There is provided systems, apparatus, and methods for locating a fault in a plurality of windings of a transformer. In one embodiment, the apparatus may include: a measurement device configured to measure electrical flow parameters of the transformer when the transformer is in an online mode; and a fault location determination unit configured to determine electrical flow parameters of the windings from the measured electrical flow parameters of the transformer, wherein the fault location determination unit is configured to process the determined electrical flow parameters of the windings to determine the location of the fault in the windings.

There is provided systems, apparatus, and methods for locating a fault in a plurality of windings of a transformer. In one embodiment, the apparatus may include: a measurement device configured to measure electrical flow parameters of the transformer when the transformer is in an online mode; and a fault location determination unit configured to determine electrical flow parameters of the windings from the measured electrical flow parameters of the transformer, wherein the fault location determination unit is configured to process the determined electrical flow parameters of the windings to determine the location of the fault in the windings.

A device tests the function of an antenna system which includes antenna units each having an antenna and a resistor and is connected between an input of a selection unit and an output of a further selection unit. A computing unit provides a control signal for the two selection units at a first output. The control signal determines which input is connected to an output of the selection unit, and which of the outputs of a further selection unit is supplied with a bias voltage present at the input of the further selection unit, and to receive the antenna signal present at the output of the selection unit at an input of the computing unit. A diagnosis circuit is connected between the output of the selection unit and a diagnosis voltage terminal. The computing unit infers a fault in the antenna system from the comparison of antenna signals.

A device tests the function of an antenna system which includes antenna units each having an antenna and a resistor and is connected between an input of a selection unit and an output of a further selection unit. A computing unit provides a control signal for the two selection units at a first output. The control signal determines which input is connected to an output of the selection unit, and which of the outputs of a further selection unit is supplied with a bias voltage present at the input of the further selection unit, and to receive the antenna signal present at the output of the selection unit at an input of the computing unit. A diagnosis circuit is connected between the output of the selection unit and a diagnosis voltage terminal. The computing unit infers a fault in the antenna system from the comparison of antenna signals.

A monitoring system includes an array of optical sensors disposed within a transformer tank. Each optical sensor is configured to have an optical output that changes in response to a temperature within the transformer tank. An analyzer is coupled to the array of optical sensors. The analyzer is configured to determine a sensed temperature distribution based on the sensed temperature. The sensed temperature distribution is compared to an expected distribution. Exterior contamination of the transformer tank is detected based on the comparison.

A monitoring system includes an array of optical sensors disposed within a transformer tank. Each optical sensor is configured to have an optical output that changes in response to a temperature within the transformer tank. An analyzer is coupled to the array of optical sensors. The analyzer is configured to determine a sensed temperature distribution based on the sensed temperature. The sensed temperature distribution is compared to an expected distribution. Exterior contamination of the transformer tank is detected based on the comparison.

A system and a method for diagnosing a contactor life using contactor coil current, whereby, after a current value of a current contactor coil is determined based on a resistance value and a voltage value according to a real-time temperature of a contactor coil, whether contactor lifetime has expired and an abnormal operation thus occurs can be previously diagnosed and predicted on the basis of whether an average current value when a corresponding contactor operates a preset number of times or more exceeds a threshold value.

The present invention discloses an automatic laser calibration kit for calibrating the distance between a test device of a wireless charging system and a device under test (DUT). The calibration kit may be located in a wireless charging test system. The test system may comprise a test plane for controlling the DUT and a gripping arm for controlling the test device. The calibration kit may comprise: a laser pointer, configured to emit a laser beam; a mirror, positioned on the gripping arm and configured to reflect the laser beam to form a spot on the test plane; and a camera, configured to monitor the position of the spot.

A test device according to an embodiment of the present invention includes: a first measurement terminal connected to one end of a first coil to be tested; a second measurement terminal connected to another end of the first coil; a direct-current power source connected to the first measurement terminal; a first semiconductor switch connected between the second measurement terminal and a ground; and a drive unit for turning on and off the first semiconductor switch.

A test device according to an embodiment of the present invention includes: a first measurement terminal connected to one end of a first coil to be tested; a second measurement terminal connected to another end of the first coil; a direct-current power source connected to the first measurement terminal; a first semiconductor switch connected between the second measurement terminal and a ground; and a drive unit for turning on and off the first semiconductor switch.