The disclosure provides a recommended method for replacing equipment and an electronic device. A plurality of reference electricity consumptions of an equipment are estimated by using an electricity consumption prediction model based on equipment operation information of the equipment in a plurality of unit periods. A plurality of actual electricity consumptions of the equipment in the multiple unit periods are obtained. An abnormal electricity consumption time interval is determined by comparing the actual electricity consumptions with the reference electricity consumptions. A replacement index and an equipment energy efficiency of the equipment in the abnormal electricity consumption time interval are determined according to the equipment operation information of the equipment in the abnormal electricity consumption time interval. In response to determining that the replacement index and the equipment energy efficiency meet a replacement condition, a recommended equipment list including at least one recommended equipment is provided.

The disclosure provides a recommended method for replacing equipment and an electronic device. A plurality of reference electricity consumptions of an equipment are estimated by using an electricity consumption prediction model based on equipment operation information of the equipment in a plurality of unit periods. A plurality of actual electricity consumptions of the equipment in the multiple unit periods are obtained. An abnormal electricity consumption time interval is determined by comparing the actual electricity consumptions with the reference electricity consumptions. A replacement index and an equipment energy efficiency of the equipment in the abnormal electricity consumption time interval are determined according to the equipment operation information of the equipment in the abnormal electricity consumption time interval. In response to determining that the replacement index and the equipment energy efficiency meet a replacement condition, a recommended equipment list including at least one recommended equipment is provided.

Apparatus and associated methods relate to predicting failure and/or estimating remaining useful life of an air-data-probe heater. Failure is predicted or useful life is estimated based on an electrical metric of the electrical operating power provided to a resistive heating element of the air-data-probe heater. The electrical metric of the air data probe heater is one or more of: i) phase relation between voltage across the resistive heating element and leakage current, which is conducted from the resistive heating element to a conductive sheath surrounding the resistive heating element; ii) a time-domain profile of leakage current through the heating element insulation during a full power cycle; and/or iii) high-frequency components of the electrical current conducted by the resistive heating element and/or the voltage across the resistive heating element.

Apparatus and associated methods relate to predicting failure and/or estimating remaining useful life of an air-data-probe heater. Failure is predicted or useful life is estimated based on an electrical metric of the electrical operating power provided to a resistive heating element of the air-data-probe heater. The electrical metric of the air data probe heater is one or more of: i) phase relation between voltage across the resistive heating element and leakage current, which is conducted from the resistive heating element to a conductive sheath surrounding the resistive heating element; ii) a time-domain profile of leakage current through the heating element insulation during a full power cycle; and/or iii) high-frequency components of the electrical current conducted by the resistive heating element and/or the voltage across the resistive heating element.

In an embodiment, a semiconductor device is disclosed. The semiconductor device includes a plurality of output pins. Each of the output pins is electrically connected to an input pin of a buzzer and to a buzzer driver. The buzzer driver is configured to cause the buzzer to emit an audible sound. The semiconductor device further includes a plurality of ground switches. Each ground switch is configured to connect a corresponding output pin of the plurality of output pins to ground when closed. The semiconductor device further includes a current generator that is configured to supply a test current to a given output pin of the plurality of output pins and a clamp switch that is configured to connect the given output pin to an analog-to-digital converter.

In an embodiment, a semiconductor device is disclosed. The semiconductor device includes a plurality of output pins. Each of the output pins is electrically connected to an input pin of a buzzer and to a buzzer driver. The buzzer driver is configured to cause the buzzer to emit an audible sound. The semiconductor device further includes a plurality of ground switches. Each ground switch is configured to connect a corresponding output pin of the plurality of output pins to ground when closed. The semiconductor device further includes a current generator that is configured to supply a test current to a given output pin of the plurality of output pins and a clamp switch that is configured to connect the given output pin to an analog-to-digital converter.

An electronic component comparison apparatus is disclosed for comparing performance characteristics of the electronic components at different operating conditions. The electronic component comparison apparatus includes a processor that receives input of a first electronic component and a first operating condition and receives input of a second electronic component and a second operating condition where the second operating condition may be different from the first operating condition. The processor estimates a first electronic component performance characteristic based at least in part on the first electronic component and the first operating condition and estimates a second electronic component performance characteristic based at least in part on the second electronic component and the second operating condition. The processor outputs the first electronic component performance characteristic and second electronic component performance characteristic via a user interface for comparison.

An electronic component comparison apparatus is disclosed for comparing performance characteristics of the electronic components at different operating conditions. The electronic component comparison apparatus includes a processor that receives input of a first electronic component and a first operating condition and receives input of a second electronic component and a second operating condition where the second operating condition may be different from the first operating condition. The processor estimates a first electronic component performance characteristic based at least in part on the first electronic component and the first operating condition and estimates a second electronic component performance characteristic based at least in part on the second electronic component and the second operating condition. The processor outputs the first electronic component performance characteristic and second electronic component performance characteristic via a user interface for comparison.

A monitoring system includes: a sensor configured to generate a sensor signal based on a measured property; a controller configured to communicate with the sensor; and a communication channel electrically coupled to the sensor and the controller for carrying electrical communications therebetween. The sensor includes a transmitter configured to transmit an electrical signal on the communication channel to the controller. The controller includes a processing circuit configured to receive the electrical signal, measure an actual signal function response of the electrical signal, correlate the actual signal function response with a reference signal function response to generate a correlation value, compare the correlation value and a correlation threshold to produce a comparison result, and detect a fault based on the comparison result indicating that the correlation value satisfies the correlation threshold.

A monitoring system includes: a sensor configured to generate a sensor signal based on a measured property; a controller configured to communicate with the sensor; and a communication channel electrically coupled to the sensor and the controller for carrying electrical communications therebetween. The sensor includes a transmitter configured to transmit an electrical signal on the communication channel to the controller. The controller includes a processing circuit configured to receive the electrical signal, measure an actual signal function response of the electrical signal, correlate the actual signal function response with a reference signal function response to generate a correlation value, compare the correlation value and a correlation threshold to produce a comparison result, and detect a fault based on the comparison result indicating that the correlation value satisfies the correlation threshold.