A method of analyzing events for an electrical system includes: receiving event stream(s) of events occurring in the electrical system, the events being identified from captured energy-related signals in the system; analyzing, an event stream(s) of the events to identify different actionable triggers therefrom, the different triggers including a scenario in which a group of events satisfies one or more predetermined triggering conditions; analyzing, over time, the different actionable triggers to identify a combination of occurring and/or non-occurring actionable triggers which satisfies a predefined trigger combination condition and an analysis time constraint; and in response to the observation of the combination, taking one or more actions to address the events. The analysis time constraint can be a time period duration and/or sequence within which time-stamped data of events in the event stream(s) and the associated actionable triggers are considered or not considered in the analysis to identify the combination.

A method and system for online monitoring and compensation of inter-turn short circuit faults (ISF) in windings of electric machines, such as permanent magnet synchronous motors is provided. A method for characterizing an ISF in a winding of an electric machine comprises: measuring phase voltages and currents; calculating sequence components of the electric machine based on the phase voltages and currents; determining a ratio between a percentage of shorted turns in the winding and a fault loop resistance based on the sequence components of the electric machine; and estimating characteristics of the inter-turn short circuit fault using an unscented Kalman filter. The characteristics include at least one of: a fault current, the percentage of shorted turns, or the fault loop resistance. A method for compensation an ISF in a winding of an electric machine comprises compensating the fault current based on the compensation current estimated from an unscented Kalman filter.

A method and system for online monitoring and compensation of inter-turn short circuit faults (ISF) in windings of electric machines, such as permanent magnet synchronous motors is provided. A method for characterizing an ISF in a winding of an electric machine comprises: measuring phase voltages and currents; calculating sequence components of the electric machine based on the phase voltages and currents; determining a ratio between a percentage of shorted turns in the winding and a fault loop resistance based on the sequence components of the electric machine; and estimating characteristics of the inter-turn short circuit fault using an unscented Kalman filter. The characteristics include at least one of: a fault current, the percentage of shorted turns, or the fault loop resistance. A method for compensation an ISF in a winding of an electric machine comprises compensating the fault current based on the compensation current estimated from an unscented Kalman filter.

A lifetime estimation system for estimating a lifetime of a heating source is provided in an apparatus for heating a target object using the heating source and performing a feedback control of a target object temperature using a temperature controller based on a temperature measurement value of the target object measured by a temperature measuring device. The temperature controller controls a power supplied to the heating source and performs a temperature control using a state space model to perform the feedback control of the temperature of the target object. The lifetime estimation system includes a temperature monitor unit that monitors the temperature measurement value of the target object, a hunting amount detection unit that detects a hunting amount in a stable region of the monitored temperature of the target object, and a lifetime estimation unit that estimates a lifetime of the heating source from the detected hunting amount.

Apparatuses and methods for testing electrical wiring of a device are provided. In one example, the device has a conductive portion, an electrical component, and a multiphase plug that is electrically coupled to a neutral conductor and at least two phase conductors. The neutral conductor is coupled to the conductive portion and the at least two phase conductors are coupled to the electrical component. The apparatus includes a receptacle that removably couples to the multiphase plug. A grounding cable removably couples to the conductive portion. A power supply generates power and is in electrical communication with the receptacle to communicate the power to the receptacle. An annunciator is in electrical communication with the power supply and the grounding cable and is configured to generate a response when the receptacle, the multiphase plug, the conductive portion, and the grounding cable are in electrical communication to communicate the power therethrough.

Apparatuses and methods for testing electrical wiring of a device are provided. In one example, the device has a conductive portion, an electrical component, and a multiphase plug that is electrically coupled to a neutral conductor and at least two phase conductors. The neutral conductor is coupled to the conductive portion and the at least two phase conductors are coupled to the electrical component. The apparatus includes a receptacle that removably couples to the multiphase plug. A grounding cable removably couples to the conductive portion. A power supply generates power and is in electrical communication with the receptacle to communicate the power to the receptacle. An annunciator is in electrical communication with the power supply and the grounding cable and is configured to generate a response when the receptacle, the multiphase plug, the conductive portion, and the grounding cable are in electrical communication to communicate the power therethrough.

A test voltage sample and hold circuitry is disclosed in a readout circuitry of an image sensor. This circuitry samples a voltage at demand value based on a ramp voltage shared by the ADC comparators of the readout circuitry. The value of the sampled voltage is controlled by a control circuitry which is able to predict and calculate at what time a ramp generator may carry the demand voltage value. The sampled voltage is held by a hold capacitor during readout of one row and is accessed during the next row by the control circuitry as test data to drive a device under test (DUT) which may be any portion of the image sensor to be tested. Measured data out of the DUT is compared with expected data. Based on the result of the comparison, a signal indicates the pass or fail of the self-test concludes a self-test of the DUT.

A test voltage sample and hold circuitry is disclosed in a readout circuitry of an image sensor. This circuitry samples a voltage at demand value based on a ramp voltage shared by the ADC comparators of the readout circuitry. The value of the sampled voltage is controlled by a control circuitry which is able to predict and calculate at what time a ramp generator may carry the demand voltage value. The sampled voltage is held by a hold capacitor during readout of one row and is accessed during the next row by the control circuitry as test data to drive a device under test (DUT) which may be any portion of the image sensor to be tested. Measured data out of the DUT is compared with expected data. Based on the result of the comparison, a signal indicates the pass or fail of the self-test concludes a self-test of the DUT.

An integrated interface for an electronic device without a USB port includes at least one SIM card interface drive chip, a USB interface control chip, at least one SIM card interface control chip electronically connected to the at least one SIM card interface drive chip and the USB interface control chip, and a USB interface drive chip electronically connected to the USB interface control chip. A detection signal pin is defined on the USB interface control chip. When the detection signal pin is triggered, the USB interface control chip is turned on and the SIM card interface drive chip is turned off. When triggered, the USB interface drive chip drives the USB interface control chip to work, allowing access by an external whole-machine probe or test device.

The present disclosure relate to a fault diagnosis method, including: collecting at least one set of original data of the high voltage generator during operation, each condition attribute in a condition attribute set corresponding to one piece of original data; pre-processing the original data to obtain pre-processed data and generating a decision table; performing an attribute reduction based on the decision table to obtain a reduced condition attribute set and a reduced decision table; generating a decision tree model according to the reduced decision table; generating a decision forest model according to at least one decision tree model; obtaining a fault type and a fault level according to the decision forest model; determining an acceptable level of the fault according to the fault level and a frequency of occurrence of the same type of fault, and sending the fault type and the acceptable level to the display terminal.