A method and a system for fault verification of an electronic device are provided. The electronic device includes a device to-be-verified. The method includes the following. A first power-supply voltage is applied to the electronic device until the device to-be-verified satisfies a material-failure condition. A second power-supply voltage is applied to the electronic device to determine whether the electronic device has safety risk. The first power-supply voltage is higher than the second power-supply voltage, and the safety risk is caused by material failure in the device to-be-verified. The method and the system for fault verification of an electronic device can verify safety risk caused by material failure in internal components of the electronic device.

A method and a system for fault verification of an electronic device are provided. The electronic device includes a device to-be-verified. The method includes the following. A first power-supply voltage is applied to the electronic device until the device to-be-verified satisfies a material-failure condition. A second power-supply voltage is applied to the electronic device to determine whether the electronic device has safety risk. The first power-supply voltage is higher than the second power-supply voltage, and the safety risk is caused by material failure in the device to-be-verified. The method and the system for fault verification of an electronic device can verify safety risk caused by material failure in internal components of the electronic device.

The present disclosure relates in a first aspect to a method of detecting leakage current from a DC bias voltage circuit of an integrated circuit for a capacitive microelectro mechanical systems (MEMS) transducer. A test signal with a predetermined frequency and level is superimposed on a first DC bias voltage generated by the DC bias voltage circuit.

The present disclosure relates in a first aspect to a method of detecting leakage current from a DC bias voltage circuit of an integrated circuit for a capacitive microelectro mechanical systems (MEMS) transducer. A test signal with a predetermined frequency and level is superimposed on a first DC bias voltage generated by the DC bias voltage circuit.

An electronic device according to an embodiment of the disclosure may include a housing including a front plate, a back plate disposed to the opposite side of the front plate, and a side member surrounding a space between the front plate and the back plate, wherein at least a part of the back plate is constructed of a conductive material, and the side member includes an opening, a touch screen display disposed between the front plate and the back plate, a female connector disposed inside the opening, constructed to house a meal connector an external male connector, and including a plurality of pins, a Printed Circuit Board (PCB) disposed inside the space and including a ground plane, a circuit electrically coupled to the ground plane and/or mounted thereon to cut off leak current from the PCB, a first conductive path constructed between the circuit and a first point of at least part of the back plate, and a second conductive path constructed between at least one of the pins and a second point of at least part of the back plate. In addition, various other embodiments are also possible.

An electronic device according to an embodiment of the disclosure may include a housing including a front plate, a back plate disposed to the opposite side of the front plate, and a side member surrounding a space between the front plate and the back plate, wherein at least a part of the back plate is constructed of a conductive material, and the side member includes an opening, a touch screen display disposed between the front plate and the back plate, a female connector disposed inside the opening, constructed to house a meal connector an external male connector, and including a plurality of pins, a Printed Circuit Board (PCB) disposed inside the space and including a ground plane, a circuit electrically coupled to the ground plane and/or mounted thereon to cut off leak current from the PCB, a first conductive path constructed between the circuit and a first point of at least part of the back plate, and a second conductive path constructed between at least one of the pins and a second point of at least part of the back plate. In addition, various other embodiments are also possible.

The present application relates to the field of display technology, and discloses a display module test platform, including a core processor. The core processor is capable of supporting installation of a terminal operating system. A display output terminal of the core processor is connected to a display module to be tested. The display module to be tested includes a touch structure. The touch structure and the core processor communicate with each other via an Inter-Integrated Circuit (I2C) bus.

The present application relates to the field of display technology, and discloses a display module test platform, including a core processor. The core processor is capable of supporting installation of a terminal operating system. A display output terminal of the core processor is connected to a display module to be tested. The display module to be tested includes a touch structure. The touch structure and the core processor communicate with each other via an Inter-Integrated Circuit (I2C) bus.

A system for use with an electric machine is provided. The system includes a processor and a memory comprising a set of memory modules, which, when executed by the processor, cause the processor to perform certain operations. The operations include receiving operational data from the electric machine, and generating, based on the operational data, a first set of diagnostic data, by executing a first memory module from the set of memory modules. The operations further include generating, based on the operational data, a second set of diagnostic data, by executing a second memory module from the set of memory modules, the second memory module including a set of parameters associated with a diagnostics model of the electric machine. Furthermore, the operations include effecting, based on the operational data, the first set of diagnostic data, and the second set of diagnostic data, a change in at least one parameter.

A control panel includes power supply circuits for supplying power supply voltages to loads and a connection part for connecting wiring. The control panel comprises a system current detection unit that is for detecting a sudden increase in system current that is from a power system and flows through the control panel and includes a second current transformer, and individual current detection units that are for detecting a sudden increase in the individual current of one of the power supply circuits and include first current transformers. An arc discharge detection unit identifies an arc discharge occurring within the control panel separately from a surge flowing into the system based on a system current detection signal and individual current detection signals.