Patent classifications
G01S7/497
System and method for assisting collaborative sensor calibration
Embodiments described herein include a method of receiving, by a moving assisting vehicle, a calibration assistance request related to a moving ego vehicle that requested assistance in collaborative calibration of a sensor deployed on the moving ego vehicle. The method further includes analyzing the calibration assistance request to extract at least one of a schedule or an assistance route associated with the requested assistance. The method includes communicating with the moving ego vehicle about a desired location relative to the position of the moving ego vehicle for the moving assisting vehicle to be in order to assist the sensor to acquire information of a target present on the moving assisting vehicle. The method includes facilitating to drive the moving assisting vehicle to reach the desired location to achieve the collaborative calibration of the sensor on the moving ego vehicle.
Detector system comparing pixel response with photonic energy decay
Methods and apparatus for a controlling a stimulus source to direct photons to a pixel in a pixel array contained in a detector system, analyzing a response of the pixel in the pixel array; and generating an alert based on the response of the pixel in the pixel array. Example stimulus sources include a conductive trace, a PN junction, and a current source.
Optical assembly, method for producing data in the same, and method for manufacturing structure
An integrated optical assembly is provided, with enhancements that are particularly useful when the integrated optical assembly forms part of a laser radar system. The integrated optical assembly produces a reference beam that is related to the optical characteristics of a scanning reflector, or to changes in position or orientation of the scanning reflector relative to a source. Thus, if the scanning reflector orientation were to shift from its intended orientation (due e.g. to thermal expansion) or if characteristics of the scanning reflector (e.g. the index of refraction of the scanning reflector) were to change on account of temperature changes, the reference beam can be used to provide data that can be used to account for such changes. In addition, if the scanning reflector were to be positioned in an orientation other than the orientation desired, the reference beam can be used in identifying and correcting that positioning.
Multiple operational modes for aircraft laser sensing systems
A system for an aircraft includes an optical sensor, at least one aircraft sensor, and a controller. The optical sensor is configured to emit a laser outside the aircraft, and the at least one aircraft sensor is configured to sense at least one aircraft condition. The controller is configured to determine a first operational state of the aircraft based upon the at least one aircraft condition and determine a second operational state of the aircraft based on the at least one aircraft condition, and operate the optical sensor to emit the laser at a first intensity during the first operational state and a second intensity during the second operational state, wherein the second intensity is greater than the first intensity.
Multiple operational modes for aircraft laser sensing systems
A system for an aircraft includes an optical sensor, at least one aircraft sensor, and a controller. The optical sensor is configured to emit a laser outside the aircraft, and the at least one aircraft sensor is configured to sense at least one aircraft condition. The controller is configured to determine a first operational state of the aircraft based upon the at least one aircraft condition and determine a second operational state of the aircraft based on the at least one aircraft condition, and operate the optical sensor to emit the laser at a first intensity during the first operational state and a second intensity during the second operational state, wherein the second intensity is greater than the first intensity.
Wafer inspection system including a laser triangulation sensor
One example of an inspection system includes a laser, a magnification changer, and a first camera. The laser projects a line onto a wafer to be inspected. The magnification changer includes a plurality of selectable lenses of different magnification. The first camera images the line projected onto the wafer and outputs three-dimensional line data indicating the height of features of the wafer. Each lens of the magnification changer provides the same nominal focal plane position of the first camera with respect to the wafer.
Techniques for compensating for ego-velocity and target velocity in the digitally-sampled target signal
A method of compensation in a light detection and ranging (LIDAR) system. The method includes generating a digitally-sampled target signal. The method also includes compensating for ego-velocity and target velocity in the digitally-sampled target signal based on an estimated ego-velocity and an estimated target velocity to produce a compensated digitally-sampled target signal.
Techniques for compensating for ego-velocity and target velocity in the digitally-sampled target signal
A method of compensation in a light detection and ranging (LIDAR) system. The method includes generating a digitally-sampled target signal. The method also includes compensating for ego-velocity and target velocity in the digitally-sampled target signal based on an estimated ego-velocity and an estimated target velocity to produce a compensated digitally-sampled target signal.
LIDAR system utilizing multiple networked LIDAR integrated circuits
A ranging system includes a first ranging unit with a first laser driver, a first control circuit generating a first trigger signal, and a first data interface with a first trigger transmitter transmitting the first trigger signal over a first data transmission line and a first calibration receiver receiving a first calibration signal over a second data transmission line. A second ranging unit includes a second laser driver, a second data interface with a second trigger receiver receiving the first trigger signal and a second calibration transmitter transmitting the first calibration signal, and a second control circuit generating the first calibration signal in response to receipt of the first trigger signal. The first control circuit determines an elapsed time between transmission of the first trigger signal and receipt of the first calibration signal. The determined elapsed time is used to synchronize activation of the first and second laser drivers.
Transmitter unit for emitting radiation into a surrounding area
A transmitter unit for emitting radiation into the surrounding area, including at least one semiconductor laser, which has at least one first emitter possessing a first section and a second section; and at least one control unit for controlling the semiconductor laser. The control unit is configured to apply a first supply variable to the first section of the at least one emitter, and to apply a second supply variable differing from the first supply variable, to the second section of the at least one emitter.