Patent classifications
G01R31/302
TEST EQUIPMENT FOR TESTING A DEVICE UNDER TEST HAVING AN ANTENNA
Devices for testing a DUT having a circuit coupled to an antenna are disclose. The device can include a DUT location for receiving a DUT, and an adapter or probe is used to wirelessly “over-the-air” (OTA) electronically test a DUT with an embedded antenna or antenna array with the measurement probe 140 located in close proximity to the DUT. The probe can be located very close to the DUT (e.g., in the near-field region). Although the probe is located in close proximity to the DUT antenna or antenna array elements it does not significantly disturb or interfere with probe during testing.
ANTENNA ASSEMBLY, TEST SYSTEM AND METHOD OF ESTABLISHING A TEST SYSTEM
Embodiments of the present disclosure provide an antenna assembly for a test system. The antenna assembly includes a feedthrough part, two waveguide inputs, a single waveguide output as well as a multiplexing part that is interconnected between the two waveguide inputs and the single waveguide output. The multiplexing part is integrated within the feedthrough part at least partially. Moreover, embodiments of the present disclosure provide a test system and a method of establishing a test system for testing a device under test.
Systems and methods for automatic test pattern generation for integrated circuit technologies
Systems and methods are provided for an integrated circuit system. A plurality of separate integrated circuit dies are coupled together to form an integrated circuit package, a first integrated circuit die including an input and a last integrated circuit die including an output, ones of the plurality of integrated circuit dies including a testing circuit associated with a corresponding integrated circuit die. The testing circuit includes a testing path for testing functionality of the corresponding integrated circuit die, a bypass path bypassing the testing path, and control circuitry for selecting between an output of the testing path and an output of the bypass path, the control circuitry being configured to select the output of the testing path or the output of the bypass path and to pass the selected output to a subsequent integrated circuit die among the plurality of coupled circuit dies.
Article management system
An article management system according to the present invention includes: a reader antenna (102) including an open-type transmission line terminated in an impedance matched state; an RF tag (104) that is placed at a location that is electromagnetically coupled to the reader antenna (102) and is visible from the reader antenna (102) in a state where a management target article (105) is placed in the vicinity of the RF tag; a management target article arrangement region in which the management target article (105) is placed, the management target article arrangement region being set in a location where the management target article (105) is electromagnetically coupled to a tag antenna of the RF tag (104); and an RFID reader (103) that sends a transmitted signal to the reader antenna (102) and receives a response signal output from the tag antenna via the reader antenna (102).
Measurement system and method of performing an over-the-air test
A measurement system for testing a device under test includes a signal generation and/or analysis equipment, several antennas, several reflectors and a test location for the device under test. The antennas are connected with the signal generation and/or analysis equipment in a signal-transmitting manner Each of the antennas is configured to transmit and/or receive an electromagnetic signal so that a beam path is provided between the respective antenna and the test location. The electromagnetic signal is reflected by the respective reflector so that the electromagnetic signal corresponds to a planar wave. Each antenna and the corresponding reflector together are configured to provide a corresponding quiet zone at the test location. At least one of the quiet zones provided is larger than the at least one other quiet zone and/or at least one of the antennas is configured to operate at a different frequency compared to the at least one other antenna. Further, a method of performing an over-the-air test of a device under test is described.
Measurement System for Characterizing a Device Under Test
In a measurement system, a signal probing circuit may provide probed signals by probing voltages and currents and/or incident and reflected waves at a port of a device under test (DUT). A multi-channel receiver structure may include receivers that receive two probed signals from the signal probing hardware circuit, each receiver having its own sample clock derived from a master clock and further having a respective digitizer for digitizing a corresponding one of the two probed signals. A synchronization block, external to the receivers and including a reference clock derived from the master clock, may enable the two probed signals to be phase coherently digitized across the receivers by synchronizing the respective sample clocks of the receivers while the reference clock is being shared with the receivers. A signal processing circuit may then process the phase coherently digitized probed signals.
Semiconductor inspection device
An inspection system includes a light source, a mirror, Galvano mirrors, a casing that holds the mirror and the Galvano mirrors inside and includes an attachment portion for attaching an optical element, and a control unit that controls a deflection angle of the Galvano mirrors, wherein the control unit controls the deflection angle so that an optical path optically connected to a semiconductor device is switched between a first optical path passing through the Galvano mirrors and the mirror, and a second optical path passing through the Galvano mirrors and the attachment portion, and controls the deflection angle so that the deflection angle when switching to the first optical path has been performed and the deflection angle when switching to the second optical path has been performed do not overlap.
System and method for diagnosing contactor using sound sensor
A system and a method of diagnosing a contactor through a sound sensor, which determines whether a contactor is erroneously operated based on a result of sensing a mechanical transition sound generated during an on/off operation of the contactor. The contactor diagnosis may be applied to a battery management system and may further include counting the number of transition operations of the contactor and/or may be used for diagnosing the life of the contactor.
System and method for diagnosing contactor using sound sensor
A system and a method of diagnosing a contactor through a sound sensor, which determines whether a contactor is erroneously operated based on a result of sensing a mechanical transition sound generated during an on/off operation of the contactor. The contactor diagnosis may be applied to a battery management system and may further include counting the number of transition operations of the contactor and/or may be used for diagnosing the life of the contactor.
Non-contact DC voltage measurement device with oscillating sensor
Systems and methods for measuring DC voltage of an insulated conductor (e.g., insulated wire) are provided, without requiring a galvanic connection between the conductor and a test electrode or probe. A non-contact DC voltage measurement device may include a conductive sensor that is mechanically oscillated. The device may also include a conductive internal ground guard that is galvanically isolated from the conductive sensor, and a conductive reference shield that is galvanically insulated from the internal ground guard. The device may further include a common mode reference voltage source that generates an alternating current (AC) reference voltage, and a sensor signal measurement subsystem electrically coupled to the conductive sensor. Control circuitry may receive a sensor current signal from the sensor signal measurement subsystem, and determine the DC voltage in the insulated conductor based at least in part on the received sensor current signal.