A semiconductor module includes a substrate; a plurality of semiconductor packages provided on the substrate; and an environment information indicator configured to display information related to an environment surrounding the plurality of semiconductor packages.

An imaging support apparatus that supports imaging by a radiation imaging apparatus which obtains a plurality of frame images by successively performing a plurality of radiation imaging operations to a subject. The imaging support apparatus includes a hardware processor that determines a number of the frame images to be obtained by the radiation imaging apparatus by analyzing one or more initial frame images, each of the initial frame images being an initial frame image obtained early in the radiation imaging operations by the radiation imaging apparatus.

An imaging support apparatus that supports imaging by a radiation imaging apparatus which obtains a plurality of frame images by successively performing a plurality of radiation imaging operations to a subject. The imaging support apparatus includes a hardware processor that determines a number of the frame images to be obtained by the radiation imaging apparatus by analyzing one or more initial frame images, each of the initial frame images being an initial frame image obtained early in the radiation imaging operations by the radiation imaging apparatus.

The invention relates to a system (1) for detecting image parameters during the exposure of films (2), in particular X-ray films. It is an object of the invention to provide a system which allows a simple and fast production of optimally exposed recordings. For this purpose, the system (1) comprises a detector element (3) which can be detachably attached to a film (2) and which detects in a spatially resolved manner the radiation (4) impinging on the film (2) during exposure or the radiation (4) transmitted through the film and thereby generates a signal from which image parameters generated by the current film exposure can be derived.

The invention relates to a system (1) for detecting image parameters during the exposure of films (2), in particular X-ray films. It is an object of the invention to provide a system which allows a simple and fast production of optimally exposed recordings. For this purpose, the system (1) comprises a detector element (3) which can be detachably attached to a film (2) and which detects in a spatially resolved manner the radiation (4) impinging on the film (2) during exposure or the radiation (4) transmitted through the film and thereby generates a signal from which image parameters generated by the current film exposure can be derived.

A semiconductor module includes a substrate; a plurality of semiconductor packages provided on the substrate; and an environment information indicator configured to display information related to an environment surrounding the plurality of semiconductor packages.

A semiconductor module includes a substrate; a plurality of semiconductor packages provided on the substrate; and an environment information indicator configured to display information related to an environment surrounding the plurality of semiconductor packages.

An assembly for detecting scattered rays includes an X-ray filtering device configured to spatially filter the X-rays as a function of their direction of emission; and an imager assembled facing the filtering device so as to receive the X-rays filtered by the filtering device, the imager being configured to produce a radiographic image from the X-rays filtered by the filtering device; the filtering device comprising several plates, the plates comprising a material capable of absorbing the X-rays, the plates being oriented so as to move away from a centre of the filtering device in the direction going from the imager to the filtering device.

An assembly for detecting scattered rays includes an X-ray filtering device configured to spatially filter the X-rays as a function of their direction of emission; and an imager assembled facing the filtering device so as to receive the X-rays filtered by the filtering device, the imager being configured to produce a radiographic image from the X-rays filtered by the filtering device; the filtering device comprising several plates, the plates comprising a material capable of absorbing the X-rays, the plates being oriented so as to move away from a centre of the filtering device in the direction going from the imager to the filtering device.

A semiconductor module includes a substrate; a plurality of semiconductor packages provided on the substrate; and an environment information indicator configured to display information related to an environment surrounding the plurality of semiconductor packages.