connector having at least one terminal includes a plunger, a coaxial probe, a flange, a housing, and a spring. A first end portion of the housing and the flange are configured to restrict rotation of the housing in the circumferential direction in a state in which the first end portion of the housing is fitted into the through-hole of the flange. Thus, inspection of characteristics of the terminal of the connector can be performed with higher accuracy.

A device for the placing and contacting of a test contact of a test contact arrangement arranged on a contact carrier featuring a contact head having at least one transmission channel for transmitting thermal energy and transferring a vacuum. The contact head is provided with a test contact receptacle at its contact end in the area of a channel mouth, the test contact receptacle having a receiving gap formed between two parallel receiving cheeks for receiving the test contact and connected with the transmission channel. The receiving cheeks have contact surfaces at their contact ends for contacting a solder deposit arranged on the contact carrier to produce a heat conducting contact with the solder material of the solder deposit.

A manipulator may include a base portion, an upright portion connected to the base portion, a test head attachment incorporated into the upright portion, and an upright quick connect assembly incorporated into the test head attachment. In some cases, the manipulator includes an automatic weight transfer mechanism, a mobile base portion with casters and/or steerable casters.

Methods and apparatus are described relating to a probe assembly having a probe head securing mechanism that includes a lock ring housing and a lock ring disposed in the lock ring housing. In an example, a probe assembly includes a rigid substrate, a circuit board coupled to the rigid substrate, and a probe head securing mechanism. The probe head securing mechanism includes a lock ring housing and a lock ring disposed within the lock ring housing. The circuit board has a surface. The lock ring housing is coupled to the rigid substrate. The circuit board is disposed between the lock ring housing and the rigid substrate. The lock ring is rotatable relative to the lock ring housing. Rotation of the lock ring is configured to move the lock ring in a direction perpendicular to the surface of the circuit board.

A probe card device and a rectangular probe thereof are provided. The rectangular probe includes a branch segment, a first contacting segment and a second contacting segment. The branch segment is ring-shaped and has a perforation, and the branch segment includes two branch arms respectively located at two sides of the perforation. The first contacting segment is located at a side of the branch segment and is pierced through a first through hole of a first guide plate. The second contacting segment is located at the other side of the branch segment. A maximum width portion of the branch segment has a variable width greater than a hole size of the first through hole, and the two branch arms of the branch segment are compressible to enable the variable width to be less than or equal to the hole size of the first through hole.

Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.

A testing head for functionality testing a device under test comprises a plurality of contact probes, each contact probe having a rod-like body having a preset length less than 5000 m extending between a first and a second end, the second end being a contact tip and an opening extending all over its length and defining a plurality of arms, parallel to each other, separated by the opening and connected to the end portions of the contact probe, and an auxiliary guide, arranged transverse to the body and provided with suitable guide holes, the contact probes sliding through each of them, the auxiliary guide defining a gap including one end of the opening being a critical portion of the body and a zone more prone to breakings in the body undergoing low or even no bending stresses in the gap with respect to the rest of the body.