Aspects of the present disclosure provide techniques and apparatus for distributed built-in self-test. An example method of testing circuitry includes testing, in a first occasion, a first electrical circuit, having a first component, using at least a second component of a second electrical circuit; and testing, in a second occasion, the second electrical circuit using at least the first component of the first electrical circuit.

Aspects of the present disclosure provide techniques and apparatus for distributed built-in self-test. An example method of testing circuitry includes testing, in a first occasion, a first electrical circuit, having a first component, using at least a second component of a second electrical circuit; and testing, in a second occasion, the second electrical circuit using at least the first component of the first electrical circuit.

The present invention is a process by which an engineer can provide as input the design, functional verification goals, and other abstract design details, and receive as output an agent which can be integrated into traditional test benches and will generate stimuli to automatically hit the functional coverage goals for the design. The present invention may employ a system which includes a learning configurator, a learning-based test generator, and a test bench. The learning test generator is communicatively coupled to the generator and notably comprises a learning algorithm.

The present disclosure relates to a sensor circuit having a first interface configured to receive a first sensor signal in response to a first measurement of a first physical quantity, a first analog-to-digital converter configured to sample the first sensor signal to generate a sampled first sensor signal, a second interface configured to receive a second sensor signal in response to a second measurement of the same first physical quantity, a third interface configured to receive at least one third sensor signal in response to at least one third measurement of at least one second physical quantity that is different from the first physical quantity, a multiplexer configured to multiplex the second and the at least one third sensor signal to a multiplexed sensor signal, and a second analog-to-digital converter coupled to the multiplexer and configured to sample the multiplexed sensor signal to generate a sampled multiplexed sensor signal.

The present disclosure relates to a sensor circuit having a first interface configured to receive a first sensor signal in response to a first measurement of a first physical quantity, a first analog-to-digital converter configured to sample the first sensor signal to generate a sampled first sensor signal, a second interface configured to receive a second sensor signal in response to a second measurement of the same first physical quantity, a third interface configured to receive at least one third sensor signal in response to at least one third measurement of at least one second physical quantity that is different from the first physical quantity, a multiplexer configured to multiplex the second and the at least one third sensor signal to a multiplexed sensor signal, and a second analog-to-digital converter coupled to the multiplexer and configured to sample the multiplexed sensor signal to generate a sampled multiplexed sensor signal.

An analog circuit includes an analog test bus; a plurality of analog circuits including a first analog circuit, each of the plurality of analog circuits associated with a corresponding one of a plurality of power domains; a first plurality of transmission gates coupled between the first analog circuit and the analog test bus; and a first protection device coupled between the first plurality of transmission gates and a ground reference.

An example apparatus includes a buffer configured to, when enabled: obtain an input voltage; and provide the input voltage to a first boundary cell; and a second boundary cell configured to, when the apparatus is used in analog mode and a boundary scan occurs disable the buffer.

An example apparatus includes a buffer configured to, when enabled: obtain an input voltage; and provide the input voltage to a first boundary cell; and a second boundary cell configured to, when the apparatus is used in analog mode and a boundary scan occurs disable the buffer.

A method, apparatus and system are provided for the tuning of embedded subsystems of a device under test (DUT) that have analog characteristics. In response to a tester invoking one or more test procedures via a command channel between the tester and a target embedded subsystem of the DUT, test firmware of the invoked tests is loaded into the target embedded subsystem. The target embedded subsystem executes the tests under control of the tester in accordance with test parameters received from the tester over the command channel and in accordance with test commands received from the tester over a test signaling channel. The target embedded subsystem returns results of the one or more tests to the tester via the command channel. The results can be used to trim analog characteristics of the target embedded subsystem and can be stored in memory. The test firmware can then be deleted to free up memory space.

A test apparatus may include transceivers and a global de-skew circuit. In a training mode, the transceivers provide first timing information obtained by delaying a first data signal in the range of up to a preset unit interval based on a clock signal and receive second timing information corresponding to timing differences between a slowest transceiver and the remaining transceivers. In an operation mode, the transceivers provide compensation data to a plurality of DUTs (Devices Under Test) substantially simultaneously. The compensation data may be obtained by delaying a second data signal by multiples of the preset unit interval in response to the second timing information. In the training mode, the global de-skew circuit receives the first timing information, calculates, using the first timing information, the timing differences between the slowest transceiver and the remaining transceivers, and provides the second timing information corresponding to the timing differences to the transceivers.