A system to monitor a MOSFET, the system including a switching arrangement configured to switchably isolate a gate terminal of the MOSFET and a source terminal of the MOSFET from a gate-control voltage source and a test circuit configured to detect a change in a gate-to-source voltage of the MOSFET over a test period, the test period occurring while the gate terminal and the source terminal are isolated

A Battery Management System (BMS) semiconductor device having a leakage current detection function, may include: a comparator configured to compare a voltage of a balancing terminal connected to a positive voltage terminal of a battery cell and a voltage of a lower sensing terminal connected to a negative voltage terminal of the battery cell and output a result of the comparing; an ADC connected to the upper sensing terminal and the lower sensing terminal and configured to sense a voltage difference between the upper sensing terminal connected to the positive voltage terminal of the battery cell and the lower sensing terminal; and a leakage current determining unit connected to the ADC and the comparator and configured to set a variable threshold value according to the difference value sensed by the ADC and determine whether a leakage current is generated by using the result of the comparing in the comparator and the variable threshold value.

A Battery Management System (BMS) semiconductor device having a leakage current detection function, may include: a comparator configured to compare a voltage of a balancing terminal connected to a positive voltage terminal of a battery cell and a voltage of a lower sensing terminal connected to a negative voltage terminal of the battery cell and output a result of the comparing; an ADC connected to the upper sensing terminal and the lower sensing terminal and configured to sense a voltage difference between the upper sensing terminal connected to the positive voltage terminal of the battery cell and the lower sensing terminal; and a leakage current determining unit connected to the ADC and the comparator and configured to set a variable threshold value according to the difference value sensed by the ADC and determine whether a leakage current is generated by using the result of the comparing in the comparator and the variable threshold value.

Disclosed is a detector 10 using a liquid spray 2000 for detecting electrical faults or shorts with the detector including a body 100 having an interior 120; a hose or pipe 130 fluidly connected to interior 120; a trigger valve 140 operatively connected to hose 130; a conductor 200 attached to detector 10; and/or a pump 110 fluidly connected to interior 120. In various embodiments the detector 10 can cause liquid spray 2000 to be sprayed on a subregion of an item such as a remotely operated vehicle to create a closed electrical circuit through the liquid spray and the conductor in the detector.

Disclosed is a detector 10 using a liquid spray 2000 for detecting electrical faults or shorts with the detector including a body 100 having an interior 120; a hose or pipe 130 fluidly connected to interior 120; a trigger valve 140 operatively connected to hose 130; a conductor 200 attached to detector 10; and/or a pump 110 fluidly connected to interior 120. In various embodiments the detector 10 can cause liquid spray 2000 to be sprayed on a subregion of an item such as a remotely operated vehicle to create a closed electrical circuit through the liquid spray and the conductor in the detector.

A method for processing a direct current electric arc and an apparatus, includes: obtaining a first current which is a direct current input current of a direct current cable of a photovoltaic cell system; obtaining a second current, where the second current is a direct current common mode current of a direct current cable or an alternating current common mode current of an alternating current cable; calculating a correlation coefficient between a frequency domain component of the first current and a frequency domain component of the second current; and when determining that the first current meets an electric arc occurrence condition and the correlation coefficient is greater than or equal to a preset coefficient threshold, skipping sending a direct current electric arc fault alarm. The correlation coefficient is used to reflect a proportion of common mode noise generated by the second current, and the preset coefficient threshold is set.

A method for processing a direct current electric arc and an apparatus, includes: obtaining a first current which is a direct current input current of a direct current cable of a photovoltaic cell system; obtaining a second current, where the second current is a direct current common mode current of a direct current cable or an alternating current common mode current of an alternating current cable; calculating a correlation coefficient between a frequency domain component of the first current and a frequency domain component of the second current; and when determining that the first current meets an electric arc occurrence condition and the correlation coefficient is greater than or equal to a preset coefficient threshold, skipping sending a direct current electric arc fault alarm. The correlation coefficient is used to reflect a proportion of common mode noise generated by the second current, and the preset coefficient threshold is set.

A testing device and method may be implemented for improved detection of leaks in batteries used in portable electronic devices. The leak testing device may use two high voltage electrodes to detect ionized air leaks. The first high voltage electrode may be configured as a test voltage, and the second high voltage electrode may be configured as a reference voltage. The first high voltage electrode and the second high voltage electrode may be configured as current limitation resistors. The leak testing device may include a processor that measures the first high voltage electrode and the second high voltage electrode. The leak testing device may include a display that is configured to display a difference between readings of the first high voltage electrode and the second high voltage electrode.

In various examples, permanent faults in hardware component(s) and/or connections to the hardware component(s) of a computing platform may be predicted before they occur using in-system testing. As a result of this prediction, one or more remedial actions may be determined to enhance the safety of the computing platform (e.g., an autonomous vehicle). A degradation rate of a performance characteristic associated with the hardware component may be determined, detected, and/or computed by monitoring values of performance characteristics over time using fault testing.

Provided are a short circuit state analyzer to compare difference value when the AC excitation current is applied at a first frequency with a threshold value, to estimate a short circuit resistance from the difference value based on data indicating a relationship between the short circuit resistance and the difference value at the first frequency when the difference value is smaller than the threshold value, to cause an excitation power supply to apply the AC excitation current to the field windings at a second frequency lower than the first frequency when the difference value is equal to or greater than the threshold value, and to estimate the short circuit resistance from a difference value obtained by the AC excitation current at the second frequency based on data indicating a relationship between the short circuit resistance and the difference value at the second frequency.