A Stein Hall cup for measuring the viscosity of a starch adhesive is automated to provide viscosity measurement in real time using a PLC or other data gathering and control processor. Temperature of the adhesive is measured concurrently with viscosity and temperature signals are processed with the timed viscosity signal to provide a temperature compensated value of starch viscosity.

The present disclosure provides a method of testing a single device under test (DUT) through multiple cores in parallel, which includes steps as follows. The test quantity of the DUT is calculated; the test quantity of the DUT is evenly allocated to to a plurality of test cores, so as to control a period of testing the DUT through the test cores in parallel.

The present invention addresses the problem of many man-hours being required for a hardware engineer to adjust a resistance value such that the rise time of a signal input to an LSI body falls within a defined range. To solve this problem, the present invention provides a control circuit provided with: a conductive wire for transmitting an input electric signal to an integrated circuit; a resistance circuit which has a variable resistance value and which is connected to the conductive wire and grounded; a measurement means for measuring a rise time of the electric signal transmitted through the conductive wire, that is, the amount of time it takes for the voltage value of the electric signal to reach a predetermined second voltage value from a predetermined first voltage value, said predetermined second voltage value being higher than the first voltage value; and a control means for changing the resistance value of the resistance circuit to a value which is lower by a specific amount when the time measured by the measurement means is shorter than the minimum time of a predetermined time range, and changing the resistance value to a value which is higher by a specific amount when the time measured by the measurement means is longer than the maximum time of the predetermined time range. The control means outputs a predetermined signal upon having changed the resistance value a predetermined number of times.

The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes;

The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, a device configured to monitor electrical overstress (EOS) events includes a pair of spaced conductive structures configured to electrically arc in response to an EOS event, wherein the spaced conductive structures are formed of a material and have a shape such that arcing causes a detectable change in shape of the spaced conductive structures, and wherein the device is configured such that the change in shape of the spaced conductive structures is detectable to serve as an EOS monitor.

An apparatus for providing a supply voltage to a device under test includes: a controlled source; a switchable resistor circuited between the output of the controlled source and a dut port, having a comparatively smaller first resistance in a first switch state and a second resistance in a second switch state; a regulator that provides a control signal to the controlled source, to regulate a voltage to be provided to the dut. The apparatus changes a switch state of the switchable resistor while a voltage is provided to the dut via the switchable resistor. The apparatus injects a compensation signal into a control loop including the regulator, the controlled source and the switchable resistor, to thereby cause a change of the voltage provided by the controlled source, to at least partially compensate a change of a voltage drop across the switchable resistor.

During frequency detection, a constant current source outputs an output current to charge a variable capacitor for multi-period. In a calibration mode, according to a comparison result between a cross voltage of the variable capacitor and a reference voltage, a capacitance value of the variable capacitor is adjusted. In a monitor mode, according to a reference frequency and the cross voltage of the variable capacitor, a frequency under test of a circuit under test is detected.

A circuit for detecting failure of a device includes a plurality of monitoring modules. Each respective monitoring module of the plurality of monitoring modules is configured to generate a monitoring value at an output of the respective monitoring module based on a signal received at an input of the respective monitoring module. The circuit further includes a data selector module configured to couple, for each step of a switching cycle, the input of each of the plurality of monitoring modules to one of a plurality of function modules such that each of the plurality of monitoring modules generates the monitoring value for each of the plurality of function modules to generate monitoring information and evaluation logic configured to determine whether a failure has occurred at the plurality of function modules based on the monitoring information.

A radio-frequency receiver includes built-in-self-test (BIST) circuitry which generates a self-test signal. A local oscillator signal is divided. A self-test oscillation signal is generated, based, at least in part, on the frequency-divided local oscillation signal. The self-test signal is generated based on the self-test oscillation signal. The BIST circuitry includes a divider, which divides the self-test oscillation signal. The frequency-divided local oscillation signal and the divided self-test oscillation signal are used to perform one or more of generating the self-test oscillation signal and controlling the generation of the self-test oscillation signal. The radio-frequency receiver may be an automotive radar receiver.

Some embodiments described herein include a system that collects and learns reference side-channel normal activity, process it to reveal key features, compares subsequent collected data and processed data for anomalous behavior, and reports such behavior to a management center where this information is displayed and predefine actions can be executed when anomalous behavior is observed. In some instances, a physical side channel (e.g. and indirect measure of program execution such as power consumption or electromagnetic emissions and other physical signals) can be used to assess the execution status in a processor or digital circuit using an external monitor and detect, with extreme accuracy, when an unauthorized execution has managed to disrupt the normal operation of a target system (e.g., a computer system, etc.).