Patent classifications
G01R31/58
Connection test device and method for checking an intermittent impedance variation
A method (200) and a connection test device (100; 300) for checking an intermittent impedance variation in a first and/or a second line (110; 302, 334) are described. The connection test device (100; 300) comprises a transmitter (102; 308) having a test signal generator (106) for generating a test signal and a first test point (108; 304) for connecting the first (110; 302) or the second line (334), wherein the test signal generator (106) supplies the test signal to the first (110; 302) or the second line (334) via the first test point (108; 304). The connection test device (100; 300) further comprises a first receiver (104; 310) having a second test point (112; 306, 336) for connecting the first (110; 302) or second line (334) and a receiver front end (114; 326, 328) which receives an incoming signal from the first (110; 302) or second line (334) via the second test point (112; 306, 336). The connection test device (100; 300) has, in addition, an evaluation logic (116), which is connected to the receiver front end (114; 326, 328) and which compares the input signal to a threshold value in order to identify an intermittent impedance variation in the first (110; 302) and/or the second line (334).
SYSTEM FOR DATA TRANSMISSION IN OPTICAL SYSTEMS
The invention relates to an optical light guiding system, comprising an interface for coupling in and/or an interface for decoupling data and at least one data channel for transmitting data, and a method for transmitting data in optical systems, comprising the steps of coupling data into an interface of a beam guidance element; the transmission of the data by means of a first and/or a second data channel, which are arranged within the beam guiding element (or the casing), wherein the data channels can also be used for the fractional monitoring of the beam guiding element; and decoupling the data from an interface.
IDENTIFICATION AND SELECTION OF THE SOURCE OF ELECTRIC POWER
Information indicating a source of electric current can be transmitted alongside or within the electric current itself, enabling downstream recipients to identify a source of their electricity. The information may be embedded directly into the electric current, such as by adding a modulated carrier signal to an alternating current before transmitting the current to a downstream recipient.
IDENTIFICATION AND SELECTION OF THE SOURCE OF ELECTRIC POWER
Information indicating a source of electric current can be transmitted alongside or within the electric current itself, enabling downstream recipients to identify a source of their electricity. The information may be embedded directly into the electric current, such as by adding a modulated carrier signal to an alternating current before transmitting the current to a downstream recipient.
Monitoring system
A monitoring system having a monitoring unit and a circuit element that are integrated in an enclosure for protecting connections between the monitoring unit and the circuit element. The monitoring unit monitors the circuit element via a first electrical quantity, and the monitoring unit has a control unit and a first circuit unit and a second circuit unit. The first current is essentially or precisely equal in amplitude to the first current, and the first current and the second current flow simultaneously in the two line sections. The first current direction is opposite to the second current direction, and the first circuit unit ascertains a first voltage drop at the first line section, and the second circuit unit ascertains a second voltage drop at the second line section. The control unit ascertains the first electrical quantity from the first voltage drop and the second voltage drop.
Wire break detection in digital input receivers
An optocoupler is placed in series between the field ground pin of digital input circuitry and the field ground of an industrial controller. A capacitor to field ground is provided for each digital input. A resistor is provided to the input pin of the digital input circuitry. To detect a broken wire a test pulse is provided to the optocoupler connected in the ground path. This test pulse isolates the digital input circuitry from field ground. As current is always being provided from the field when the wire is not broken, the capacitor connected between the input and ground charges. After the test pulse has completed, the output signal of the digital input circuitry is examined. If the level indicates the input is high, the wire is not broken. If, however, the output remains low indicating that the input is low, the wire has broken.
Circuit to detect previous use of computer chips using passive test wires
A test structure and method to detect open circuits due to electromigration or burn-out in test wires and inter-level vias. Electromigration occurs when current flows through circuit wires leading to a circuit interruption within the wire. The test structure is a passive test wire arranged in one of several configurations within the circuit of a computer chip. The dimensions and resistances of test wires can vary according to the test structure configuration. Each test wire is measured for an electrical discontinuity after the computer chip is powered-on. If a wiring interruption is detected, it is concluded that the chip had been powered-on before.
Support structure for cable and cable accessory condition monitoring devices
Devices are described that support, house, and protect an electrical cable monitoring system that is electrically coupled to an electrical cable. An example support structure includes an elongate body including an interior surface extending along and concentric to an axis of the electrical cable. The body is configured to engage a cable accessory disposed on the electrical cable. The support structure includes a first electrode attached to the interior surface and configured to operatively couple to the cable accessory. The support structure includes a second electrode attached to the body and configured to operatively couple to the shielding layer. The support structure includes a monitoring device attached to the interior surface and operatively coupled to the first and second electrodes. The monitoring device is configured to monitor one or more conditions of the electrical cable or the cable accessory.
Support structure for cable and cable accessory condition monitoring devices
Devices are described that support, house, and protect an electrical cable monitoring system that is electrically coupled to an electrical cable. An example support structure includes an elongate body including an interior surface extending along and concentric to an axis of the electrical cable. The body is configured to engage a cable accessory disposed on the electrical cable. The support structure includes a first electrode attached to the interior surface and configured to operatively couple to the cable accessory. The support structure includes a second electrode attached to the body and configured to operatively couple to the shielding layer. The support structure includes a monitoring device attached to the interior surface and operatively coupled to the first and second electrodes. The monitoring device is configured to monitor one or more conditions of the electrical cable or the cable accessory.
Real-time detection of high-impedance faults
Real-time detection of high-impedance faults in a distribution circuit is described. The real-time detection of high-impedance faults includes two steps. First, adaptive soft denoising is employed to perform a filtering process on a healthy dataset, and to determine a threshold. This reduces the rate of false alarms. Second, faulty datasets are prefiltered via adaptive soft denoising, then the denoised signals are processed via discrete wavelet transform to perform high-impedance fault detection using the threshold.