A value representative of a dispersion of a propagation delay of assemblies of electronic components is determined. A component test structure includes stages of components and a logic circuit connected in a ring. Each stage includes two assemblies of similar components configured to conduct a signal. A test device is configured to obtain values of the component test structure and to perform operations on these values.

According to one embodiment, a chip is described comprising a transistor level, a semiconductor region in, below, or in and below the transistor level, a test signal circuit configured to supply a test signal to the semiconductor region, a determiner configured to determine a behavior of the semiconductor region in response to the test signal and a detector configured to detect a change of geometry of the semiconductor region based on the behavior and a reference behavior of the semiconductor region in response to the test signal.

A system, a method, and a machine-readable medium for overclocking a computer system is provided. An example of a method for overclocking a computer system includes predicting a stable operating frequency for a central processing unit (CPU) in a target system based, at least in part, on a model generated from data collected for a test system. An operating frequency for the CPU is adjusted to the stable operating frequency. A benchmark test is run to confirm that the CPU is operating within limits.

A test and measurement system for analyzing a device under test, including a database configured to store test results related to tests performed with one or more prior devices under test, a receiver to receive new test results about a new device under test, a data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.

An apparatus includes an integrated circuit that includes an in-circuit power switch coupled to a power supply node, a functional circuit coupled between the in-circuit power switch and a ground node, a test circuit, and a test power switch coupled to the test circuit, wherein the test power switch is a replica of the in-circuit power switch. The test circuit is configured to determine characteristics of the test power switch, and to measure a voltage difference across the in-circuit power switch. The test circuit is also configured to use the characteristics of the test power switch and the voltage difference to determine a power consumption of the functional circuit.

Embodiments of a method and a device are disclosed. In an embodiment, a method for operating a communications network is disclosed. The method involves setting, at a first network node in the communications network, a register value that is indicative of a fault status associated with the first network node, the register value being set in a physical layer device of the first network node, receiving fault status information at an element in the communications network, the fault status information corresponding to the register value that is set in the physical layer device of the first network node, and determining, at the element in the communications network, a fault status of the communications network in response to the fault status information received at the element in the communications network.

Aspects of the invention include a circuit having a power supply sensitive delay circuit, a variable delay circuit coupled to the power supply sensitive delay circuit, a delay line coupled to the variable delay circuit, and a logic circuit coupled to the delay line.

An automated testing system for power supply units includes a frame, automated test equipment supported by the frame, a test jig supported by the frame and coupled with the automated test equipment, and a robotic arm coupled to the frame. The robotic arm is configured to move a power supply unit onto the test jig to interface with the automated test equipment. The automated test equipment is configured to perform one or more tests on the power supply unit when the power supply unit is interfaced with the automated test equipment, and the robotic arm is configured to move the power supply unit off of the test jig after the one or more tests are completed. Methods of performing automated testing for power supply units are also disclosed.

A modular multilevel converter system, and a voltage detection method and an open-circuit fault diagnosis method thereof are disclosed. The modular multilevel converter system includes: N sub-modules sequentially cascaded, where N is an integer greater than or equal to 2, each of the sub-modules comprising at least one bridge arm and a capacitor connected in parallel to the bridge arm, the capacitor having a positive terminal and a negative terminal; and a voltage detection unit for detecting a voltage between at least two adjacent sub-modules in the N sub-modules, the voltage detection unit being connected between the positive terminal of the capacitor of the first sub-module and the negative terminal of the capacitor of the last sub-module in the at least two sub-modules.

A testing device includes a measuring unit, a testing board supporting the measuring unit and connected to the measuring unit, and a connecting interface coupled to the testing board. The connecting interface includes connecting terminals protruding in a direction away from the testing board, and is connected to a device under test (DUT) via the connecting terminals. When the DUT is connected to the connecting interface, the measuring unit supplies a constant electric current via the testing board and the connecting interface to the DUT for a preset duration to result in a voltage, measures the voltage, and determines, based on a result of measurement of the voltage, an electrical connection status of the DUT.