An amplifier circuit includes: a Schmidt trigger having an input electrically coupled to an input of the amplifier circuit, a switching network electrically coupled to an output of the Schmidt trigger, an inductor electrically coupled to the switching network, a first resistor electrically coupled to the inductor, a capacitor electrically coupled to the first resistor, a first feedback circuit that provides a first feedback signal to the input of the Schmidt trigger based on a voltage at a first node electrically coupled to the first resistor and to the capacitor, a second resistor electrically coupled to the output of the amplifier circuit, a third resistor electrically coupled to the second resistor, and a second feedback circuit that provides a second feedback signal to the input of the Schmidt trigger based on a voltage at a second node electrically coupled to the second resistor and to the third resistor.

A method and system to perform the verification of measures done by a sensor in quasi real-time. The sensor verification may be implemented at two different levelsa functionality level and a measurement level. At the functionality level, a consistency check of information from different variables may be processed at sensor level depending on the functionality of the physical system being measured. At the measurement level, diagnostics may be performed of the circuits present in the measurement path by specific circuitry and at suitable instants of time to guarantee a Fault Tolerant Time Interval while minimizing sample loss. This may be achieved, at least in part, by increasing the measuring sample rate.

A circuit that outputs a current which is proportional to an input voltage includes input and output terminals, a comparator, first and second transistors, an inductor, a first resistor, and a differential amplifier. A first input terminal of the comparator is coupled to the input terminal of the circuit, and a second input terminal of the comparator is coupled to an output terminal of the comparator. The first and second transistors are coupled to the output terminal of the comparator. The inductor is coupled to the first and second transistors. The first resistor is coupled between the inductor and the output terminal of the circuit. The differential amplifier includes a first input terminal coupled to a first terminal of the first resistor, a second input terminal coupled to a second terminal to the first resistor, and an output terminal coupled to the first input terminal of the comparator.

A circuit that outputs a current which is proportional to an input voltage includes input and output terminals, a comparator, first and second transistors, an inductor, a first resistor, and a differential amplifier. A first input terminal of the comparator is coupled to the input terminal of the circuit, and a second input terminal of the comparator is coupled to an output terminal of the comparator. The first and second transistors are coupled to the output terminal of the comparator. The inductor is coupled to the first and second transistors. The first resistor is coupled between the inductor and the output terminal of the circuit. The differential amplifier includes a first input terminal coupled to a first terminal of the first resistor, a second input terminal coupled to a second terminal to the first resistor, and an output terminal coupled to the first input terminal of the comparator.

Resistor voltage dividers are commonly used to create reference voltages, or to reduce the magnitude of a voltage so it can be measured. Many measurements in test and measurement or calibration applications regularly require accuracies within the sub-part per million (ppm) range, e.g. 0.1 ppm to 1.0 ppm. However, the continued drive for improved accuracy in calibration, standards, and measurements on circuits and components means many measurements and measurement systems are operating at 50 parts per billion (ppb) and below to approximately 10 ppb. At these levels even relatively simple passive elements such as voltage dividers cannot be used without calibration and that these calibrations may be required at frequencies substantially higher than the other elements within the test and measurement equipment. Accordingly, the inventors have established a self-contained voltage divider with internal calibration allowing the voltage divider to be calibrated for every measurement if necessary.

A diagnostic device for a current sensor disclosed herein may include an AC power calculation unit, a DC power calculation unit, and a determination unit. The AC power calculation unit may be configured to calculate AC power outputted from the inverter based on a measurement value measured by the current sensor. The DC power calculation unit may be configured to calculate DC power outputted from a DC power source that supplies power to the inverter. The determination unit may be configured to output a signal for notifying occurrence of an abnormality of the current sensor in a case where a difference between the calculated AC power and the calculated DC power is larger than a predetermined threshold.

A method for measuring beam steering characteristics of a device under test using a measurement system comprising a probe array with at least two field probes. The field probes can be arranged at different angles with respect to the device under test. A reference unit for calibrating the probe array is provided. At least two calibration measurements with different main radiation directions of the reference unit are performed wherein a predefined number of field probes of the probe array is used for measuring the radiation pattern of the reference unit. A calibration dataset for at least each field probe of the predefined number of field probes and each radiation direction is generated and stored. The reference unit is replaced by a device under test such that the device under test is located at the same measurement position as the reference unit was during the calibration measurements. A measurement of the device under test is performed by using the predefined number of field probes of the probe array.

A compound may include a set of integrated circuits. An integrated circuit, of the set of integrated circuits, may include calibration standards integrated at a silicon layer of the integrated circuit. The integrated circuit may be included in a package, and a calibration standard, of the calibration standards, may be available to at least one port of a set of ports of the integrated circuit.

The disclosure describes techniques for detecting a crack or defect in a material. A computing device may determine whether a tested material includes a crack or other defect based on a temperature-scaled control data set and a measurement data set.

A vector network analyzer for obtaining at least one wave frequency ratio with respect to a frequency-converting device under test is provided. The vector network analyzer comprises a transmitter side configured to be controlled by at least one transmitter side clock signal, a receiver side configured to be controlled by at least one receiver side clock signal, and a central clock configured to generate a central clock signal. The at least one transmitter side clock signal and the at least one receiver side clock signal are based on the central clock signal, the at least one transmitter side clock signal and the at least one receiver side clock signal are generated with a fixed phase relation to each other with the aid of a start pulse.