The present invention combines the functionalities of a multifunctional process calibrator with a heating and/or cooling unit (also called as a dry block). The heating and/or cooling unit and the process calibrator are integrated in a single housing forming the arrangement. The arrangement allows using several digital communication protocols i.e. fieldbus protocols. Temperature sensor simulation is possible as well. Pressure measurement and/or calibration is also enabled. The arrangement is supplied with internal rechargeable battery, which enables all other functionalities without mains power, except the use of the heating and/or cooling unit, where the mains power is required.

A diagnostic device for a current sensor disclosed herein may include an AC power calculation unit, a DC power calculation unit, and a determination unit. The AC power calculation unit may be configured to calculate AC power outputted from the inverter based on a measurement value measured by the current sensor. The DC power calculation unit may be configured to calculate DC power outputted from a DC power source that supplies power to the inverter. The determination unit may be configured to output a signal for notifying occurrence of an abnormality of the current sensor in a case where a difference between the calculated AC power and the calculated DC power is larger than a predetermined threshold.

Presented is a system for testing antenna performance, in which antenna performance is tested by reflecting the loss of a cable used in the antenna performance test. The presented system for testing antenna performance comprises a tester having a test port, the test port being connected, via a cable, to an antenna that communicates with a terminal to be tested, in a shield box, when a test mode is set, wherein the tester outputs a test signal to the test port, receives a response signal corresponding to the test signal via the test port, and obtains a value, as a communication performance measurement value, by adding a calibration value to a reception signal strength of the response signal.

An apparatus comprises a signal generator; first and second electrodes, the second electrode being connected to a first terminal of the signal generator; a processor; and a first switch configured to connect the first electrode to the processor, the first switch having a first position and a second position. The processor is configured to determine one or more values of a first electrical parameter based on a signal received from the first electrode via the first switch in the first position, and to determine one or more values of a second electrical parameter based on a signal received from the first electrode via the first switch in the second position.

A vector network analyzer for obtaining at least one wave frequency ratio with respect to a frequency-converting device under test is provided. The vector network analyzer comprises a transmitter side configured to be controlled by at least one transmitter side clock signal, a receiver side configured to be controlled by at least one receiver side clock signal, and a central clock configured to generate a central clock signal. The at least one transmitter side clock signal and the at least one receiver side clock signal are based on the central clock signal, the at least one transmitter side clock signal and the at least one receiver side clock signal are generated with a fixed phase relation to each other with the aid of a start pulse.

Systems and methods for calibrating a voltage measurement device are provided herein. The voltage measurement device generates a reference current signal and senses the reference current signal in a conductor under test. A calibration system may control a calibration voltage source to selectively output calibration voltages in a calibration conductor. The calibration system may obtain data from the voltage measurement device captured by the voltage measurement device when measuring the calibration conductor. Such data may include one or more reference current measurements, one or more voltage measurements, etc. The calibration system utilizes the obtained measurements to generate calibration data which may be stored on the voltage measurement device for use thereby during subsequent operation. The calibration data may include one or more lookup tables, coefficients for one or more mathematical formulas, etc.

A method for measuring beam steering characteristics of a device under test using a measurement system comprising a probe array with at least two field probes. The field probes can be arranged at different angles with respect to the device under test. A reference unit for calibrating the probe array is provided. At least two calibration measurements with different main radiation directions of the reference unit are performed wherein a predefined number of field probes of the probe array is used for measuring the radiation pattern of the reference unit. A calibration dataset for at least each field probe of the predefined number of field probes and each radiation direction is generated and stored. The reference unit is replaced by a device under test such that the device under test is located at the same measurement position as the reference unit was during the calibration measurements. A measurement of the device under test is performed by using the predefined number of field probes of the probe array.

A likely value is calculated by a maximum-likelihood method for all coefficients of a relative error correction circuit network model derived by assuming that, for all pairs of two ports selected from among signal line ports related to application or detection of a high frequency signal and non signal line ports other than the signal line ports, there exists a leak signal directly transferred between the ports. A coefficient of a first relative error correction circuit network submodel derived by assuming that, for all pairs of two ports selected only from among signal line ports, there exists a leak signal directly transferred between the ports, and a coefficient for a non signal line port of a second relative error correction circuit network submodel derived by assuming that there exists a signal reflected at a non signal line port are used as initial values.

In a system and method for correcting a stress-impaired signal in a circuit, a calibration circuit produces a first calibrated voltage based on a base-emitter voltage of one or more pnp transistors, a second calibrated voltage based on a base-emitter voltage of one or more npn transistors, and a voltage proportional to absolute temperature. A set of reference values are generated based on these voltages. A gain correction factor is calculated based on a function of the set of reference values and a set of temperature-dependent values, and the stress-impaired signal is corrected based on the gain correction factor.

A pattern quality management chart includes a chart substrate which is made of the same material as a substrate patterned by a first region having a predetermined affinity to a functional liquid for pattern formation and a second region having an affinity lower than the predetermined affinity, and at least one unit region group formed on the surface of the chart substrate. The unit region group includes a plurality of unit regions which are constituted of the first region surrounded therearound by the second region, and each of the unit regions is classified into either a compliant type unit region which has a shape and a size such that, when a predetermined amount of functional liquid is supplied to the unit region under predetermined supply conditions, the functional liquid does not overflow into the surrounding second region and the unit region is completely filled with the functional liquid, or a non-compliant type unit region which has a shape and a size such that part of the functional liquid overflows into the surrounding second region and/or a part of the unit region is not filled with the functional liquid. A plurality of unit regions include at least one compliant type unit region and at least one non-compliant type unit region.