The converter device includes a rectification circuit that receives, as an input, AC power from an AC power supply, and performs full-wave rectification on the AC power received, a booster circuit that boosts an output voltage from the rectification circuit, a smoothing capacitor that smooths an output voltage from the booster circuit, and outputs a voltage smoothed, to the load, and a controller that controls the booster circuit. The booster circuit includes a plurality of booster sections each of which includes a reactor, a switching element, and a reverse-blocking diode. The controller maintains, in an ON state, the switching element included in at least one of the plurality of booster sections for a predetermined time period to determine the presence or absence of a fault of the booster section.

A device for detecting a fault attack, including: a circuit for detecting an interruption of a power supply; a circuit for comparing the duration of the interruption with a first threshold; and a counter of the number of successive interruptions of the power supply having a duration which does not exceed the first threshold.

Facilitating fault detection of a system using a test input comprising a linear combination of inputs of the system is presented herein. A system can comprise a test signal component that generates, via a test procedure, a test input signal comprising a first linear combination of at least two input signals of the system, and applies the test input signal to the system during a phase of respective phases of the test procedure; and a fault detection component that detects a fault of the system based on a test output signal corresponding to the test input signal and a second linear combination of respective output signals of the system corresponding to the at least two input signals.

An optical device is formed on an optical IC chip. The shape of the optical IC chip is rectangular or parallelogram. The optical device induces: an optical device circuit; a first optical waveguide that is coupled to the optical device circuit; a pad that is electrically connected to the optical device circuit; a grating coupler; and a second optical waveguide that is coupled to the grating coupler. The pad is formed in a region close to a first side of the optical IC chip. The grating coupler is formed in a specified region, which is not close to the first side, on the optical IC chip. The first optical waveguide and the second optical waveguide are respectively extended to an edge of the optical IC chip.

An adapter for testing electrical equipment can include a first receptacle end having at least one first coupling feature, where the at least one first coupling feature is configured to couple to a power source and a first electrical device, where the first receptacle end is configured to receive from the power source at least one first test signal and send the at least one first test signal to the first electrical device. The adapter can also include a sensing device configured to receive at least one first response signal from the first electrical device, where the at least one first response signal is in response to and based on the first electrical device receiving the at least one first test signal.

A microelectromechanical gyroscope which comprises one or more Coriolis masses driven by a drive transducer and a force-feedback system. The force-feedback circuit comprises first and second sideband modulators and the self-test circuit comprises first and second sideband demodulators.

A fault monitoring method is executed by a monitoring device in a fault monitoring system that includes a terminal used by a user, an appliance to be operated by the user, the monitoring device, and a plurality of authentication servers each including a distributed ledger, and includes: obtaining event information stored in the plurality of authentication servers and indicating an event generated in response to a request that includes a processing instruction for the user operating the appliance; obtaining state information indicating whether the appliance is faulty, from the appliance; generating first transaction data including the state information obtained and transmitting the first transaction data to the plurality of authentication servers; and transmitting the processing instruction included in the event information to the appliance, when the appliance is determined to be not faulty from the state information.

Electronic device package technology is disclosed. An electronic device package in accordance with the present disclosure can include a substrate. The electronic device package can also include an electronic component disposed on the substrate and electrically coupled to the substrate. The electronic device package can further include a connector disposed on the substrate and electrically coupled to the substrate for communication with the electronic component. The connector can have a contact to interface with a mating connector and configured to provide a signal and/or power to the electronic component to facilitate testing the electronic component. Additionally, the electronic component can include an encapsulant material disposed on the substrate and at least partially encapsulating the electronic component and/or the connector. The contact can be accessible on a top side of the electronic device package to facilitate coupling the connector to a testing device. Associated systems and methods are also disclosed.

The present invention provides a method for predicting a remaining lifetime of an electrical component of an electrical circuit, the electrical circuit being part of a building management device. The method comprises: estimating (S1) two or more estimated temperatures of the electrical component by using a trained machine learning model of the electrical component that is trained based on training data. Further, the method comprises: generating (S2) a temporal course of temperature of the electrical component based on the two or more estimated temperatures; and computing (S3), based on the temporal course of temperature of the electrical component, an indicator for the remaining lifetime of the electrical component. The present invention also provides a method for predicting a remaining lifetime of an electrical circuit being part of a building management device.

The converter device includes a rectification circuit that receives, as an input, AC power from an AC power supply, and performs full-wave rectification on the AC power received, a booster circuit that boosts an output voltage from the rectification circuit, a smoothing capacitor that smooths an output voltage from the booster circuit, and outputs a voltage smoothed, to the load, and a controller that controls the booster circuit. The booster circuit includes a plurality of booster sections each of which includes a reactor, a switching element, and a reverse-blocking diode. The controller maintains, in an ON state, the switching element included in at least one of the plurality of booster sections for a predetermined time period to determine the presence or absence of a fault of the booster section.