A direction-finding device based on coupled and detuned spoof localized surface plasmons, comprising a dielectric substrate with a metal coating at the bottom and two evenly-grooved metal discs with different sizes or materials. The two grooved metal discs represent two spoof localized surface plasmonic resonators, i.e., SLSP1 and SLSP2, with different resonance frequencies due to their different sizes or materials. SLSP1 and SLSP2 are distributed on the dielectric substrate along the diagonal of the dielectric substrate, with the center of the dielectric substrate as a symmetrical center, to form a coupled and detuned spoof localized surface plasmonic system. In response to the incoming waves from different directions, SLSP1 and SLSP2 support spoof localized surface plasmonic modes with different phase differences. According to the phase difference, the incident angle of the incoming waves can be determined uniquely.

A direction-finding device based on coupled and detuned spoof localized surface plasmons, comprising a dielectric substrate with a metal coating at the bottom and two evenly-grooved metal discs with different sizes or materials. The two grooved metal discs represent two spoof localized surface plasmonic resonators, i.e., SLSP1 and SLSP2, with different resonance frequencies due to their different sizes or materials. SLSP1 and SLSP2 are distributed on the dielectric substrate along the diagonal of the dielectric substrate, with the center of the dielectric substrate as a symmetrical center, to form a coupled and detuned spoof localized surface plasmonic system. In response to the incoming waves from different directions, SLSP1 and SLSP2 support spoof localized surface plasmonic modes with different phase differences. According to the phase difference, the incident angle of the incoming waves can be determined uniquely.

A direction-finding device based on coupled and detuned spoof localized surface plasmons, comprising a dielectric substrate with a metal coating at the bottom and two evenly-grooved metal discs with different sizes or materials. The two grooved metal discs represent two spoof localized surface plasmonic resonators, i.e., SLSP1 and SLSP2, with different resonance frequencies due to their different sizes or materials. SLSP1 and SLSP2 are distributed on the dielectric substrate along the diagonal of the dielectric substrate, with the center of the dielectric substrate as a symmetrical center, to form a coupled and detuned spoof localized surface plasmonic system. In response to the incoming waves from different directions, SLSP1 and SLSP2 support spoof localized surface plasmonic modes with different phase differences. According to the phase difference, the incident angle of the incoming waves can be determined uniquely.

A direction-finding device based on coupled and detuned spoof localized surface plasmons, comprising a dielectric substrate with a metal coating at the bottom and two evenly-grooved metal discs with different sizes or materials. The two grooved metal discs represent two spoof localized surface plasmonic resonators, i.e., SLSP1 and SLSP2, with different resonance frequencies due to their different sizes or materials. SLSP1 and SLSP2 are distributed on the dielectric substrate along the diagonal of the dielectric substrate, with the center of the dielectric substrate as a symmetrical center, to form a coupled and detuned spoof localized surface plasmonic system. In response to the incoming waves from different directions, SLSP1 and SLSP2 support spoof localized surface plasmonic modes with different phase differences. According to the phase difference, the incident angle of the incoming waves can be determined uniquely.

The present disclosure relates to a device and method for accurately measuring an azimuth angle and an elevation angle of mid-infrared laser light. The device includes a laser, an atomic gas cell, a filter, a displacement platform, and a beam mass spectrometer. Pump light generated by the laser enters the atomic gas cell along an optical axis which is a Z-axis for a spontaneous frequency conversion process, and a generated reference beam enters the beam mass spectrometer through the filter; target mid-infrared laser light and the pump light intersect in the atomic gas cell to induce a second frequency conversion process, and a generated beam to be measured enters the beam mass spectrometer through the filter; and the beam mass spectrometer is arranged on the displacement platform and simultaneously detect spot images of the reference beam and the beam to be measured at different positions, respectively.

The present disclosure relates to a device and method for accurately measuring an azimuth angle and an elevation angle of mid-infrared laser light. The device includes a laser, an atomic gas cell, a filter, a displacement platform, and a beam mass spectrometer. Pump light generated by the laser enters the atomic gas cell along an optical axis which is a Z-axis for a spontaneous frequency conversion process, and a generated reference beam enters the beam mass spectrometer through the filter; target mid-infrared laser light and the pump light intersect in the atomic gas cell to induce a second frequency conversion process, and a generated beam to be measured enters the beam mass spectrometer through the filter; and the beam mass spectrometer is arranged on the displacement platform and simultaneously detect spot images of the reference beam and the beam to be measured at different positions, respectively.

An apparatus for characterization of one or more light sources, has an image sensor array that defines an image plane having an imaging area. An aperture spaced apart from the image plane defines the field of view that includes, for each of the one or more light sources, a corresponding incident light path that lies along a central ray beginning at the corresponding light source, extending through a center of the aperture, and terminating at the image plane. A diffraction grating forms, on the image sensor array, for each corresponding light source, a light pattern having at least a zeroth diffraction order and a first diffraction order, wherein the zeroth diffraction order is a geometrical projection of the aperture along the central ray. A control logic processor identifies a wavelength range and angular direction within the field of view for at least one of the light sources.

An apparatus for characterization of one or more light sources, has an image sensor array that defines an image plane having an imaging area. An aperture spaced apart from the image plane defines the field of view that includes, for each of the one or more light sources, a corresponding incident light path that lies along a central ray beginning at the corresponding light source, extending through a center of the aperture, and terminating at the image plane. A diffraction grating forms, on the image sensor array, for each corresponding light source, a light pattern having at least a zeroth diffraction order and a first diffraction order, wherein the zeroth diffraction order is a geometrical projection of the aperture along the central ray. A control logic processor identifies a wavelength range and angular direction within the field of view for at least one of the light sources.

Solar trackers that may be advantageously employed on sloped and/or variable terrain to rotate solar panels to track motion of the sun across the sky include bearing assemblies and other mechanical features configured to address mechanical challenges posed by the sloped and/or variable terrain that might otherwise prevent or complicate use of solar trackers on such terrain.

Solar trackers that may be advantageously employed on sloped and/or variable terrain to rotate solar panels to track motion of the sun across the sky include bearing assemblies and other mechanical features configured to address mechanical challenges posed by the sloped and/or variable terrain that might otherwise prevent or complicate use of solar trackers on such terrain.