The invention relates to a directional magnetic field generator with a magnetic circuit comprising: a first vertical-axis pole end (37) arranged above a horizontal plane; and at least two second pole ends (28A to 28D) symmetrically arranged on said horizontal plane, the generator further comprising coils arranged such that each magnetic circuit portion connecting two pole ends passes inside at least one coil, these coils being suitable for being connected to circuits for circulating currents of adjustable intensity in selected directions therein.

A multilayer exchange spring recording media consists of a magnetically hard magnetic storage layer strongly exchange coupled to a softer nucleation host. The strong exchange coupling can be through a coupling layer or direct. The hard magnetic storage layer has a strong perpendicular anisotropy. The nucleation host consists of one or more ferromagnetic coupled layers. For a multilayer nucleation host the anisotropy increases from layer to layer. The anisotropy in the softest layer of the nucleation host can be two times smaller than that of the hard magnetic storage layer. The lateral exchange between the grains is small. The nucleation host decreases the coercive field significantly while keeping the energy barrier of the hard layer almost unchanged. The coercive field of the total structure depends on one over number of layers in the nucleation host. The invention proposes a recording media that overcomes the writeability problem of perpendicular recording media.

A magnetic property measuring system includes coil structures configured to apply a magnetic field to a sample, a light source configured to irradiate incident light to the sample, and a detector configured to detect polarization of light reflected from the sample. The magnetic field is perpendicular to a surface of the sample. Each coil structure includes a pole piece and a coil surrounding an outer circumferential surface of the pole piece. A wavelength of the incident light is equal to or less than about 580 nm.

A magnetic property measuring system includes coil structures configured to apply a magnetic field to a sample, a light source configured to irradiate incident light to the sample, and a detector configured to detect polarization of light reflected from the sample. The magnetic field is perpendicular to a surface of the sample. Each coil structure includes a pole piece and a coil surrounding an outer circumferential surface of the pole piece. A wavelength of the incident light is equal to or less than about 580 nm.

According to one embodiment, a method includes: supplying electrical energy to a first path by an inspection circuit with a short circuit between two first terminals through a first probe; and detecting an electrical characteristic on the first path by the inspection circuit when the electrical energy is supplied to the first path. The two first terminals are included in a plurality of second terminals included in a flexible printed circuit board. The flexible printed circuit board includes: an electronic component including the inspection circuit and a plurality of third terminals; the plurality of second terminals; and a plurality of first wired lines connecting the plurality of second terminals and the plurality of third terminals. The first path is formed by: the two first terminals; two second wired lines connected to the two first terminals among the plurality of first wired lines; and two fourth terminals connected to the two second wired lines among the plurality of third terminals.

An opener assembly for a data storage component testing system is disclosed. The opener assembly includes an actuator assembly with a first opener actuator and a body having a distal end, a proximal end, a first arm, and a second arm. The first and second arms extend between the proximal end and the distal end and define a spacing at the distal end. The first opener actuator is operatively coupled to the first and second arms and configured to actuate the actuator assembly between a closed position and an opened position.

A magnetic property measuring system includes a stage configured to hold a sample and a magnetic structure disposed over the stage. The stage includes a body part, a magnetic part adjacent the body part, and a plurality of holes defined in the body part. The magnetic part of the stage and the magnetic structure are configured to apply a magnetic field, which is perpendicular to one surface of the sample, to the sample. The stage is configured to move horizontally in an x-direction and a y-direction which are parallel to the one surface of the sample.

A fluid transport system that includes a magnetic shape memory pipe having an input end opposite an output end and an outer surface opposite an inner surface. The inner surface defines an inner diameter of the magnetic shape memory pipe and the magnetic shape memory pipe includes a magnetic shape memory alloy. The fluid transport system further includes one or more magnetic field generating devices surrounding the outer surface of the magnetic shape memory pipe and configured to generate a control magnetic field that, when applied to a region of the magnetic shape memory pipe, alters the inner diameter of the region of the magnetic shape memory pipe.

A hard disk drive includes a base deck, a cover coupled to the base deck to create an internal cavity, and a testing assembly coupled to the cover. The testing assembly includes a housing and is arranged to expose an organic material, for example grease or oil, to the internal cavity.

A metrology tool includes a magnet to generate a magnetic field and a stage system to position a plurality of MRAM dies on an MRAM wafer in the magnetic field. The stage system includes a chuck on which to mount the MRAM wafer. The metrology tool further includes optics to provide a laser beam and direct the laser beam to be incident upon respective MRAM dies positioned in the magnetic field. The metrology tool additionally includes a detector to receive the laser beam as reflected by the respective MRAM dies and to measure rotation of the polarization of the reflected laser beam. The metrology tool is configurable to provide each MRAM die on the MRAM wafer with a common orientation with respect to the polarization of the laser beam.